초록 ▼

A modular automated test station permits a plurality of tests to be performed under program control on complex electronic assemblies such as avionics equipment and provides for calibration. Interactive prompts are displayed enabling test personnel with minimal training to operate the test station an

A modular automated test station permits a plurality of tests to be performed under program control on complex electronic assemblies such as avionics equipment and provides for calibration. Interactive prompts are displayed enabling test personnel with minimal training to operate the test station and perform the tests. Particular kinds of test instrumentation together with the associated software program may be removed or replaced by other instrumentation and software to adapt the test station to test of another kind of equipment. A group of test stations forms a part of an assembly line in which information may be shared among test stations and with remote databases. The test stations are arranged in groups with one test station in the group containing a processor that is shared with other stations in the group and with each test station containing an assigned processor with the assigned processors being permitted to communicate with the shared processor. The shared processor may also communicate with remote databases.

대표청구항 ▼

1. A method of automatic testing of electronic apparatus by means of programmable electronic test instrumentation means in a test work station of the kind containing programmed computer means for issuing commands to said electronic test instrumentation means and receiving results of tests performed

1. A method of automatic testing of electronic apparatus by means of programmable electronic test instrumentation means in a test work station of the kind containing programmed computer means for issuing commands to said electronic test instrumentation means and receiving results of tests performed by said test instrumentation means, said test instrumentation means being operatively coupled to and controlled by said programmed computer means, with said programmed computer means including memory means for storing information, and in which said test instrumentation means is coupled to said electronic apparatus under test via a path, said path including configurable input-output switch means controlled by said programmed computer means and adaptor means, having an input and output, for interconnecting circuits extending through said configurable input-output switch means to a connector means on said electronic apparatus under test, said adaptor means having electrical characteristics relevant to the measurement of said electronic apparatus under test, which includes the steps of: establishing a closed path between said test instrumentation means and said adaptor means output with said electronic apparatus being disconnected from said adaptor means; initiating operation of said test instrumentation means to perform predetermined tests, wherein the electrical characteristics of said test instrumentation means, said configurable input-output switch means and said adaptor means may be isolated and determined apart from electrical characteristics of the electronic apparatus under test, and for providing test results obtained thereby to said programmed computer means to provide normalization information; storing said normalization information in said programmed computer means at least temporarily; connecting said electronic apparatus under test to said adaptor means; initiating operation of said test instrumentation means to perform predetermined tests, wherein the electrical characteristics of said test instrumentation means, said configurable input-output switch means, said adaptor means and said electronic apparatus under test are collectively determined and for providing such collective test results obtained thereby to said programmed computer means with said computer means temporarily storing such collective test results; subtracting the corresponding normalization test results from said collective test results to provide test results for said electronic apparatus under test, whereby the performance characteristics of said electronic apparatus under test are isolated from the corresponding effects of said test instrumentation means, said configurable input-output switch means and said adaptor means; and storing the test results of said electronic apparatus under test thereby derived. 2. The method as defined in claim 1 further including the steps of: establishing a closed path between said test instrumentation means and said configurable input-output switch means with said adaptor means being disconnected from said configurable input-output switch means; initiating operation of said test instrumentation means to perform predetermined tests, whereby the electrical characteristics of said test instrumentation means and said configurable input-output switch means may be isolated and determined apart from electrical characteristics of said adaptor means and the electronic apparatus under test, and for providing test results obtained thereby to said programmed computer means to provide calibration information; and storing said calibration information in said programmed computer means. 3. The method as defined in claim 2 wherein said step of establishing a closed path between said test instrumentation means and said configurable input-output switch means includes the step of: plugging an electrical test connector means into place in said configurable input-output switch means in lieu of said adaptor means, said test connector means containing electrical interconnections therein for selectively interconnecting electrical paths through said configurable input-output switch means. 4. The method as defined in claim 1 wherein said step of establishing a closed path between said test instrumentation means and said adaptor means output with said electronic apparatus being disconnected from said adaptor means includes the step of: plugging an electrical test connector into place in said adaptor means in lieu of said electronic apparatus under test, said test connector means containing interconnections therein for selectively interconnecting paths through said adaptor means to form closed paths. 