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Semiconductor integrated circuit device and method of manufacturing the same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/10
출원번호 US-0422640 (1989-10-17)
우선권정보 JP-0261035 (1988-10-17)
발명자 / 주소
  • Owada Nobuo (Ohme JPX) Akimori Hiroyuki (Ohme JPX) Nitta Takahisa (Fuchuu JPX) Kobayashi Tohru (Iruma JPX) Sasabe Shunji (Iruma JPX) Kawaji Mikinori (Hino JPX) Kasahara Osamu (Hinode JPX)
출원인 / 주소
  • Hitachi, Ltd. (Tokyo JPX 03)
인용정보 피인용 횟수 : 35  인용 특허 : 0

초록

Disclosed is a semiconductor integrated circuit device adopting a gate array scheme, having a plurality of layers of wiring formed by a Design Automation system. The device according to the present invention includes a semiconductor substrate having basic cell forming regions, the basic cell forming

대표청구항

A semiconductor integrated circuit device adopting a gate array scheme wherein circuits constructed of basic cells, which are arranged in a matrix array, are electrically connected by a plurality of layers of wiring, comprising: a semiconductor substrate having (1) basic cell forming regions, in whi

이 특허를 인용한 특허 (35)

  1. Sakai, Isami, Composite semiconductor integrated circuit device.
  2. Bui Nguyen Duc (San Jose CA) Wollesen Donald L. (Saratoga CA), Enhanced electromigration lifetime of metal interconnection lines.
  3. Nakagawa, Kenji, IC bonding pad combined with mark or monitor.
  4. Pasch Nicholas F. (Pacifica CA) Butkus Aldona M. (Santa Clara CA), Integrated circuit structure having reduced cross-talk and method of making same.
  5. Shinagawa Noriaki,JPX, Integrated circuit with gate-array interconnections routed over memory area.
  6. Stolmeijer Andre, Interconnect scheme for integrated circuits.
  7. Kim,Hyun Young; Yoon,Joo Sun; Kim,Bong Ju; Tae,Seung Gyu, Lower substrate, display apparatus having the same and method of manufacturing the same.
  8. Sidhwa, Ardeshir J., Method and structure of a thick metal layer using multiple deposition chambers.
  9. Sidhwa, Ardeshir J., Method and structure of a thick metal layer using multiple deposition chambers.
  10. Tobben Dirk ; Weber Stefan J. ; Brintzinger Axel, Method for forming a semiconductor fuse.
  11. Efland Taylor R. ; Cotton David ; Skelton Dale J., Method of making a multiple transistor integrated circuit with thick copper interconnect.
  12. Ogawa,Tsuyoshi; Nishitani,Yuji, Multi-chip circuit module and method for producing the same.
  13. Efland Taylor R. ; Cotton David ; Skelton Dale J., Multiple transistor integrated circuit with thick copper interconnect.
  14. Cleeves, James M.; Scheuerlein, Roy E., Optimization of critical dimensions and pitch of patterned features in and above a substrate.
  15. Cleeves, James M.; Scheuerlein, Roy E., Optimization of critical dimensions and pitch of patterned features in and above a substrate.
  16. Cleeves,James M.; Scheuerlein,Roy E., Optimization of critical dimensions and pitch of patterned features in and above a substrate.
  17. Bui Nguyen Duc ; Wollesen Donald L., Reduced electromigration interconnection line.
  18. Kuge Shigehiro,JPX ; Arimoto Kazutami,JPX ; Tsukude Masaki,JPX ; Fujishima Kazuyasu,JPX, Semiconductor device comprising a plurality of interconnection patterns.
  19. Shigehiro Kuge JP; Kazutami Arimoto JP; Masaki Tsukude JP; Kazuyasu Fujishima JP, Semiconductor integrated circuit.
  20. Yoshida Yuji,JPX, Semiconductor integrated circuit chip.
  21. Okumura Koichiro (Tokyo JPX), Semiconductor integrated circuits with specific pitch multilevel interconnections.
  22. Kawata Masato,JPX, Semiconductor memory device having a plurality of wiring layers.
  23. Noguchi, Mitsuhiro; Nishiyama, Akira, Semiconductor with multilayer metal structure using copper that offer high speed performance.
  24. Mitsuhiro Noguchi JP; Akira Nishiyama JP, Semiconductor with multilayer wiring structure that offer high speed performance.
  25. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  26. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  27. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  28. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  29. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  30. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  31. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  32. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  33. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  34. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  35. Lin,Mou Shiung, Top layers of metal for high performance IC's.
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