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Method for forming semiconductor thin film 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/20
출원번호 US-0919372 (1992-07-29)
우선권정보 JP-0247662 (1989-09-23)
발명자 / 주소
  • Yonehara Takao (Atsugi JPX)
출원인 / 주소
  • Canon Kabushiki Kaisha (Tokyo JPX 03)
인용정보 피인용 횟수 : 158  인용 특허 : 0

초록

A method for forming a semiconductor thin film comprises crystallizing an amorphous silicon thin film by a first thermal treatment at 700°C. or lower for ten hours or longer and carrying out a second thermal treatment at 1200°C. or higher in which a lamp light is radiated to the crystallized thin fi

대표청구항

A method for forming a semiconductor thin film which comprises: (i) crystallizing an amorphous thin film formed on an amorphous insulating surface of a substrate by a first thermal treatment at 700°C. or lower for at least ten hours to form a crystallized thin film having a grain size of at least 1

이 특허를 인용한 특허 (158)

  1. Ohtani Hisashi,JPX ; Miyanaga Akiharu,JPX ; Fukunaga Takeshi,JPX ; Zhang Hongyong,JPX, Active Matry Display.
  2. Takemura, Yasuhiko, Display device and glass member and substrate member having film comprising aluminum, nitrogen and oxygen.
  3. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Hayakawa Masahiko,JPX ; Osame Mitsuaki,JPX, Display switch with double layered gate insulation and resinous interlayer dielectric.
  4. Takemura Yasuhiko,JPX, Electro-optical device.
  5. Sakaguchi Kiyofumi,JPX ; Yonehara Takao,JPX, Fabrication method for semiconductor substrate.
  6. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Fabrication method of semiconductor device.
  7. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Fabrication method of semiconductor device.
  8. Fukada,Takeshi; Sakama,Mitsunori; Teramoto,Satoshi, Glass substrate assembly, semiconductor device and method of heat-treating glass substrate.
  9. Shunpei Yamazaki JP; Hisashi Ohtani JP, Heating treatment device, heating treatment method and fabrication method of semiconductor device.
  10. Yamazaki,Shunpei; Ohtani,Hisashi, Heating treatment device, heating treatment method and fabrication method of semiconductor device.
  11. Yamazaki,Shunpei; Ohtani,Hisashi, Heating treatment device, heating treatment method and fabrication method of semiconductor device.
  12. Yamauchi, Yukio, Insulated gate field effect semiconductor device and forming method thereof.
  13. Yamazaki, Shunpei; Takemura, Yasuhiko, Insulated gate field effect transistor and method for forming the same.
  14. Yamazaki, Shunpei; Takemura, Yasuhiko, Insulated gate field effect transistor and method for forming the same.
  15. Takemura Yasuhiko,JPX, Insulated gate semiconductor device and process for fabricating the same.
  16. Takemura Yasuhiko,JPX, Insulated gate semiconductor device and process for fabricating the same.
  17. Takemura,Yasuhiko, Insulated gate semiconductor device and process for fabricating the same.
  18. Yasuhiko Takemura JP, Insulated gate semiconductor device and process for fabricating the same.
  19. Yasuhiko Takemura JP, Insulated gate semiconductor device and process for fabricating the same.
  20. Hongyong Zhang JP; Hideto Ohnuma JP; Yasuhiko Takemura JP, METHODOLOGY FOR PRODUCING THIN FILM SEMICONDUCTOR DEVICES BY CRYSTALLIZING AN AMORPHOUS FILM WITH CRYSTALLIZATION PROMOTING MATERIAL, PATTERNING THE CRYSTALLIZED FILM, AND THEN INCREASING THE CRYSTAL.
  21. Yamazaki,Shunpei; Ohtani,Hisashi; Shimada,Hiroyuki; Sakama,Mitsunori; Abe,Hisashi; Teramoto,Satoshi, Manufacturing method of a thin film semiconductor device.