5. The method as defined in claim 1 wherein said test instrumentation means comprises: a plurality of RF stimulus signal sources; and a plurality of RF response measurement devices; and wherein said configurable input-output switch means includes a plurality of inputs and a lesser plurality of outputs with said RF stimulus signal sources and said RF response measurement devices being connected to corresponding ones of said switch means inputs and with said switch means outputs being connected to said adaptor means, whereby a stimulus signal may be routed through said adaptor means to equipment under test or to a test connector back to said RF response measurement devices; said configurable input-output switch means being selectively controlled by said computer means to establish a selective connection through said switch means for at least one of said RF stimulus generators and at least one of said RF response measuring devices for providing an electrical path between said adaptor means and selected ones of said RF stimulus generating means and a second electrical path between said adaptor means and one of said RF response measurement means, whereby initiating operation of each of said RF stimulus generating means and said RF response measuring means with said test connector in place in said adaptor means, a stimulus signal is routed through said configurable input-output switch means and said adaptor means and said test connector means to said RF response measurement means; and wherein said step of initiating said tests includes the step of: sequencing different combination of said RF stimulus source means and said RF response measurement devices in said electrical path to produce test results of a plurality of different electrical characteristics. 6. A test workstation for testing electronic apparatus under test including electronic subassemblies, assemblies and units, which test workstation includes: programmable electronic test instrumentation means; test controller processor means for issuing commands to said electronic test instrumentation and receiving results of tests performed by said test instrumentation; said test instrumentation being operatively coupled to and controlled by said test controller processor means, with said test controller processor means including memory means for storing program and data information; display means controlled by said test controller processor means for displaying information to a test operator; operator input means for permitting a test operator to enter information into said test controller processor means; configurable input-output switch means controlled by said test controller processor means coupled to said test instrumentation means; electrical adaptor means, having an input end for connecting circuits extending through said configurable input-output switch means and an output end for coupling therethrough circuits from said input end; said adaptor means being detachably connected to said configurable input-output switch means; said test instrumentation means being adapted to be coupled to an electronic apparatus under test via an electrical path, said electrical path including said configurable input-output switch means and said adaptor means and said adaptor means and said test instrumentation means having electrical characteristics interposed in said path relevant to the measurement of said electronic apparatus under test; said electronic apparatus under test containing a connector means adapted to mate with said output end of said adaptor means; first test load means for establishing a closed electrical path between said test instrumentation means and said adaptor means output with said electronic apparatus under test being disconnected from said adaptor means; means for initiating operation of said test instrumentation means to perform predetermined normalization tests with said test load means being coupled to said adaptor means in lieu of an electronic apparatus under test to produce normalization test results, wherein the electrical characteristics of said test instrumentation means, said configurable input-output switch means and said adaptor means is isolated and determined apart from electrical characteristics of the electronic apparatus under test; means for sending said normalization test results obtained thereby to said test controller processor means to provide normalization information; said test controller processor means being responsive to receipt of said normalization information for storing said normalization information at least temporarily in a normalization database; means responsive to said unit under test being coupled to said adaptor means and said adaptor means being coupled to said configurable input-output switch means for initiating operation of said test instrumentation means to perform predetermined tests, wherein the electrical characteristics of said test instrumentation means, said configurable input-output switch means, said adaptor means and said electronic apparatus under test are collectively determined; means for providing such collective test results obtained thereby to said test controller means with said test controller means temporarily storing such collective test results; means for subtracting the corresponding normalization test results form said collective test results to provide test results for said electronic apparatus under test, wherein the performance characteristics of said electronic apparatus under test are isolated from the corresponding effects of said test instrumentation means, said configurable input-output switch means and said adaptor means; means for storing the test results of said electronic apparatus under test thereby derived in an electronic apparatus test history database; and means for sending said test results to said display means for display to an operator. 7. The invention as defined in claim 6, further including: second test load means for connection to the output end of said configurable input-output switch means in lieu of said first test load means or said electronic apparatus under test for establishing means and said configurable input-output switch means; means for initiating operation of said test instrumentation means to perform predetermined tests, whereby the electrical characteristics of said test instrumentation means and said configurable input-output switch means may be isolated and determined apart from electrical characteristics of said adaptor means and from the electronic apparatus under test, and for providing test results obtained thereby to said test controller processor means to provide calibration information; and means for storing said calibration information in said test controller processor means in a calibration database. 