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Cluster tool dry cleaning system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F26B-003/28
출원번호 US-0820985 (1992-01-15)
발명자 / 주소
  • Grant Robert W. (Excelsior MN) Novak Richard E. (Plymouth MN)
출원인 / 주소
  • SubMicron Systems, Inc. (Allentown PA 02)
인용정보 피인용 횟수 : 64  인용 특허 : 0

초록

A cluster tool module for dry process cleaning of substrates. A substrate process reactor body assembly includes a gas inlet and gas outlet on opposing sides of a ceramic reactor body. A linear xenon flash lamp in a light bar provides a UV source for uniform distribution over a substrate by use of a

대표청구항

Cluster tool dry cleaning system comprising: a. a ceramic reactor body including a gas inlet, a gas outlet and wafer orifice; b. a light box over said ceramic reactor body; c. a light source means in said light box; and, d. means for supporting and rotating a wafer or substrate in said body.

이 특허를 인용한 특허 (64)

  1. Rose Peter H. ; Sferlazzo Piero ; van der Heide Robert G., Aerosol surface processing.
  2. Rose Peter H. ; Sferlazzo Piero ; van der Heide Robert G., Aerosol surface processing.
  3. Kaszuba, Andrzei; Rocha-Alvarez, Juan Carlos; Baluja, Sanjeev; Cho, Tom K.; M'Saad, Hichem; Hendrickson, Scott A.; Ho, Dustin W.; Nowak, Thomas, Apparatus and method for exposing a substrate to UV radiation using asymmetric reflectors.
  4. Kaszuba, Andrzei; Rocha Alvarez, Juan Carlos; Nowak, Thomas; Baluja, Sanjeev; Mukuti, Ndanka O., Apparatus and method for exposing a substrate to UV radiation while monitoring deterioration of the UV source and reflectors.
  5. Rocha-Alvarez, Juan Carlos; Nowak, Thomas; Du Bois, Dale R.; Baluja, Sanjeev; Hendrickson, Scott A.; Ho, Dustin W.; Kaszuba, Andrzei; Cho, Tom K., Apparatus and method for exposing a substrate to a rotating irradiance pattern of UV radiation.
  6. Rocha-Alvarez, Juan Carlos; Nowak, Thomas; Du Bois, Dale R.; Baluja, Sanjeev; Hendrickson, Scott A.; Ho, Dustin W.; Kaszuba, Andrzei; Cho, Tom K., Apparatus and method for exposing a substrate to a rotating irradiance pattern of UV radiation.
  7. Rocha Alvarez, Juan Carlos; Nowak, Thomas; Du Bois, Dale R.; Baluja, Sanjeev; Hendrickson, Scott A.; Ho, Dustin W.; Kaszuba, Andrzei; Cho, Tom K., Apparatus and method for treating a substrate with UV radiation using primary and secondary reflectors.
  8. Kusuda, Tatsufumi; Ueyama, Tsutomu, Apparatus for and method of heat treatment by light irradiation.
  9. Fayfield Robert T. ; Schwab Brent, Apparatus for processing both sides of a microelectronic device precursor.
  10. Butterbaugh,Jeffery W.; Gray,David C.; Fayfield,Robert T.; Siefering,Kevin; Heitzinger,John; Hiatt,Fred C., Apparatus for surface conditioning.
  11. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Cleaning and drying photoresist coated wafers.
  12. Butterbaugh Jeffery W. ; Gray David C., Cleaning method.
  13. Butterbaugh Jeffery W. ; Gray David C. ; Fayfield Robert T., Cleaning method.
  14. Grant, Robert W.; Ruzyllo, Jerzy; Torek, Kevin, Controlled etching of oxides via gas phase reactions.
  15. Laudat, Andreas; Metzner, Holger; Walter, Roland, Device for drying solvent-based ink.
  16. Francois J. Henley, Dry cleaning method.
  17. Henley, Francois J., Dry cleaning method for the manufacture of integrated circuits.
  18. Fayfield Robert T. ; Schwab Brent, Equipment for UV wafer heating and photochemistry.
  19. Fayfield, Robert T.; Schwab, Brent, Equipment for UV wafer heating and photochemistry.
  20. Tolle, John; Goodman, Matthew G., Germanium oxide pre-clean module and process.
  21. Aoki, Shigeki; Sakai, Yuichi; Yamashita, Mitsuo; Shinya, Hiroshi, Heat processing apparatus and heat processing method.
  22. Aoki, Shigeki; Sakai, Yuichi; Yamashita, Mitsuo; Shinya, Hiroshi, Heat processing apparatus and heat processing method.
  23. Nowak, Thomas; Rocha-Alvarez, Juan Carlos; Kaszuba, Andrzej; Hendrickson, Scott A.; Ho, Dustin W.; Baluja, Sanjeev; Cho, Tom; Chang, Josephine; M'Saad, Hichem, High efficiency UV curing system.
  24. Randhir Thakur ; James Pan, High selectivity etching process for oxides.
  25. Thakur Randhir ; Pan James, High selectivity etching process for oxides.
  26. Thakur Randhir ; Pan James, High selectivity etching process for oxides.
  27. Bhushan Rajiv ; Chang Ru ; Mohindra Raj ; Chiu Vincent ; Tran Dong T., Mandrel device and method for hard disks.
