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Position dependent rate dampening in any active hand controller 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-005/01
  • B64C-037/00
출원번호 US-0957427 (1992-10-06)
발명자 / 주소
  • Gregory William W. (St. Petersburg FL) Kauffman James W. (Palm Harbor FL)
출원인 / 주소
  • Honeywell Inc. (Minneapolis MN 02)
인용정보 피인용 횟수 : 54  인용 특허 : 0

초록

A control system for an active hand controller, for example, uses a control stick connected to and controlled by a motor. Electronics are provided to control the motor to eliminate oscillations due to motor torque and high gain due to breakout at the control stick when the control stick is at about

대표청구항

An active hand controller system comprising: manual input control means; a motor in connection with said manual input control means to provide desired force and feel characteristics of said manual input control means; sensing means which senses predetermined characteristics, including position, of s

이 특허를 인용한 특허 (54)

  1. Hegg Jeffrey W. (N. Reddington Beach FL) Yount Larry J. (Scottsdale AZ) Potter William F. (Glendale AZ), Active hand controller redundancy and architecture.
  2. Hanlon, Casey; Ezran, Shmuel; Christensen, Don, Active pilot inceptor with self warm-up.
  3. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  4. Strid,Eric; Gleason,K. Reed, Active wafer probe.
  5. Irwin, III, Joseph G.; Einthoven, Pieter G.; Miller, David G.; Spano, Mark S., Active-inceptor tactile-cueing hands-off rate-limit.
  6. Najmabadi Kioumars ; Evans Monte R. ; Coleman Edward E. ; Bleeg Robert J. ; Breuhaus Richard S. ; Anderson Dorr Marshall ; Nelson Timothy A., Aircraft pitch-axis stability and command augmentation system.
  7. Nelson,Bruce A.; Klausmeyer,Patrick J., Aircraft roll disconnect mechanism.
  8. Hirvonen, Jukka Matti, Apparatus and method for backup control in a distributed flight control system.
  9. Hirvonen, Jukka Matti, Apparatus and method for backup control in a distributed flight control system.
  10. Tessier, Claude; Martineau, Jonathan, Apparatus and method for controlling a force-activated controller.
  11. Anders Sjoquist SE, Arrangement and method for regulating the steering force in a mechanical steering system for an aircraft.
  12. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  13. Einthoven,Pieter G.; Morse,Channing S., Constant vertical state maintaining cueing system.
  14. Einthoven,Pieter G.; Morse,Channing S., Constant vertical state maintaining cueing system.
  15. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  16. Strid, Eric; Campbell, Richard, Differential signal probing system.
  17. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  18. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  19. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  20. Zenon Szulyk ; Brian Dyra ; Alex Makhlin, Dual input servo coupled control sticks.
  21. Wilson Edward,GBX, Electronic control apparatus.
  22. Boloorchi, Farhad; Martens, John D.; Boswell, Karen A., Feel control for active steering.
  23. McCormick, Patrick J.; Huynh, Neal V.; Overton, Timothy G.; Marx, Alan, Hydraulic system and method for an aircraft flight control system.
  24. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  25. Gulati, Navneet; Wu, Duqiang; Singh, Aditya, Joystick with improved control for work vehicles.
  26. Krause Kenneth W., Method and apparatus for automatically controlling and scaling motor velocity.
  27. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  28. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  29. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  30. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  31. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  32. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  33. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Probe for testing a device under test.
  34. Schwindt,Randy, Probe holder for testing of a test device.
  35. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  36. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  37. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  38. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  39. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  40. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  41. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  42. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  43. Einthoven, Pieter G.; Miller, David G., Split detent tactile cueing vehicle control system.
  44. Geary, Robert; Stevenson, Jason Marc, System and method for aircraft cabin atmospheric composition control.
  45. Hirvonen, Jukka Matti; Palfreyman, Gary, System and method for an integrated backup control system.
  46. Hirvonen, Jukka Matti; Palfreyman, Gary, System and method for an integrated backup control system.
  47. Andrews, Peter; Hess, David, System for testing semiconductors.
  48. Campbell, Richard, Test structure and probe for differential signals.
  49. Campbell,Richard, Test structure and probe for differential signals.
  50. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  51. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  52. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  53. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  54. Campbell, Richard, Wideband active-passive differential signal probe.
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