8. The invention as defined in claim 6 wherein said test instrumentation means comprises: a plurality of RF stimulus signal sources; and a plurality of RF response measurement devices; and wherein said configurable input-output switch means includes a plurality of inputs and a lesser plurality of outputs with said RF stimulus signal sources and said RF response measurement devices being connected to corresponding ones of said switch means inputs and with said switch means outputs being connected to said adaptor means, whereby a stimulus signal may be routed through said adaptor means to equipment under test or a test connector back to said RF response measurement devices; said configurable input-output switch means being selectively controlled by said test controller processor means to establish a selective connection through said switch means for at least one of said RF stimulus generators and at least one of said RF response measuring devices to establish an electrical path between said adaptor means and selected ones of said RF stimulus generating means and one of said RF response measurement means, whereby initiating operation of each of said RF stimulus generating means and said RF response measuring means with either of said first or second means in place, a stimulus signal is routed through said configurable input-output switch means and said adaptor means and said respective test load means to said RF response measurement means; and: means controlled by said test controller processor means for sequencing different combinations of said RF stimulus source means and said RF response measurement devices in said electrical path to produce test results of different electrical characteristics. 9. The invention as defined in claim 6 wherein said test instrumentation means includes a plurality of different programmable RF stimulus generating means and RF response measuring means and wherein said test controller processor means includes program means for sequentially configuring said configurable input-output switch means to provide a sequence of electrical paths therethrough of different ones of said plurality of RF stimulus generating means and corresponding ones of said plurality of RF response measuring means and for correspondingly commanding operation of different combinations of said programmable RF stimulus generating means and RF response measuring means. 10. The invention as defined in claim 6 wherein said test instrumentation means further comprises: digital tester means for testing digital circuits; analog tester means for testing analog circuits; and RF tester means for testing RF circuits; each of said digital, analog and RF tester means being individually detachable from said system without affecting operation of any remaining attached tester means. 11. The invention as defined in claim 6 wherein said test instrumentation means comprises further: RF test instrumentation module means for performing a plurality of RF tests; said RF test instrumentation module including: a plurality of RF stimulus signal sources; and a plurality of RF response measurement devices; and wherein said configurable input-output switch means includes first configurable input-output switch means associated with said RF test instrumentation module means; said first configurable input-output switch means including a plurality of inputs and a lesser plurality of outputs with said RF stimulus signal sources and said RF response measurement devices being connected to corresponding ones of said configurable input-output switch means inputs, said switch means including control means responsive to digital information supplied to an input by said test controller processor means for selectively establishing at least two connections between said plurality of inputs and outputs prescribed by said test controller processor means, whereby a selected stimulus signal is applied to and a response signal is received from said output end of said first configurable input-output switch means and applied to a selected response measurement device. 12. The invention as defined in claim 11 wherein said test instrumentation means includes: digital testing means: said digital testing means being capable of applying a plurality of digital tests under control of said test controller processor means, receiving results of such tests and providing test output data describing test results of such digital tests to said test controller processor means. 13. The invention as defined in claim 6 further comprising: test station controller processor means coupled to said test controller processor means; said test station controller processor means including memory means for storing program and data information; means in said test controller means for querying said test station controller processor means for selecting program or data information responsive to an absence of said program or data information in said test controller means; and means in said test controller means for sending selected data information to said test station controller means. 14. The invention as defined in claim 13 further including in combination: factory database means for maintaining master program and data information; network means coupling said factory database means to said test station controller processor means; and wherein said test station controller means includes means for querying said factory database means responsive to an absence of program and data information in said memory means of said test station controller processor means. 15. The invention as defined in claim 6 wherein said test instrumentation means includes: a plurality of stimulus signal generating means and a plurality of response measuring means, each of said generating and measuring means being controllable by said test controller processor means with said stimulus generating means being actuated thereby to send signals to an output and said response measuring means being actuated to measure signals provided to its input and send the results as measured to said test controller processor means. 