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Semiconductor device with test-only contacts and method for making the same

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-023/02
출원번호 US-0864246 (1992-04-06)
발명자 / 주소
  • Mennitt Timothy J. (Cedar Park TX) Warren John P. (Austin TX) Sloan James W. (Austin TX)
출원인 / 주소
  • Motorola, Inc. (Schaumburg IL 02)
인용정보 피인용 횟수 : 113  인용 특허 : 0

초록

A semiconductor device has test-only contacts to reduce the size of the device and eliminate unnecessary external contacts. In one form of the invention, a semiconductor device (30) is provided with solder balls (26) which are electrically coupled to those portions of a semiconductor die (20) that a

대표청구항

A semiconductor device comprising: a package substrate having a top surface, a bottom surface, and a perimeter; a plurality of external operational contacts attached to a surface of the package substrate for electrical connection to a user substrate; a plurality of test-only contacts formed on a sur

이 특허를 인용한 특허 (113)

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