  22. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Miyanaga Akiharu,JPX, Method and manufacturing semiconductor device.
  23. Yamazaki,Shunpei; Zhang,Hongyong; Kusumoto,Naoto; Takemura,Yasuhiko, Method for crystallizing semiconductor material.
  24. Shunpei Yamazaki JP; Hongyong Zhang JP; Naoto Kusumoto JP; Yasuhiko Takemura JP, Method for crystallizing semiconductor material without exposing it to air.
  25. Yamazaki, Shunpei; Zhang, Hongyong; Kusumoto, Naoto; Takemura, Yasuhiko, Method for crystallizing semiconductor material without exposing it to air.
  26. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Hayakawa Masahiko,JPX ; Osame Mitsuaki,JPX, Method for fabricating a semiconductor device.
  27. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Method for fabricating a semiconductor device.
  28. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Method for fabricating a semiconductor device.
  29. Shunpei Yamazaki JP; Satoshi Teramoto JP; Jun Koyama JP; Yasushi Ogata JP; Masahiko Hayakawa JP; Mitsuaki Osame JP, Method for fabricating a semiconductor device using a metal catalyst and high temperature crystallization.
  30. Zhang Hongyong,JPX ; Uochi Hideki,JPX ; Takayama Toru,JPX ; Fukunaga Takeshi,JPX ; Takemura Yasuhiko,JPX, Method for forming a semiconductor device.
  31. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Method for forming a semiconductor device in which the insulating layer is heated to contract after crystallization of t.
  32. Shimizu Satoshi,JPX ; Ueno Shuichi,JPX ; Maeda Shigenobu,JPX ; Ipposhi Takashi,JPX, Method for making a thin film transistor.
  33. Ohtani, Hisashi; Miyanaga, Akiharu; Fukunaga, Takeshi; Zhang, Hongyong, Method for manufacturing a semiconductor device.
  34. Ohtani,Hisashi; Miyanaga,Akiharu; Fukunaga,Takeshi; Zhang,Hongyong, Method for manufacturing a semiconductor device.
  35. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Method for manufacturing a thin film transistor device.
  36. Yamazaki, Shunpei; Takemura, Yasuhiko, Method for manufacturing a thin film transistor using a high pressure oxidation step.
  37. Ohtani, Hisashi; Miyanaga, Akiharu; Zhang, Hongyong; Yamaguchi, Naoaki, Method for manufacturing semiconductor device.
  38. Zhang Hongyong,JPX ; Takayama Toru,JPX, Method for producing a semiconductor device including doping with a catalyst that is a group IV element.
  39. Zhang Hongyong,JPX ; Takayama Toru,JPX, Method for producing a semiconductor device including doping with a group IV element.
  40. Hongyong Zhang JP; Yasuhiko Takemura JP; Toru Takayama JP, Method for producing semiconductor device.
  41. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Method for producing semiconductor device.
  42. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Method for producing semiconductor device.
  43. Zhang Hongyong,JPX ; Takemura Yasuhiko,JPX ; Takayama Toru,JPX, Method for producing semiconductor device.
  44. Zhang, Hongyong; Takemura, Yasuhiko; Takayama, Toru, Method for producing semiconductor device.
  45. Sato Nobuhiko,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX, Method for producing semiconductor substrate.
  46. Zhang Hongyong,JPX ; Ohnuma Hideto,JPX ; Takemura Yasuhiko,JPX, Method of crystallizing thin films when manufacturing semiconductor devices.
  47. Yasuhiko Takemura JP, Method of fabricating a semiconductor device.
  48. Fukunaga,Takeshi; Ohtani,Hisashi; Miyanaga,Akiharu, Method of fabricating a semiconductor device utilizing a catalyst material solution.
  49. Zhang Hongyong,JPX ; Teramoto Satoshi,JPX, Method of fabricating a thin film transistor.
  50. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Method of fabricating a thin film transistor in which the channel region of the transistor consists of two portions of d.
