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Apparatus for detecting extraneous substances on a glass plate 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/00
  • G01J-004/00
출원번호 US-0813837 (1991-12-27)
우선권정보 JP-0414979 (1990-12-27)
발명자 / 주소
  • Kato Noboru (Hadano JPX) Horai Izuo (Odawara JPX) Kimura Toshihiro (Fujisawa JPX) Koizumi Mitsuyoshi (Yokohama JPX)
출원인 / 주소
  • Hitachi Electronics Engineering Co., Ltd. (Tokyo JPX 03)
인용정보 피인용 횟수 : 36  인용 특허 : 0

초록

An apparatus for detecting extraneous substances on a glass plate includes a first light projecting system arranged above a plane under examination on a glass plate, the surface of which is irradiated with an S-polarized laser beam at a first elevation angle, a second light projecting system arrange

대표청구항

An apparatus for detecting an extraneous substance on a glass plate, the apparatus comprising a first light projecting system for irradiating the surface of the glass plate with an S-polarized laser beam at a first elevation angle as viewed from the surface thereof under examination for extraneous s

이 특허를 인용한 특허 (36)

  1. Kurita,Shinichi, Angled sensors for detecting substrates.
  2. LeBlanc, Philip Robert; Schneider, Vitor Marino; Ustanik, Correy Robert, Apparatus and method for characterizing defects in a transparent substrate.
  3. Nakadai Tsutomu,JPX ; Ishiwata Osamu,JPX, Apparatus and method for inspecting disks.
  4. De La Fuente Fernando Javier,ESX, Apparatus and method for regulating the cross-linking density of glass coatings.
  5. Kral Jude A., Cleaning efficacy real time indicator.
  6. Meeks, Steven W.; Xu, Xiaoqian; Nguyen, Hung P.; Moghadam, Alireza Shahdoost; Ramachandran, Mahendra Prabhu, Detecting and classifying surface defects with multiple radiation collectors.
  7. Mogan Paul A. ; Schwindt Christian J. ; Mattson Carl B., Detector for particle surface contamination.
  8. Yatsugake Yasuo,JPX ; Okawa Takashi,JPX ; Mizutani Norihiko,JPX ; Iizuka Shigeharu,JPX, Inspection method and device of wafer surface.
  9. Davies, Christopher, Investigation of vehicle glazing panels.
  10. Nakano, Hiroyuki; Nakata, Toshihiko; Uto, Sachio; Hamamatsu, Akira; Maeda, Shunji; Urano, Yuta, Method and apparatus for detecting defects.
  11. Nakano, Hiroyuki; Nakata, Toshihiko; Uto, Sachio; Hamamatsu, Akira; Maeda, Shunji; Urano, Yuta, Method and apparatus for detecting defects.
  12. Nakano, Hiroyuki; Nakata, Toshihiko; Uto, Sachio; Hamamatsu, Akira; Maeda, Shunji; Urano, Yuta, Method and apparatus for detecting defects.
  13. Nakano, Hiroyuki; Nakata, Toshihiko; Uto, Sachio; Hamamatsu, Akira; Maeda, Shunji; Urano, Yuta, Method and apparatus for detecting defects.
  14. Miura Seiya,JPX ; Kohno Michio,JPX ; Kodachi Nobuhiro,JPX, Method and apparatus for inspecting a surface state.
  15. Shinya Okugawa JP, Method and apparatus for inspecting surface irregularities of transparent plate.
  16. Togashi, Takahiro; Matsui, Shigeru, Method for detecting particles and defects and inspection equipment thereof.
  17. Togashi, Takahiro; Matsui, Shigeru, Method for detecting particles and defects and inspection equipment thereof.
  18. Togashi, Takahiro; Matsui, Shigeru, Method for detecting particles and defects and inspection equipment thereof.
  19. Togashi, Takahiro; Matsui, Shigeru, Method for detecting particles and defects and inspection equipment thereof.
  20. Togashi,Takahiro; Matsui,Shigeru, Method for detecting particles and defects and inspection equipment thereof.
  21. Watanabe Masao,JPX, Method of and apparatus for detecting a surface condition of a wafer.
  22. Shinya Okugawa JP, Method of and apparatus for inspecting surface irregularities of transparent plate.
  23. Germer Thomas A. ; Asmail Clara C., Microroughness-blind optical scattering instrument.
  24. Lin, Yungyu, Mother glass inspection device and mother glass inspection method.
  25. Yeh, Chao-Yi; Su, Pin-Chuan; Yang, Shang-Iun; Liu, Chih Yuan, Panel inspection apparatus and method.
  26. Marxer,Norbert; Gross,Kenneth P.; Altendorfer,Hubert; Kren,George, Process and assembly for non-destructive surface inspections.
  27. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  28. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  29. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  30. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  31. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  32. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  33. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  34. Malchesky Paul S., Scanning device for evaluating cleanliness and integrity of medical and dental instruments.
  35. Tsuji Toshihiko (Utsunomiya JPX) Kohno Michio (Utsunomiya JPX), Surface state inspecting system including a scanning optical system for scanning a surface to be inspected with a first.
  36. Biellak,Steve; Stokowski,Stanley E.; Vaez Iravani,Mehdi, Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination.
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