Societe Nationale Industrielle et Aerospatiale (Paris FRX 07)
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초록▼
A method and device are disclosed for recognizing a target (T) among a plurality of n known targets Ti (with i=1, 2, 3, . . . , n). According to the invention, by direct examination of said target (T) to be recognized and from first values (Cki) representative of a plurality of p recognition criteri
A method and device are disclosed for recognizing a target (T) among a plurality of n known targets Ti (with i=1, 2, 3, . . . , n). According to the invention, by direct examination of said target (T) to be recognized and from first values (Cki) representative of a plurality of p recognition criteria Ck (with k=1, 2, 3, . . . , p), at least p third values (pCk(Ti)) are established representative of the probabilities that, for each recognition criterion (Ck), the target (T) to be recognized is each of said known targets (Ti); and said third values associated with the same known target (Ti) are merged while taking into account second values (PCk(Ti)) representative of the probabilities that a target (Ti) is recognized, in so far as criterion Ck is concerned, when it is examined so as to obtain n fourth values (p(Ti)), each of which is representative of the probability that the target to be recognized is one of the known targets (Ti).
대표청구항▼
Method for recognizing a target (T) among a plurality of n known targets Ti (with i=1,3,4, . . . , n), wherein: in a first preparatory step, for each of said known targets (Ti) first values (CKi) are determined representative of a plurality of p recognition criteria Ck (with k=1,2,3, . . . , p); in
Method for recognizing a target (T) among a plurality of n known targets Ti (with i=1,3,4, . . . , n), wherein: in a first preparatory step, for each of said known targets (Ti) first values (CKi) are determined representative of a plurality of p recognition criteria Ck (with k=1,2,3, . . . , p); in a second preparatory step, from direct examination of said n known targets (Ti), using said first values (CKi) and for each recognition criterion (Ck), nxp second values (PCk(Ti)) are established each representative of the probability for a target (Ti) to be recognized when it is examined whereas it is the target (Tj) which is examined (j=1,2,3, . . . , n); and in a step for recognizing said target: by direct examination of said target (T) to be recognized and from said first values (CKi) determined by said first preparatory step, at least p third values (pCk(Ti)) are established representative of the probabilities, for each recognition criterion (Ck), that the target (T) to be recognized is each of said n known target (Ti) insofar as each of said p criteria is concerned; said nxp third values associated with the same known target (Ti) are merged together by taking into account said nxp second values, so as to obatin n fourth values (p(Ti)), each of which is representative of the probability that the target to be recognized is one of the known targets (Ti); and the identity of the target to be recognized (T) is determined from the largest of said fourth values.
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이 특허를 인용한 특허 (22)
Steven M. Hoffberg ; Linda I. Hoffberg-Borghesani, Adaptive pattern recognition based control system and method.
Hoffberg, Steven M.; Hoffberg-Borghesani, Linda Irene, Ergonomic man-machine interface incorporating adaptive pattern recognition based control system.
Nishimori Eiji (Yokohama JPX) Shingu Toshiaki (Yokohama JPX), Method of evaluating object based upon image processing and inspection apparatus using said method.
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