  51. Zhang Hongyong,JPX ; Takemura Yasuhiko,JPX, Method of forming a transistor with an LDD structure.
  52. Minegishi Masahiro,JPX ; Ino Masumitsu,JPX ; Kunii Masafumi,JPX ; Urazono Takenobu,JPX ; Hayashi Hisao,JPX, Method of forming polycrystalline semiconductor thin film.
  53. Isobe,Atsuo; Arao,Tatsuya, Method of manufacturing a semiconductor device.
  54. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Kusumoto Naoto,JPX ; Ohnuma Hideto,JPX, Method of manufacturing a semiconductor device.
  55. Yamazaki, Shunpei; Ohtani, Hisashi; Shimada, Hiroyuki; Sakama, Mitsunori; Abe, Hisashi; Teramoto, Satoshi, Method of manufacturing a semiconductor device.
  56. Yamazaki,Shunpei; Ohtani,Hisashi; Hamatani,Toshiji, Method of manufacturing a semiconductor device.
  57. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Method of manufacturing a semiconductor device.
  58. Yamazaki, Shunpei; Teramoto, Satoshi; Kusumoto, Naoto; Ohnuma, Hideto, Method of manufacturing a semiconductor device and manufacturing system thereof.
  59. Yamazaki, Shunpei; Teramoto, Satoshi; Kusumoto, Naoto; Ohnuma, Hideto, Method of manufacturing a semiconductor device and manufacturing system thereof.
  60. Mitsuki, Toru; Shichi, Takeshi; Maekawa, Shinji; Shibata, Hiroshi; Miyanaga, Akiharu, Method of manufacturing a semiconductor device having a crystallized semiconductor film.
  61. Zhang, Hongyong; Yamazaki, Shunpei, Method of manufacturing a semiconductor device with fluorinated layer for blocking alkali ions.
  62. Isobe, Atsuo; Arao, Tatsuya, Method of manufacturing a semiconductor device, utilizing a laser beam for crystallization.
  63. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Method of manufacturing a thin film transistor device.
  64. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Method of manufacturing a thin film transistor using light irradiation to form impurity regions.
  65. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX ; Inushima Takashi,JPX ; Fukada Takeshi,JPX, Method of manufacturing a thin film transistor using multiple sputtering chambers.
  66. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX ; Inushima Takashi,JPX ; Fukada Takeshi,JPX, Method of manufacturing gate insulated field effect transistors.
  67. Yamazaki, Shunpei; Zhang, Hongyong; Inushima, Takashi; Fukada, Takeshi, Method of manufacturing gate insulated field effect transistors.
  68. Yamazaki,Shunpei; Zhang,Hongyong; Inushima,Takashi; Fukada,Takeshi, Method of manufacturing gate insulated field effect transistors.
  69. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX ; Takeyama Junichi,JPX, Method of preparing a semiconductor having a controlled crystal orientation.
  70. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko; Miyanaga, Akiharu; Ohtani, Hisashi; Takeyama, Junichi, Method of preparing a semiconductor having controlled crystal orientation.
  71. Zhang Hongyong,JPX ; Uochi Hideki,JPX ; Takayama Toru,JPX ; Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Process for fabricating a thin film transistor semiconductor device.
