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Fault-tolerant waferscale integrated circuit device and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04B-017/00
출원번호 US-0017519 (1993-02-12)
발명자 / 주소
  • Gilson Kent L. (Salt Lake City UT)
출원인 / 주소
  • Metalithic Systems, Inc. (Sandy UT 02)
인용정보 피인용 횟수 : 99  인용 특허 : 0

초록

A fault tolerant IC device is made from a wafer of field programmable gate arrays (FGPA\s). Each FGPA is first tested and a wafer map of defective FGPA locations is recorded. A hardware description defines desired circuit operation either via a schematic or a functional description such as a equatio

대표청구항

A method for providing a fault-tolerant integrated circuit device including the steps of: providing a wafer having a plurality of configurable gate arrays each having a plurality of programmable input/output (I/O) blocks, a plurality of programmable logic blocks, a plurality of programmable routing

이 특허를 인용한 특허 (99)

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