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Polishing pad 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B24B-007/22
출원번호 US-0468348 (1990-01-22)
발명자 / 주소
  • Tuttle Mark E. (Boise ID)
출원인 / 주소
  • Micron Technology, Inc. (Boise ID 02)
인용정보 피인용 횟수 : 188  인용 특허 : 0

초록

A polishing pad for semiconductor wafers, having a face shaped to provide a constant, or nearly constant, surface contact rate to a workpiece such as a semiconductor wafer, in order to effect improved planarity of the workpiece. The favored face shape is a sunburst pattern having nontapered rays, co

대표청구항

Apparatus to polish a workpiece, comprising: a polishing pad, rotatable about an axis and having a face perpendicular to and coaxial with said axis; said face, in use, to be urged against the workpiece to facilitate polishing of same; wherein said face is configured to be able to provide to the work

이 특허를 인용한 특허 (188)

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  71. Boyd, John M.; Lacy, Michael S., Method and apparatus for fixed abrasive substrate preparation and use in a cluster CMP tool.
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  78. Pecen Jiri ; Chadda Saket ; Jairath Rahul ; Krusell Wilbur C., Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing.
  79. Pecen, Jiri; Chadda, Saket; Jairath, Rahul; Krusell, Wilbur C., Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing.
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  100. Birang Manoocher ; Gleason Allan ; Guthrie William L., Method of forming a transparent window in a polishing pad.
  101. Birang, Manoocher; Gleason, Allan; Guthrie, William L., Method of forming a transparent window in a polishing pad.
  102. Wiswesser, Andreas Norbert; Oshana, Ramiel; Hughes, Kerry F.; Rohde, Jay; Huo, David Datong; Benvegnu, Dominic J., Method of making and apparatus having polishing pad with window.
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  120. Wang, Yu-Piao, Polishing method, polishing pad and polishing system.
  121. Chiu, Allen; Chen, Shao-Yu; Jeng, Yu-Lung, Polishing pad.
  122. Fujita Takashi,JPX ; Kozai Yuzo,JPX ; Ohara Motoyuki,JPX, Polishing pad and apparatus for polishing a semiconductor wafer.
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  124. Kollodge, Jeffrey S.; Messner, Robert P., Polishing pad and method of use thereof.
  125. Chen, Hung Chih, Polishing pad configuration and chemical mechanical polishing system.
  126. Chen, Hung Chih, Polishing pad configuration and polishing pad support.
  127. Jiang, Lei; Shankar, Sadasivan; Fischer, Paul, Polishing pad design.
  128. Yu Tat-Kwan (Austin TX) Yu Chris C. (Austin TX), Polishing pad for chemical-mechanical polishing of a semiconductor substrate.
  129. Nishio Mikio,JPX ; Murakami Tomoyasu,JPX, Polishing pad for semiconductor wafer and method for polishing semiconductor wafer.
  130. Muldowney,Gregory P., Polishing pad having a groove arrangement for reducing slurry consumption.
  131. Bennett Doyle E. ; Osterheld Thomas H. ; Redeker Fred C. ; Addiego Ginetto, Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus.
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  133. Osterheld, Thomas H.; Ko, Sen-Hou, Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus.
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  137. Osterheld, Thomas H.; Ko, Sen-Hou, Polishing pad having a grooved pattern for use in chemical mechanical polishing.
  138. Tuttle, Mark E., Polishing pad with controlled abrasion rate.
  139. Doan Trung Tri ; Meikle Scott G., Polishing pad with elongated microcolumns.
  140. Muldowney, Gregory P., Polishing pad with optimized grooves and method of forming same.
  141. Wiswesser,Andreas Norbert; Oshana,Ramiel; Hughes,Kerry F.; Rohde,Jay; Huo,David Datong; Benvegnu,Dominic J., Polishing pad with window.
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  185. Wright David Q. ; Skrovan John K., Variable abrasive polishing pad for mechanical and chemical-mechanical planarization.
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