  72. Ohtani Hisashi,JPX ; Fukunaga Takeshi,JPX ; Miyanaga Akiharu,JPX, Process for fabricating semiconductor device.
  73. Ohtani Hisashi,JPX ; Fukunaga Takeshi,JPX ; Miyanaga Akiharu,JPX, Process for fabricating semiconductor device.
  74. Ohtani Hisashi,JPX ; Fukunaga Takeshi,JPX ; Miyanaga Akiharu,JPX, Process for fabricating semiconductor device.
  75. Ohtani, Hisashi; Fukunaga, Takeshi; Miyanaga, Akiharu, Process for fabricating semiconductor device.
  76. Ohtani, Hisashi; Fukunaga, Takeshi; Miyanaga, Akiharu, Process for fabricating semiconductor device.
  77. Ohtani,Hisashi; Fukunaga,Takeshi; Miyanaga,Akiharu, Process for fabricating semiconductor device.
  78. Takemura Yasuhiko,JPX, Process for fabricating semiconductor device.
  79. Ohtani, Hisashi; Fukunaga, Takeshi; Miyanaga, Akiharu, Process for fabricating thin film transistors.
  80. Yamagata Kenji,JPX ; Yonehara Takao,JPX, Process for producing a semiconductor substrate.
  81. Yamagata Kenji,JPX ; Yonehara Takao,JPX ; Sato Nobuhiko,JPX ; Sakaguchi Kiyofumi,JPX, Process for producing semiconductor substrate.
  82. Sakaguchi,Kiyofumi; Yonehara,Takao, Process for production of semiconductor substrate.
  83. Takayama Toru (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Process of fabricating a semiconductor device in which one portion of an amorphous silicon film is thermally crystallize.
  84. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor active region of TFTs having radial crystal grains through the whole area of the region.
  85. Hongyong Zhang JP; Hideki Uochi JP; Toru Takayama JP; Shunpei Yamazaki JP; Yasuhiko Takemura JP, Semiconductor and process for fabricating the same.
  86. Zhang Hongyong,JPX ; Uochi Hideki,JPX ; Takayama Toru,JPX ; Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Semiconductor and process for fabricating the same.
  87. Sato Nobuhiko,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX, Semiconductor article with porous structure.
  88. Akiharu Mitanaga JP; Hisashi Ohtani JP; Satoshi Teramoto JP, Semiconductor device.
  89. Mitanaga Akiharu,JPX ; Ohtani Hisashi,JPX ; Teramoto Satoshi,JPX, Semiconductor device.
  90. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko; Miyanaga, Akiharu, Semiconductor device and fabrication method of the same.
  91. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Hayakawa Masahiko,JPX ; Osame Mitsuaki,JPX, Semiconductor device and fabrication method thereof.
  92. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki, Semiconductor device and fabrication method thereof.
  93. Okada Takako,JPX ; Kambayashi Shigeru,JPX ; Yabuki Moto,JPX ; Onga Shinji,JPX ; Tsunashima Yoshitaka,JPX ; Mikata Yuuichi,JPX ; Okano Haruo,JPX, Semiconductor device and its fabricating method.
  94. Okada Takako,JPX ; Kambayashi Shigeru,JPX ; Yabuki Moto,JPX ; Onga Shinji,JPX ; Tsunashima Yoshitaka,JPX ; Mikata Yuuichi,JPX ; Okano Haruo,JPX, Semiconductor device and its fabricating method.
  95. Okada Takako,JPX ; Kambayashi Shigeru,JPX ; Yabuki Moto,JPX ; Onga Shinji,JPX ; Tsunashima Yoshitaka,JPX ; Mikata Yuuichi,JPX ; Okano Haruo,JPX, Semiconductor device and its fabricating method.
  96. Shunpei Yamazaki JP; Satoshi Teramoto JP; Jun Koyama JP; Yasushi Ogata JP; Masahiko Hayakawa JP; Mitsuaki Osame JP; Hisashi Ohtani JP; Toshiji Hamatani JP, Semiconductor device and its manufacturing method.
  97. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor device and its manufacturing method.
  98. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor device and its manufacturing method.
  99. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki; Ohtani,Hisashi; Hamatani,Toshiji, Semiconductor device and its manufacturing method.
  100. Yamazaki, Shunpei; Suzawa, Hideomi; Kusuyama, Yoshihiro; Ono, Koji; Koyama, Jun, Semiconductor device and manufacturing method thereof.
  101. Yamazaki, Shunpei; Suzawa, Hideomi; Kusuyama, Yoshihiro; Ono, Koji; Koyama, Jun, Semiconductor device and manufacturing method thereof.
