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XYZ coordinates measuring system

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
  • G06K-009/46
  • G01B-011/14
  • H04N-007/00
출원번호 US-0752642 (1991-08-28)
우선권정보 JP-0340866 (1989-12-28)
국제출원번호 PCT/JP90/01716 (1990-12-26)
§371/§102 date 19910828 (19910828)
국제공개번호 WO-9110111 (1991-07-11)
발명자 / 주소
  • Ozeki Osamu (Aichi JPX) Higuchi Kazunori (Aichi JPX) Yamamoto Shin (Aichi JPX)
출원인 / 주소
  • Kabushiki Kaisha Toyota Chuo Kenkyusho (Aichi JPX 03)
인용정보 피인용 횟수 : 37  인용 특허 : 0

초록

XYZ coordinates of an object are measured by projecting pulse slit light onto the object, imaging the slit line formed on the surface of the object by a TV camera, and processing the video signal from the camera according to the scanning signals from the camera. The position of the slit line on the

대표청구항

An XYZ coordinates measuring system comprising: a slit light source for projecting slit light toward the surface of an object to be measured at a given angle; a TV camera for imaging the slit line formed on the surface of the object by the slit light; a pulse signal generating circuit which supplies

이 특허를 인용한 특허 (37)

  1. Umeda Yuichi,JPX ; Saito Junichi,JPX ; Morishita Ichiro,JPX ; Nakayama Masaru,JPX ; Sato Arao,JPX ; Katagiri Kazuhiro,JPX, Apparatus for inclination detection and input apparatus using this apparatus.
  2. Umeda Yuichi,JPX ; Saito Junichi,JPX ; Morishita Ichiro,JPX ; Nakayama Masaru,JPX ; Sato Arao,JPX ; Katagiri Kazuhiro,JPX, Coordinate position of moving light source by using separated groups of detectors each group having an iris.
  3. Pangrazio, John Gregory; Pangrazio, John Alan; Pangrazio, Robert Thomas; Brey, Kenneth Lloyd; Pena-Gutierrez, Cesar, Dimensional detection system and associated method.
  4. Bridges, Robert E., Dynamic range of a line scanner having a photosensitive array that provides variable exposure.
  5. Bridges, Robert E., Dynamic range of a line scanner having a photosensitive array that provides variable exposure.
  6. Kudo, Koichi; Takayama, Hideyuki, Image forming apparatus including position detector.
  7. Honda Motoharu (Shiga JPX), Image recognition apparatus capable of inspecting height and method for inspecting height by using two slit incident bea.
  8. Bartko Robert J. (Shelby Township MI) Rosen Jack H. (Farmington Hills MI), Intelligent sensor method and apparatus for an optical wheel alignment machine.
  9. Bartko Robert J. ; Rosen Jack H., Intelligent sensor method and apparatus for an optical wheel alignment machine.
  10. Quadling,Henley; Quadling,Mark; Blair,Alan, Laser digitizer system for dental applications.
  11. Quadling,Henley; Quadling,Mark; Blair,Alan, Laser digitizer system for dental applications.
  12. Worster Bruce W. ; Crane Dale E. ; Hansen Hans J. ; Fairley Christopher R. ; Lee Ken K., Laser imaging system for inspection and analysis of sub-micron particles.
  13. Atwell, Paul C.; Macfarlane, Keith G., Laser line probe having improved high dynamic range.
  14. Wilson, Christopher Michael; Atwell, Paul C., Line scanner that uses a color image sensor to improve dynamic range.
  15. McBride Margot,GBX, Medical imaging systems.
  16. Paul S. Pedersen, Method and apparatus for determining the coordinates of an object.
  17. Worster Bruce W. ; Lee Ken K., Method for characterizing defects on semiconductor wafers.
  18. Worster, Bruce W.; Lee, Ken K., Method for characterizing defects on semiconductor wafers.
  19. Worster,Bruce W.; Lee,Ken K., Method for characterizing defects on semiconductor wafers.
  20. Worster,Bruce W.; Lee,Ken K., Method for characterizing defects on semiconductor wafers.
  21. Hooker Jeff ; Simmons Steve, Method of determining the planar inclination of a surface.
  22. Yamada Naoki,JPX ; Tanaka Kazumoto,JPX ; Shinohara Makoto,JPX, Method of determining three dimensional position of object and apparatus therefor.
  23. Koerner Arthur ; Hanson James, Non-contact method and apparatus for determining camber and caster of a vehicle wheel.
  24. Kurokawa, Shuji; Kobayashi, Kenji, Observation apparatus and method of controlling light emission thereof.
  25. Ohyama Nagaaki (Yokohama JPX) Kikuchi Susumu (Hachioji JPX) Sonobe Kazuo (Hidaka JPX), Optical image reconstructing apparatus capable of reconstructing optical three-dimensional image having excellent resolu.
  26. Yamaoka Naoji (Sayama JPX) Oda Koji (Sayama JPX), Optical measuring method.
  27. Smith,Melvyn Lionel; Smith,Lyndon; Carlsruh,Eve, Overhead dimensioning system and method.
  28. Hooker Jeff ; Simmons Steve, Planar normality sensor.
  29. Migdal Alexander ; Petrov Michael ; Lebedev Alexei, Portable 3-D scanning system and method for rapid shape digitizing and adaptive mesh generation.
  30. Migdal, Alexander; Petrov, Michael; Lebedev, Alexei; Shelyekhova, Veronika; Abadjev, Vadim; Bernstein, Vladimir; Afanassenkov, Andrei, Structured-light, triangulation-based three-dimensional digitizer.
  31. Migdal Alexander A. ; Petrov Michael ; Lebedev Alexei, System and method for rapid shape digitizing and adaptive mesh generation.
  32. Petrov,Michael; Migdal,Alexander; Lebedev,Alexei; Shelyekhova,Veronika; Polonskiy,Leonid; Abadjev,Vadim, System and method of three-dimensional image capture and modeling.
  33. Petrov,Michael; Migdal,Alexander; Lebedev,Alexei; Shelyekhova,Veronika; Polonskiy,Leonid; Abadjev,Vadim, System and method of three-dimensional image capture and modeling.
  34. Petrov,Michael; Migdal,Alexander; Lebedev,Alexei; Shelyekhova,Veronika; Polonskiy,Leonid; Abadjev,Vadim, System and method of three-dimensional image capture and modeling.
  35. Louise, Justin Ralph; Francis, Kevin Roy; Yaw, David James, System for three-dimensional rendering of electrical test and measurement signals.
  36. Ban, Kazunori; Kanno, Ichiro, Three-dimensional visual sensor.
  37. Hooker Jeffrey A. ; Spencer ; Jr. James E., Workpiece treating apparatus and method of treating same.
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