  28. Mohindra Raj ; Wong David C. ; Puri Suraj, Method and apparatus for cleaning wafers using multiple tanks.
  29. Rodney C. Langley, Method and apparatus for inspecting wafers.
  30. Yael Nemirovsky IL; Sara Stolyarova IL; Benjamin Brosilow IL, Method and apparatus for removing native oxide layers from silicon wafers.
  31. Butterbaugh Jeffery W. ; Gray David C. ; Fayfield Robert T. ; Siefering Kevin ; Heitzinger John ; Hiatt Fred C., Method and apparatus for surface conditioning.
  32. Engelsberg Audrey C., Method for enhancing chemisorption of material.
  33. Elliott, David J.; Millman, Jr., Ronald P.; Tardif, Murray; Aiello, Krista, Method for surface cleaning.
  34. Matsushita, Kiyohiro; Fukuda, Hideaki; Kagami, Kenichi, Method of cleaning UV irradiation chamber.
  35. Jeffery W. Butterbaugh ; Brent Schwab, Method of surface preparation.
  36. Knutson,Karson L.; Hwang,Jack, Multi-zone reflecting device for use in flash lamp processes.
  37. Emmi Peter A. ; Park Byeongju, Pass-through semiconductor wafer processing tool and process for gas treating a moving semiconductor wafer.
  38. Elliott, David J.; Thompson, Allan R.; Whitten, George D.; Camp, Jonathan C.; Krajewski, Mark T., Photocatalytic reactor system for treating flue effluents.
  39. Tolle, John; Goodman, Matthew G.; Vyne, Robert Michael; Hill, Eric R., Plasma pre-clean module and process.
  40. Tolle, John; Goodman, Matthew G.; Vyne, Robert Michael; Hill, Eric R., Plasma pre-clean module and process.
  41. Scott, Robin Charis; Johnson, Matt, Process and apparatus for treating wafers.
  42. Kruwinus Hans-Jurgen,ATX, Process and device for drying of substrates.
  43. Butterbaugh Jeffery W. ; Gray David C., Process for metals removal using beta-diketone or beta-ketoimine ligand forming compounds.
  44. Rose Peter H. ; Sferlazzo Piero, Processing a surface.
  45. Masahito Sugiura JP; Hiroshi Shinriki JP; Hideki Kiryu JP; Shintaro Aoyama JP, Processing apparatus and processing method.
  46. Engelsberg Audrey C. ; Parker William P., Removal of material by polarized radiation.
  47. Engelsberg Audrey C., Removal of surface contaminants by irradiation using various methods to achieve desired inert gas flow over treated surf.
  48. Elliott,David J.; Harte,Kenneth J.; Shephard,Larry E., Scanning plasma reactor.
  49. Gilboa Yitzhak Eric ; Brosilow Benjamin,ILX ; Levy Sagy ; Spielberg Hedvi ; Bransky Itai,ILX, Selective hemispherical grain silicon deposition.
  50. Gilboa Yitzhak Eric ; Brosilow Benjamin,ILX ; Levy Sagy ; Spielberg Hedvi ; Bransky Itai,ILX, Semiconductor wafer pretreatment utilizing ultraviolet activated chlorine.
  51. Otsuka, Takahisa; Shibata, Tsuyoshi, Substrate processing apparatus.
  52. Otsuka, Takahisa; Shibata, Tsuyoshi, Substrate processing method.
  53. Don Carl Powell, System and method for selectively increasing surface temperature of an object.
  54. Powell,Don Carl, System and method for selectively increasing surface temperature of an object.
  55. Grant, Robert W.; Petrone, Benjamin J.; Mumbauer, Paul D., Systems and methods for achieving isothermal batch processing of substrates used for the production of micro-electro-mechanical-systems.
  56. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Ultra-low particle disk cleaner.
  57. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Ultra-low particle semiconductor cleaner.
  58. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Ultra-low particle semiconductor cleaner.
  59. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Ultra-low particle semiconductor cleaner.
  60. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Anderson ; Sr. John H. ; Nowell Jeffrey, Ultra-low particle semiconductor cleaner.
  61. Raj Mohindra ; Abhay Bhushan ; Rajiv Bhushan ; Suraj Puri ; John H. Anderson Sr. ; Jeffrey Nowell, Ultra-low particle semiconductor cleaner.
  62. Raj Mohindra ; Abhay Bhushan ; Rajiv Bhushan ; Suraj Puri ; John H. Anderson, Sr. ; Jeffrey Nowell, Ultra-low particle semiconductor cleaner.
  63. Mohindra Raj ; Bhushan Abhay ; Bhushan Rajiv ; Puri Suraj ; Wong David, Ultra-low particle semiconductor cleaner using heated fluids.
  64. Baecker James J. ; Becker D. Scott ; Foline Michael J. ; Maciej Todd K., Vacuum compatible water vapor and rinse process module.
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