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Method and apparatus for structural integrity monitoring 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-015/20
  • G01H-001/00
출원번호 US-0559482 (1990-07-30)
발명자 / 주소
  • Gerardi Joseph J. (81 Crystal Dr. Dryden) Hickman Gail A. (81 Crystal Dr. Dryden NY 13053)
인용정보 피인용 횟수 : 157  인용 특허 : 30

초록

A system is disclosed for monitoring a structure and detecting disturbances and faults associated with such structure. The system includes an actuation device for mechanically exciting the structure, a sensing device for transducing vibrations experienced by the structure, and digital signal process

대표청구항

An apparatus for monitoring and identifying disturbances to a structure comprising: a) first processing means for processing signals so as to monitor and identify disturbances to said structure; b) switch means controlled by said first processing means for gating a voltage signal; c) actuation means

이 특허에 인용된 특허 (30)

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