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Flash EEPROM array with high endurance 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G11C-029/00
출원번호 US-0057583 (1993-05-06)
발명자 / 주소
  • Van Buskirk Michael A. (San Jose CA) Plouse Kevin W. (San Jose CA) Pawletko Joseph G. (Sunnyvale CA) Chang Chi (Redwood City CA) Haddad Sameer S. (San Jose CA) Gutala Ravi P. (Sunnyvale CA)
출원인 / 주소
  • Advanced Micro Devices, Inc. (Sunnyvale CA 02)
인용정보 피인용 횟수 : 138  인용 특허 : 0

초록

An over-erased bit correction structure is provided for performing a correction operation on over-erased memory cells in an array of flash EEPROM memory cells during programming operations so as to render high endurance. Sensing circuitry (23) is used to detect column leakage current indicative of a

대표청구항

In a semiconductor integrated memory device having an over-erased bit correction structure for performing a correction operation on over-erased memory cells in the memory device, said correction structure comprising in combination: a cell matrix (12) having a plurality of memory cells (MC) arrayed i

이 특허를 인용한 특허 (138)

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