[특허]Bayesian sequential indicator simulation of lithology from seismic data

Bayesian sequential indicator simulation of lithology from seismic data 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01V-001/40 G01V-001/34 G06K-009/68
출원번호	US-0218668 (1994-03-25)
발명자 / 주소	Doyen Philippe M. (Thames Ditton GB2) Psaila David E. (Heston GB2)
출원인 / 주소	Western Atlas International, Inc. (02)
인용정보	피인용 횟수 : 51 인용 특허 : 0

초록 ▼

A discretized lithologic model of the subsurface is defined by a regular array of pixels. Each pixel corresponds to one of a finite number of possible lithoclasses such as sand, shale or dolomite. The lithoclasses are unknown except at a small number of sparsely distributed control pixels associated with borehole locations. Associated with each pixel there is a multivariate record of seismic attributes that may be statistically correlatable with the local lithology. A Monte Carlo method is used to simulate the lithoclass spatial distribution by combining the lithologic data at control pixels with the seismic-attribute data records. Using Indicator Kriging, a prior probability distribution of the lithoclasses is calculated for each pixel from the lithology values at neighboring pixels. The likelihood of each lithoclass is also calculated in each pixel from the corresponding conditional probability distribution of seismic attributes. A posterior lithoclass probability distribution is obtained at each pixel by multiplying the prior distribution and the likelihood function. The posterior distributions are sampled pixel-by-pixel to generate equally probable models of the subsurface lithology.

대표청구항 ▼

A method for generating simulated models of discrete lithoclass values on a regular array of pixels by combining known lithologic data at a number of distributed control pixels corresponding to well locations, with seismic attributes gathered from stations associated with said pixels, comprising: (a) measuring petraphysical properties of a plurality of earth layers; (b) calculating the conditional probability distribution of the seismic attributes for each lithoclass; (c) randomly selecting an as-yet unsimulated pixel; (d) estimating a prior probability distribution function of the lithoclasses at the selected pixel by combining lithologic data at nearby control pixels; (e) calculating a likelihood function of the lithoclasses in said selected pixel from said lithoclass-conditional distribution of seismic attributes; (f) calculating a posterior probability distribution function for the lithoclasses in said selected pixel by combining said prior distribution function with said likelihood function; (g) drawing a simulated lithoclass value in said selected pixel by sampling at random from said posterior probability distribution function; (h) entering said simulated lithoclass value into said array as an additional control pixel; (i) repeating steps (b) through (g) until lithoclass values are simulated for all pixels of said array; (j) generating a lithological model of the earth\s subsurface.

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연합인증

Bayesian sequential indicator simulation of lithology from seismic data 원문보기

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Bayesian sequential indicator simulation of lithology from seismic data 원문보기

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