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Elimination of potentially harmful electrical and magnetic fields from electric blankets and other electrical appliances 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H05B-003/34
출원번호 US-0419892 (1989-10-11)
발명자 / 주소
  • Gross Thomas A. O. (Lincoln MA)
출원인 / 주소
  • Trustees of the Thomas A. D. Gross 1988 Revocable Trust (Lincoln MA 02)
인용정보 피인용 횟수 : 77  인용 특허 : 0

초록

Diverse methods for eliminating potentially harmful periodically varying electrical and magnetic fields which emanate from electric blankets, heating pads, and other electrical appliances intended for use proximate to the human body. One approach entails the use of a self-shielding coaxial cable as

대표청구항

An electrically heated blanket or pad comprising: electrical conductors adapted for connection to a source of alternating electrical current; an electrically energizeable heating element for utilization proximate to the human body; and a control device interconnecting said heating element with said

이 특허를 인용한 특허 (77)

  1. Stormont, Robert Steven, Balanced mixer for MRI system with a hub, intermediate frequency, oscillator, and pre-amp circuitry coupled together.
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  11. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  12. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  13. Kil,Jong Jin, Controller and heating wire capable of preventing generation of electromagnetic waves.
  14. Mackta Leo, Device for reducing low frequency electromagnetic fields in an electric blanket and method.
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  62. Lesher,Timothy E., Probe testing structure.
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  65. Dunklee,John, Switched suspended conductor and connection.
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  71. Rumbaugh,Scott, Thermal optical chuck.
  72. Wildi Theodore,CAX, Three wire, three-phase heating cable and system.
  73. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  74. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  75. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  76. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
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