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Test strip analysis system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/01
출원번호 US-0219479 (1994-03-29)
우선권정보 DE-4310583 (1993-03-31)
발명자 / 주소
  • Hnes Joachim (Zwingenberg DEX) Unkrig Volker (Ladenburg DEX) Steeg Klaus-Dieter (Kronau DEX)
출원인 / 주소
  • Boehringer Mannheim GmbH (Mannheim DEX 03)
인용정보 피인용 횟수 : 144  인용 특허 : 0

초록

Test strip analysis system includes an analysis apparatus with a test strip holding device (3) and matching test strips. The test strip holding device (3) serves to position the test strip (4) in a defined position relative to a measuring unit (11). It includes a test strip seating device (20) and a

대표청구항

A test strip analysis system, comprising: at least one test strip, said at least one test strip including a front end, a handling end, and a test field area disposed between the handling end and the front end, said test field area including at least one test field thereupon, said test strip also hav

이 특허를 인용한 특허 (144)

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