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System for measuring optical characteristics of curved surfaces 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/55
  • G01B-011/24
출원번호 US-0433140 (1989-11-08)
발명자 / 주소
  • Salinger Jeremy A. (Southfield MI)
출원인 / 주소
  • Environmental research Institute of Michigan (Ann Arbor MI 02)
인용정보 피인용 횟수 : 26  인용 특허 : 10

초록

A system for evaluating the optical characteristics of curved surfaces includes a light source disposed to scan a beam of light across a surface and ranging means for measuring the distance from the light source to the point being scanned and a controller for controlling the position of the light be

대표청구항

An inspection system adapted to measure optical characteristics of a curved surface in motion relative thereto, said system comprising: a light source operative to scan a beam of light across a plurality of points on the curved surface for reflection therefrom; ranging means for measuring the distan

이 특허에 인용된 특허 (10)

  1. Street Robert A. (Palo Alto CA) Mendez Victor P. (Berkeley CA) Kaplan Selig N. (El Cerrito CA), Amorphous silicon ionizing particle detectors.
  2. Imamura Kazunori (Tokyo JPX) Tanimoto Akikazu (Kawasaki JPX) Abe Nobutoshi (Kawasaki JPX), Apparatus for detecting foreign matters on a planar substrate.
  3. Stapleton Thomas T. (Bloomfield Hills MI), Combined distinctness of image and gloss meter.
  4. Sano Reiji (Kawasaki JPX) Kimura Minoru (Kawasaki JPX) Takahashi Hidemi (Kawasaki JPX), Distance measurement by laser light.
  5. Zuk David M. (Ann Arbor MI), Image sensor.
  6. Corby ; Jr. Nelson R. (Scotia NY), Integrated range and luminance camera.
  7. Himmel David P. (Dallas TX), Laser measuring system for inspection.
  8. Merlen Monty M. (Stamford CT) Slaker Frank A. (Norwalk CT), Method and apparatus for a web edge tracking flaw detection system.
  9. Clarke Graham M. (Edinburgh GB6), Surface inspection systems.
  10. Lucas ; John Martin ; Gracovetsky ; Serge, Surface sensor.

이 특허를 인용한 특허 (26)

  1. Nielsen, Henrik K.; Kuhlmann, Lionel; Nokes, Mark, Detection system for nanometer scale topographic measurements of reflective surfaces.
  2. Nielsen,Henrik K.; Kuhlmann,Lionel; Nokes,Mark, Detection system for nanometer scale topographic measurements of reflective surfaces.
  3. Schwarz,Peter; Sperling,Uwe, Device and method for the determination of the quality of surfaces.
  4. Fleischer,Johannes, Device for measuring color, luster and undulations on lacquered freeform surfaces.
  5. Overbeck,James L.; Van Andel,Richard J., Glare-directed imaging.
  6. Typpo Pekka M., Gloss sensor resistant to tilting and shifting paper and with improved calibration.
  7. Kolesnychenko, Aleksey Yurievich; Van Santen, Helmar; Kruijt-Stegeman, Yvonne Wendela, Imprint lithography.
  8. Kolesnychenko, Aleksey Yurievich; Van Santen, Helmar; Kruijt-Stegeman, Yvonne Wendela, Imprint lithography.
  9. Troxler, Robert Ernest, Method and apparatus for determining a characteristic of a construction material.
  10. Kafka, James D.; Li, Mingwei, Method and apparatus for micro-machining of articles that include polymeric materials.
  11. James D. Kafka ; Bruce Craig, Method and apparatus to detect a flaw in a surface of an article.
  12. Am Weg, Christian; May, Thilo; Nicolaus, Ralf; Petter, Jurgen; Berger, Gernot, Method and device for highly-precise measurement of surfaces.
  13. Troxler, Robert Ernest; Pratt, Jr., James Daniel, Method of determining a dimension of a sample of a construction material and associated apparatus.
  14. Wiles, Gregory R.; Prain, III, Charles C., Multi-beam apparatus for measuring surface quality.
  15. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., Non-contact gaging system and method for contoured glass sheets.
  16. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., Non-contact gaging system and method for contoured panels having specular surfaces.
  17. Troxler, Robert Ernest, Optical method and apparatus for determining a characteristic such as volume and density of an excavated void in a construction material.
  18. Kafka, James D.; Spence, David E., Remote UV laser system and methods of use.
  19. Corallo Valeriano,ITX ; Docchio Franco,ITX ; Minoni Umberto,ITX ; Zorzella Emidio,ITX, Surface characteristics measurement system and method.
  20. Willoughby ; Jr. Louis G. (Bay Village OH) Jordan Donald G. (Willoughby OH) Adomaitis Paul R. (Trafford PA) Goldman Avraham C. (South Euclid OH) Tomasello Anthony J. (Schaumburg IL) Montellese Steve , System and method for contactlessly gauging the thickness of a contoured object, such as a vehicle wheel.
  21. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., System and method for developing three-dimensional surface information corresponding to a contoured glass sheet.
  22. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., System and method for developing three-dimensional surface information corresponding to a contoured sheet.
  23. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., System and method for measuring reflected optical distortion in contoured glass sheets.
  24. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., System and method for measuring reflected optical distortion in contoured glass sheets.
  25. Addington, Jason C.; Vild, Michael J.; Moran, Benjamin L., System and method for measuring reflected optical distortion in contoured panels having specular surfaces.
  26. Southwood, Mark E., Wireframe algorithm and non-contact gauging apparatus.
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