16. In a manufacturing system for assembling and testing electronic units containing any combination of digital, analog and RF circuits, in various stages of assembly, the improvement wherein said manufacturing system includes: a plurality of testing stations; said plurality of testing stations being arranged in at least three groups, including: a first group for testing printed wiring board assemblies, a second group for testing electronic modules formed with said printed wiring board assemblies, and a third group for testing electronic units formed with said electronic modules with said groups being arranged in a serial order of first, second and third in position in said assembly line; each said testing station including: test controller processor means; processor controlled test instrumentation module means for providing test stimulus signals to a unit under test and receiving responses, said test instrumentation module means being under control of and responsive to commands issued by said test controller processor means; test adaptor means for providing signal connections between said test instrumentation module means and a unit to be tested with said adaptor means being detachably connected to each of said module means and said unit under test; said test controller processor means enabling said test instrumentation module means to provide test stimulus signals to units under test in a predetermined sequence and for storing responses provided to said test instrumentation module means by said units; said manufacturing system further including: a plurality of test station controller processor means, one of said plurality of test station controller means being associated with a corresponding one of said groups of test stations; each of said test station controller processor means including: memory means for storing information, including programs and data; and input and output means for inputting and outputting information from said memory means; first network means for providing processor to processor communications to define a first path for sending and receiving information; means coupling said plurality of test station controller processor means to said first network means for networking said processor means for permitting communication thereover; a plurality of second network means for permitting processor to processor communications to define a path for sending and receiving program and data information, said plurality of second network means corresponding in number to the number of groups of said test stations with one of such second network means being associated with a corresponding one of said groups; means coupling said test controller processor means within each group to the respective second network means associated with said group; means coupling each of said test station controller processor means of each said group to a corresponding one of said plurality of second network means to enable the test station controller processor means associated with said respective group to communicate with all of said test controller processor means associated with said group, wherein information may be sent between said test controller processor means in said test stations of a particular group and said corresponding one of said plurality of test station controller processor means associated with said group. 17. The invention as defined in claim 16 further comprising: factory processor means; said factory processor means including a data base for storing master copies of information; said factory processor means being connected to said first network means for sending information to and receiving information from said plurality of test station controller processor means. 18. The invention as defined in claim 17 wherein said factory processor means includes master fault dictionary database means; and means for sending a copy of said fault dictionary database to said plurality of test station controller processor means. 19. The invention as defined in claim 17 wherein said factory processor means includes repair record database means containing a compilation correlating a particular type of unit under test and types of repairs made to such types of units. 20. The invention as defined in claim 17, further comprising: means for inputting the repair data covering repairs made to said units under test into said test controller processor means; and means at said test controller processor means for indicting the presence of newly inputted repair information to said test station controller processor means, whereby said repair information is made available by said test station controller processor means for remote transmission to said factory processor means, whereby said repair information may be automatically entered into said master repair record database means. 21. The invention as defined in claim 17 wherein each of said test controller processor means includes monitor means associated therewith for providing visual displays to an operator; and key means containing manually operable keys for permitting an operator to input information to said controller processor means responsive to requests presented by said controller processor means on said monitor means. 22. The invention as defined in claim 16 wherein said test instrumentation module means includes: digital tester means for testing digital circuits; analog tester means for testing analog circuits; and RF tester means for testing RF circuits. 23. The invention as defined in claim 22 wherein each of said test station controller processor means includes: memory means; said memory means containing at least; a first program defining a sequence of test vectors, record database means for storing signature responses obtained from said test instrumentation module means responsive to said module means applying test stimulus signals to a unit under test; fault library database means to define unit faults in respect of a given signature; repair record database means for storing data obtained in respect of units tested by said test station; program means for comparing signatures received with signatures contained in said fault library memory and for displaying the library memory information fault selected and storing the fault information in connection with an identification of the particular unit under test; and repair record compilation database means containing a compilation of the kinds and types of faults existent in units placed under test in connection with the kind of unit and in connection with the particular unit. 24. The invention as defined in claim 16 wherein each of said test station controller processor means and said test controller processor means includes: memory means; said memory means containing at least a first program defining a sequence of test stimulus signals, record database means for storing signature responses obtained from said test instrumentation module means responsive to said module means applying test stimulus signals to a unit under test; fault library database means to define unit faults in respect of a given signature; repair record database means for storing data obtained in respect of units tested by said test station; program means for comparing signatures received with signatures contained in said fault library memory and for displaying the library memory information fault selected and storing the fault information in connection with an identification of the particular unit under test; and repair record compilation database means containing a compilation of the kinds and types of faults existent in units placed under test in connection with the kind of unit and in connection with the particular unit. 25. The invention as defined in claim 23 wherein said test station controller processor means further includes: means for interrogating said factory database means responsive to operator input to identify the latest version of a selected test program; and means for sending via said first network means repair record update information on units under test to said factory database means for integration in a master repair record compilation database with like information elsewhere obtained, said master repair record compilation database being maintained in said factory database. 