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Flexible carrier for an electronic device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/60
출원번호 US-0429807 (1989-10-30)
발명자 / 주소
  • McBride Donald G. (Binghamton NY) Ellis Theron L. (Vestal NY)
출원인 / 주소
  • International Business Machines Corporation (Armonk NY 02)
인용정보 피인용 횟수 : 70  인용 특허 : 20

초록

The disclosure describes a form of packaging for an electronic device and a method of achieving it in order to overcome the problem of damage because of cycles in environmental temperature. A thin, flexible foil functioning as a carrier of electrically conductive material selected from the group inc

대표청구항

The method of making an electronic package assembly, comprising the steps of: providing a flexible carrier of an electrically conductive material; forming a layer on said flexible carrier of an electrically insulating material; forming vias in said layer of electrically insulating material at predet

이 특허에 인용된 특허 (20)

  1. Baldwin Graham J. (Cheltenham GB2) McCann Michael O. (Wotton-Under-Edge GB2), Chip-carrier substrates.
  2. Gazdik Charles E. (Endicott NY) McBride Donald G. (Binghamton NY), Electronic package assembly method.
  3. Reagan John J. (Beaverton OR) Parks Peggy J. (Beaverton OR) Miller Nancy L. (Portland OR) Beckman Robert L. (Beaverton OR), Fabrication of a multilayer conductive pattern on a dielectric substrate.
  4. Barresi Anthony J. (Hammonton NJ) Nelson Leonard (Cherry Hill NJ) Pogson Jack (Toms River NJ), Fixture for solder tinning chip carriers.
  5. Clementi Robert J. (Binghamton NY) Gazdik Charles E. (Endicott NY) Lafer William (Chenango Bridge NY) Lovesky Roy L. (Vestal NY) McBride Donald G. (Binghamton NY) Munson Joel V. (Port Crane NY) Skarv, Flexible film semiconductor chip carrier.
  6. Shaheen Joseph M. (La Habra CA) Simone John (Stanton CA), Method of fabricating a beam lead flexible circuit.
  7. Bakermans Frank C. (Shiremanstown PA), Method of making bumped-beam tape.
  8. Detoma Renzo B. (Florence ITX), Method to ensure the cooling of electronic components fixed on a multilayer for printed circuits and multilayer realized.
  9. Gazdik Charles E. (Endicott NY) McBride Donald G. (Binghamton NY), Multi-layer flexible film module.
  10. Leibowitz Joseph D. (Culver City CA), Multilayer printed circuit board structure.
  11. Shirahata Isao (Chigasaki JPX) Shiga Shoji (Utsunomiya JPX) Hori Hisako (Tokyo JPX) Jinbo Takamasa (Odawara JPX), Multilayer printed wiring board and method for producing the same.
  12. Suzuki Hirosuke (Tokorozawa JPX), Printed circuit board.
  13. Oldenettel Jayne L. (Kent WA), Printed wire circuit board and its method of manufacture.
  14. Brown Vernon L. (Boulder CO), Printed wiring board construction.
  15. Kuniya Keiichi (Hitachi JA) Iizuka Tomio (Ibaraki JA) Suwa Masateru (Hitachi JA) Yasuda Tomio (Hitachi JA) Sasaki Takeshi (Hitachi JA) Kikuchi Sakae (Takasaki JA) Suzuki Hideo (Katsuta JA), Semiconductor device having supporting electrode composite structure of metal containing fibers.
  16. Lazzari Jean-Pierre (Montfort l\Amaury FRX), Structure for multilayer circuits.
  17. Jones Keith E. (Aloha OR), Surface mountable microwave IC package.
  18. Yerman Alexander J. (Scotia NY) Loughran James A. (Scotia NY), Tape automated manufacture of power semiconductor devices.
  19. Hodge Robin H. (Menlo Park CA) Brodsky Mark A. (Sunnyvale CA), Thermally balanced leadless microelectronic circuit chip carrier.
  20. DeGree David C. (Burnsville MN) Fick Herbert J. (Northfield MN) Juenger Bruce H. (Northfield MN), Thermally conductive, electrically insulative laminate.

이 특허를 인용한 특허 (70)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Strid,Eric; Gleason,K. Reed, Active wafer probe.
  3. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  4. Shimada Yuzo,JPX ; Tanaka Yoshimasa,JPX ; Hasegawa Shinichi,JPX ; Suyama Takayuki,JPX, Connecting member and a connecting method with ball and tapered via.
  5. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  6. Strid, Eric; Campbell, Richard, Differential signal probing system.
  7. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  8. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  9. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  10. Igor Y. Khandros ; Thomas H. Distefano, Face-up semiconductor chip assemblies.
  11. Bonser Lora C. ; Hayden Terry F. ; Schubert Robert J., Flexible circuit with coverplate layer and overlapping protective layer.
  12. Zhai,Jun; Kwon,Jinsu; Blish, II,Richard C., Integrated circuit package and method.
  13. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  14. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  15. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  16. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  17. Gleason Reed ; Bayne Michael A. ; Smith Kenneth ; Lesher Timothy ; Koxxy Martin, Membrane probing system.
  18. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  19. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  20. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  21. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  22. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  23. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  24. Tervo, Paul A.; Smith, Kenneth R.; Cowan, Clarence E.; Dauphinais, Mike P.; Koxxy, Martin J., Membrane probing system.
  25. Tervo, Paul A.; Smith, Kenneth R.; Cowan, Clarence E.; Dauphinais, Mike P.; Koxxy, Martin J., Membrane probing system.
  26. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  27. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  28. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  29. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  30. Gleason,K. Reed; Smith,Kenneth R.; Bayne,Mike, Membrane probing system with local contact scrub.
  31. K. Reed Gleason ; Kenneth R. Smith ; Mike Bayne, Membrane probing system with local contact scrub.
  32. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method for constructing a membrane probe using a depression.
  33. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth, Method for constructing a membrane probe using a depression.
  34. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Method for probing an electrical device having a layer of oxide thereon.
  35. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  36. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  37. Anderson Steven W. ; Armezzani Gregg J. ; Labzentis Daniel P., Method of forming an electrical connection between a conductive member having a dual thickness substrate and a conductor and electronic package including said connection.
  38. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  39. Khandros,Igor Y.; DiStefano,Thomas H., Microelectronic component and assembly having leads with offset portions.
  40. Khandros,Igor Y.; DiStefano,Thomas H., Microelectronic component and assembly having leads with offset portions.
  41. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  42. John B. Scheibner ; Robert M. Anderton ; David L. Buster ; Kristine J. Williams, Printed circuit substrate with controlled placement covercoat layer.
  43. Scheibner, John B.; Anderton, Robert M.; Buster, David L.; Williams, Kristine J., Printed circuit substrate with controlled placement covercoat layer.
  44. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Probe construction using a recess.
  45. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  46. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  47. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  48. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  49. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Probe for testing a device under test.
  50. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  51. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  52. Schwindt,Randy, Probe holder for testing of a test device.
  53. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  54. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  55. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  56. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  57. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  58. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  59. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  60. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  61. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  62. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  63. Andrews, Peter; Hess, David, System for testing semiconductors.
  64. Campbell, Richard, Test structure and probe for differential signals.
  65. Campbell,Richard, Test structure and probe for differential signals.
  66. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  67. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  68. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  69. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  70. Campbell, Richard, Wideband active-passive differential signal probe.
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