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Multiple sequential excitation temperature sensing method and apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G07K-007/24
  • H01L-029/66
  • H01L-023/58
출원번호 US-0830633 (1992-02-04)
발명자 / 주소
  • Audy Jonathan M. (Campbell CA) Gilbert Barrie (Portland OR)
출원인 / 주소
  • Analog Devices, Inc. (Norwood MA 02)
인용정보 피인용 횟수 : 74  인용 특허 : 0

초록

The temperature at a semiconductor device having a generally non-linear, temperature dependent relationship between a pair of device parameters is determined by applying a plurality of sequential excitations to the device at different excitation levels, sensing the levels of the device parameters th

대표청구항

A temperature sensing method, comprising: exciting a device with at least three sequential input signals of different magnitudes, said device producing a resultant output signal in response to each of said input signals, said device having a predictable non-linear input-output characteristic that va

이 특허를 인용한 특허 (74)

  1. McLeod,Scott C.; Castellano,William, Accurate testing of temperature measurement unit.
  2. Nobutaka Nishigaki JP, Apparatus for controlling internal heat generating circuit.
  3. Sanchez Hector, Beta dependent temperature sensor for an integrated circuit.
  4. Aslan, Mehmet; Branch, John W., Beta variation cancellation in temperature sensors.
  5. Aslan, Mehmet; Branch, John W., Beta variation cancellation in temperature sensors.
  6. Aslan,Mehmet; Branch,John W., Beta variation cancellation in temperature sensors.
  7. Lang, Christoph; Lu, Crist, Circuit for canceling errors caused by parasitic and device-intrinsic resistances in temperature dependent integrated circuits.
  8. Lang, Christoph; Lu, Crist, Circuit for canceling errors caused by parasitic and device-intrinsic resistances in temperature dependent integrated circuits.
  9. Henderson, Richard Dean; Aslan, Mehmet, Constant offset buffer for reducing sampling time in a semiconductor temperature sensor.
  10. McLeod,Scott C.; Gay,Kenneth W., Conversion clock randomization for EMI immunity in temperature sensors.
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  12. Asam, Wilhelm; Fazekas, Josef; Martin, Andreas; Smeets, David; Von Hagen, Jochen, Device and method for detecting a reliability of integrated semiconductor components at high temperatures.
  13. Aslan Mehmet ; Can Sumer, Direct temperature sensing of a semiconductor device semiconductor device.
  14. McLeod, Scott C., EMI rejection for temperature sensing diodes.
  15. Bisch, Michael E.; Gierer, Joseph T., Electronic thermometer with selectable modes.
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  17. Bisch, Michael E.; Gierer, Joseph T., Electronic thermometer with selectable modes.
  18. Pippin,Jack D., Fail-safe thermal sensor apparatus and method.
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  20. Gilbert,Barrie, Grounded emitter logarithmic circuit.
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  25. Zhang, Hong; Rypka, William Robert; Tan, Emy; Izadinia, Mansour, M-level diode junction temperature measurement method cancelling series and parallel parasitic influences.
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  27. Nishigaki,Nobutaka; Ninomiya,Ryoji; Sakai,Makoto, Method and apparatus for controlling internal heat generating circuit.
  28. Porter,J. David, Method and apparatus for low voltage temperature sensing.
  29. Immel, Eric, Method and apparatus for measuring cooling efficacy of a fluid medium.
  30. Borys S. Senyk, Method and apparatus for monitoring the temperature of a processor.
  31. Pippin,Jack D., Method and apparatus for programmable thermal sensor for an integrated circuit.
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  33. Asam, Wilhelm; Fazekas, Josef; Martin, Andreas; Smeets, David; Hagen, Jochen Von, Method for detecting the reliability of integrated semiconductor components at high temperatures.
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  46. Johnson,Jeffrey David, Remote diode temperature sense method with parasitic resistance cancellation.
  47. Olson, Donald Robert; Haapala, Daniel Aaron, Semiconductor device burn-in temperature sensing.
  48. Yamamoto, Isao; Miyanaga, Koichi, Semiconductor integrated circuit device.
  49. Yamamoto,Isao; Miyanaga,Koichi, Semiconductor integrated circuit device.
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  52. Breinlinger, Richard H., Solid state temperature measuring device and method.
  53. Breinlinger,Richard H., Solid state temperature measuring device and method.
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  55. Tuthill Michael G.,IEX, Switched current temperature sensor circuit with compounded .DELTA.V.sub.BE.
  56. Wan, Jun; Holloway, Peter R.; Sheehan, Gary E., Synchronized delta-VBE measurement system.
  57. Gardner, Marco A.; Doorenbos, Jerry L., Systems and methods for PWM clocking in a temperature measurement circuit.
  58. Camarena, Jose A.; Mai, Khoi B.; McQuirk, Dale J., Systems and methods for calibrating a temperature detection module.
  59. Gardner, Marco A.; Doorenbos, Jerry L., Systems and methods for resistance compensation in a temperature measurement circuit.
  60. Doorenbos, Jerry L.; Gardner, Marco A., Systems and methods for temperature measurement using n-factor coefficient correction.
  61. Pippin, Jack D., Temperature averaging thermal sensor apparatus and method.
  62. Tesi,Davide, Temperature detector.
  63. Descombes Arthur,CHX, Temperature level detection circuit.
  64. Chiu,Jui Te, Temperature measurement circuit calibrated through shifting a conversion reference level.
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  67. Kim, Hyun Su; Lee, Jong Kyoung, Temperature sensor circuit capable of compensating for nonlinear components and compensation method for temperature sensor circuit.
  68. Pippin, Jack D., Temperature-based clock frequency controller apparatus and method.
  69. Pippin, Jack D., Temperature-based cooling device controller apparatus and method.
  70. Pippin, Jack D., Temperature-based cooling device controller apparatus and method.
  71. Stockstad, Troy L., Temperature-to-digital converter.
  72. Price, Jeffrey E., Thermometer calibration.
  73. Price,Jeffrey E., Thermometer calibration.
  74. Aslan, Mehmet; Henderson, Richard; Ng, Chung Wai Benedict, Three-terminal dual-diode system for fully differential remote temperature sensors.
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