  102. Yamazaki, Shunpei; Suzawa, Hideomi; Kusuyama, Yoshihiro; Ono, Koji; Koyama, Jun, Semiconductor device and manufacturing method thereof.
  103. Yamazaki,Shunpei; Suzawa,Hideomi; Kusuyama,Yoshihiro; Ono,Koji; Koyama,Jun, Semiconductor device and manufacturing method thereof.
  104. Yamazaki,Shunpei; Suzawa,Hideomi; Kusuyama,Yoshihiro; Ono,Koji; Koyama,Jun, Semiconductor device and manufacturing method thereof.
  105. Zhang, Hongyong, Semiconductor device and manufacturing method thereof.
  106. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor device and method for fabricating the same.
  107. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor device and method for fabricating the same.
  108. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki; Ohtani,Hisashi; Hamatani,Toshiji, Semiconductor device and method for fabricating the same.
  109. Shunpei Yamazaki JP; Yasuhiko Takemura JP, Semiconductor device and method for forming the same.
  110. Shunpei Yamazaki JP; Yasuhiko Takemura JP, Semiconductor device and method for forming the same.
  111. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX, Semiconductor device and method for forming the same.
  112. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX, Semiconductor device and method for forming the same.
  113. Yamazaki, Shunpei; Takemura, Yasuhiko, Semiconductor device and method for forming the same.
  114. Yamazaki, Shunpei; Takemura, Yasuhiko, Semiconductor device and method for forming the same.
  115. Yamazaki, Shunpei; Takemura, Yasuhiko; Mase, Akira; Uochi, Hideki, Semiconductor device and method for forming the same.
  116. Yamazaki,Shunpei; Zhang,Hongyong, Semiconductor device and method for forming the same.
  117. Yamazaki,Shunpei; Zhang,Hongyong, Semiconductor device and method for forming the same.
  118. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko; Miyanaga, Akiharu; Ohtani, Hisashi; Takeyama, Junichi, Semiconductor device and method for its preparation.
  119. Zhang,Hongyong; Takayama,Toru; Takemura,Yasuhiko; Miyanaga,Akiharu; Ohtani,Hisashi; Takeyama,Junichi, Semiconductor device and method for its preparation.
  120. Akiharu Miyanaga JP; Hisashi Ohtani JP; Satoshi Teramoto JP, Semiconductor device and method for manufacturing the same.
  121. Hongyong Zhang JP; Hideki Uochi JP; Toru Takayama JP; Takeshi Fukunaga JP; Yasuhiko Takemura JP, Semiconductor device and method for manufacturing the same.
  122. Miyanaga, Akiharu; Ohtani, Hisashi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  123. Miyanaga, Akiharu; Ohtani, Hisashi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  124. Miyanaga,Akiharu; Ohtani,Hisashi; Takemura,Yasuhiko, Semiconductor device and method for manufacturing the same.
  125. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  126. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  127. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor device and method of fabricating same.
  128. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki; Ohtani,Hisashi; Hamatani,Toshiji, Semiconductor device and method of fabricating same.
  129. Takemura, Yasuhiko, Semiconductor device and method of fabricating the same.
  130. Takemura,Yasuhiko, Semiconductor device and method of fabricating the same.
  131. Miyanaga, Akiharu; Ohtani, Hisashi; Takemura, Yasuhiko, Semiconductor device and method of manufacturing the same.
  132. Zhang Hongyong,JPX ; Ohnuma Hideto,JPX ; Takemura Yasuhiko,JPX, Semiconductor device and process for fabricating the same.
  133. Zhang, Hongyong; Ohnuma, Hideto; Takemura, Yasuhiko, Semiconductor device and process for fabricating the same.
  134. Zhang,Hongyong; Ohnuma,Hideto; Takemura,Yasuhiko, Semiconductor device and process for fabricating the same.
  135. Makita Naoki,JPX ; Funai Takashi,JPX ; Yamamoto Yoshitaka,JPX ; Mitani Yasuhiro,JPX ; Nomura Katsumi,JPX ; Miyamoto Tadayoshi,JPX ; Kosai Takamasa,JPX, Semiconductor device formed within asymetrically-shaped seed crystal region.