26. The invention as defined in claim 16 wherein said test controller processor means includes: fault dictionary database means containing data relating a particular signature to a particular fault or normal condition; and means responsive to reception of a test signature for looking up said test signature in said fault dictionary and outputting the related data located in said fault dictionary to said display means. 27. A test station for testing of electronic units of the type characterized by a connector means with which to connect with other electronic units and with which to permit access to electronic circuits contained therein, said test station comprising: computer means containing a plurality of test programs for executing a test program responsive to operator initiation thereof to provide a series of instructions at a test control output; computer controlled test instrument means responsive to said test control output of said computer means for outputting test vectors at an output and inputting test signatures resulting from output of said test vectors; operator control means for initiating execution of a selected test program by said computer; configurable interface means being controlled by said computer means for interfacing said test instrument means with an adaptor means, wherein test vectors and test signatures may be respectively passed from and to said test instrument means; adaptor means for interconnecting said interface means with the connector means of an electronic unit to couple test vectors and test signatures therebetween, wherein test signatures are obtained representative of the collective effect of said test instrument means, said interface means, said adaptor means and said electronic unit under test; test result database means stored in said computer means for maintaining a record of test results of units under test; means for receiving and temporarily storing test signatures attributed collectively to said test instrument means, said interface means and said adaptor means, exclusive of influence of said electronic unit under test, to provide a source of normalization information; test signature receiving means for receiving test signatures representative of the collective effect of said test instrument means, said interface means, said adaptor means and said unit under test; and means for subtracting the normalization information from the test signatures received by said test signature receiving means and storing said difference in said test result database means. 28. The invention as defined in claim 27 wherein said test instrument means comprises: digital tester means; analog tester means; and RF tester means; and wherein each of said tester means is individually detachable from said computer and said test adaptor means. 29. A test work station for operator assisted testing of complex electronic system assemblies, the unit under test, comprising: test controller processor means, including memory means; display means; said display means being controlled by said test controller processor means and responsive to said test controller processor means for displaying selected output from said test controller processor means to said test operator, whereby information is supplied to a test operator; scanner means; said scanner means being coupled to said test controller processor means for inputting information marked on said unit under test and communicating said information to said test controller processor means; finger operable key means; said key means for permitting a test operator to enter selection information into said test controller processor means responsive to alternative selection choices presented on said display means, wherein a test operator may input information interactively in response to information display on said display means; electronic assembly testing means; said assembly testing means being capable of applying a plurality of tests to a unit under test under control of said test controller processor means to provide test output data describing test results; said assembly testing means including: programmable test means for providing stimulus signals and for receiving response signals; input means for receiving input test instructions and transmitting same to said programmable test means to permit said programmable test means to perform tests responsive to said input test instructions; output means for outputting test results obtained thereby to said controller processor means; connecting means for coupling said input means and said output means to said test controller processor means for communicating test results to said processor means and for receiving test instructions from said processor means; configurable input-output interface connector means; said configurable input-output interface means having an input coupled to said programmable test means and being controlled by said computer means to configure multiple inputs with multiple outputs to create selective electrical paths therethrough; adaptor means for providing an electrical connection between said configurable input-output interface connector means of said electronic assembly testing means and a unit to be tested with said adaptor means being detachably connected to each of said assembly test means and said unit under test; calibration load means for temporary connection to said configurable input-output interface means in lieu of said adaptor means to selectively connect together circuits extending through said input-output interface means to allow calibration test of said test assembly means; and normalization load means for temporary connection to said adaptor means in lieu of said test unit under test to selectively connect together circuits extending through said adaptor means to allow normalization test of said test assembly means and said adaptor means.