  136. Hongyong Zhang JP; Toru Takayama JP; Yasuhiko Takemura JP; Akiharu Miyanaga JP; Hisashi Ohtani JP, Semiconductor device forming method.
  137. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX, Semiconductor device forming method.
  138. Zhang,Hongyong; Takayama,Toru; Takemura,Yasuhiko; Miyanaga,Akiharu; Ohtani,Hisashi, Semiconductor device forming method.
  139. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki; Ohtani,Hisashi; Hamatani,Toshiji, Semiconductor device having a crystalline semiconductor film.
  140. Zhang, Hongyong; Takayama, Toru, Semiconductor device having channel formation region comprising silicon and containing a group IV element.
  141. Zhang Hongyong,JPX, Semiconductor device having improved crystal orientation.
  142. Zhang Hongyong,JPX, Semiconductor device having improved crystal orientation.
  143. Yamazaki, Shunpei; Adachi, Hiroki; Kuwabara, Hideaki, Semiconductor device having semiconductor circuit comprising semiconductor element, and method for manufacturing same.
  144. Zhang,Hongyong; Takayama,Toru; Takemura,Yasuhiko; Miyanaga,Akiharu; Ohtani,Hisashi, Semiconductor device structure.
  145. Ohtani,Hisashi; Miyanaga,Akiharu; Zhang,Hongyong; Yamaguchi,Naoaki, Semiconductor device with residual nickel from crystallization of semiconductor film.
  146. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Miyanaga, Akiharu, Semiconductor film having a single-crystal like region with no grain boundary.
  147. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX ; Kusumoto Naoto,JPX ; Takemura Yasuhiko,JPX, Semiconductor material and method for forming the same and thin film transistor.
  148. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX ; Kusumoto Naoto,JPX ; Takemura Yasuhiko,JPX, Semiconductor material and method for forming the same and thin film transistor.
  149. Yamazaki, Shunpei; Zhang, Hongyong; Kusumoto, Naoto; Takemura, Yasuhiko, Semiconductor material and method for forming the same and thin film transistor.
  150. Sato Nobuhiko,JPX ; Yonehara Takao,JPX, Semiconductor substrate and process for production thereof.
  151. Hisashi Ohtani JP; Akiharu Miyanaga JP; Takeshi Fukunaga JP; Hongyong Zhang JP, Semiconductor thin film transistor with crystal orientation.
  152. Yamazaki,Shunpei; Takemura,Yasuhiko; Zhang,Hongyong; Takayama,Toru; Uochi,Hideki, Semiconductor, semiconductor device, and method for fabricating the same.
  153. Bohr, Mark, Silicon on insulator (SOI) transistor and methods of fabrication.
  154. Yamazaki, Shunpei; Ohtani, Hisashi; Shimada, Hiroyuki; Sakama, Mitsunori; Abe, Hisashi; Teramoto, Satoshi, Substrate processing apparatus and a manufacturing method of a thin film semiconductor device.
  155. Shimizu Satoshi,JPX ; Ueno Shuichi,JPX ; Maeda Shigenobu,JPX ; Ipposhi Takashi,JPX, Thin film transistor and a method of manufacturing thereof.
  156. Shimizu Satoshi,JPX ; Ueno Shuichi,JPX ; Maeda Shigenobu,JPX ; Ipposhi Takashi,JPX, Thin film transistor and a method of manufacturing thereof.
  157. Yamazaki, Shunpei; Takemura, Yasuhiko; Mase, Akira; Uochi, Hideki, Thin film transistors having anodized metal film between the gate wiring and drain wiring.
  158. Zhang,Hongyong; Yamazaki,Shunpei, Thin-film transistor.
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