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11. Eryurek, Evren; Kavaklioglu, Kadir, Control system using process model.

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12. Eryurek,Evren; Schleiss,Trevor D., Creation and display of indices within a process plant.

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13. Kellams James ; Morsut Luigi,ITX ; Michelon Giovanni,ITX, Custom quality control monitoring of a steel making process.

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14. Cheng, Ying-Chou; Liu, Ru-Gun; Feng, Josh J. H.; Ou, Tsong-Hua; Lo, Luke; Lai, Chih-Ming; Huang, Wen-Chun, Customized patterning modulation and optimization.

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15. Eryurek,Evren; Schleiss,Trevor D.; Harris,Stuart, Data sharing in a process plant.

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16. Beauchesne Robert C., Database manufacturing process management system.

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17. Longsdorf, Randy J.; Nelson, Scott D.; Davis, Dale S.; Nelson, Richard L.; Johnson, Amy K.; Brown, Gregory C., Dedicated process diagnostic device.

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18. Rud, Jason H., Degrading sensor detection implemented within a transmitter.

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19. Eryurek Evren ; Warrior Jogesh, Device in a process system for detecting events.

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20. Evren Eryurek ; Jogesh Warrior, Device in a process system for detecting events.

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21. Eryurek, Evren; Warrior, Jogesh, Device in a process system for determining statistical parameter.

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22. Eryurek Evren, Device in a process system for validating a control signal from a field device.

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23. Schleiss, Trevor D.; Nixon, Mark; Blevins, Terrence Lynn; Brase, Todd B.; Ganesamoorthi, Suresh, Diagnostic expert in a process control system.

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24. Eryurek, Evren; Esboldt, Steven R.; Rome, Gregory H., Diagnostics for resistive elements of process devices.

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25. Schleiss Trevor D. ; Wojsznis Wilhelm K. ; Blevins Terrence L., Diagnostics in a process control system.

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26. Schleiss, Trevor D.; Wojsznis, Wilhelm K.; Blevins, Terrence L., Diagnostics in a process control system.

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28. Brown, Gregory C.; Schumacher, Mark S., Diagnostics of impulse piping in an industrial process.

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29. Schoch, Daniel A.; Broek, Titus, Displacement based dynamic load monitor.

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30. Keyes, IV, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.

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31. Keyes, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.

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32. Ou, Tsong-Hua; Cheng, Ying-Chou; Lin, Chia-Chi; Liu, Ru-Gun; Lai, Chih-Ming; Wu, Min-Hong; Doong, Yih-Yuh; Hou, Cliff; Ku, Yao-Ching, Electrical parameter extraction for integrated circuit design.

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33. Coursolle, Thomas P.; Wehrs, David L., Electrode leakage diagnostics in a magnetic flow meter.

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34. Rome, Gregory H.; Eryurek, Evren; Kavaklioglu, Kadir, Electronics board life prediction of microprocessor-based transmitters.

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35. Eryurek, Evren; Ramachandran, Ram; Scott, Cindy Alsup; Schleiss, Trevor Duncan, Enhanced fieldbus device alerts in a process control system.

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36. William R. Kirkpatrick ; Eric D. Rotvold, Error compensation for a process fluid temperature transmitter.

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37. Huisenga, Garrie D.; Lewis, Richard A.; Lattimer, Donald R., Field device for digital process control loop diagnostics.

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38. Miller, John Philip, Field device with capability of calculating digital filter coefficients.

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39. Eryurek, Evren; Kavaklioglu, Kadir, Flow diagnostic system.

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40. Wehrs, David L.; Eryurek, Evren, Flow measurement diagnostics.

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41. Eryurek, Evren; Kavaklioglu, Kadir, Flow measurement with diagnostics.

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42. Alford, Jr.,Jack Allen; Beesley,James Bruce; Nasypany,Stephen Raymond, Graphical user interface for visualization of sampled data compared to entitled or reference levels.

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43. Lev Ami,Uzi; Sifnatsch,Guenter; Attwood,Mark, Graphical user interface with process quality indicator.

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44. Borgeson, Dale W.; DelaCruz, Moises A., Hand held diagnostic and communication device with automatic bus detection.

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45. Eryurek, Evren; Gao, Rong; Tsoukalas, Lefteri H., High accuracy signal processing for magnetic flowmeter.

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46. Elke, Anthony Michael, Industrial process temperature transmitter with sensor stress diagnostics.

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47. Hoppes,Vern Richard; Kriener,Larry Linn; Pipho,Matthew Jon; Edgin,Joshua Mark; Mitchell,James Anthony; Shehata,Ibrahim Hussein; Rath,Anthony Nate; Mills,Robert Joseph; Osborn,Michael Eugene; Smith,Ma, Infinitely variable, order specific, holistic assembly process control system.

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49. Hoppes,Vern Richard; Kriener,Larry Linn; Pipho,Matthew Jon; Edgin,Joshua Mark; Mitchell,James Anthony; Shehata,Ibrahim Hussein; Rath,Anthony Nate; Mills,Robert Joseph; Osborn,Michael Eugene; Smith,Ma, Infinitely variable, order specific, holistic assembly process control system.

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50. Hoppes,Vern Richard; Kriener,Larry Linn; Pipho,Matthew Jon; Edgin,Joshua Mark; Mitchell,James Anthony; Shehata,Ibrahim Hussein; Rath,Anthony Nate; Mills,Robert Joseph; Osborn,Michael Eugene; Smith,Ma, Infinitely variable, order specific, holistic assembly process control system.

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53. Eryurek, Evren; Harris, Stuart Andrew; Hokeness, Scott Nels; Marschall, Lester David, Integrated device alerts in a process control system.

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54. Lin Lawrence I-kuei, Inter-laboratory performance monitoring system.

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55. Hinkle Allen J., Interactive health care system and method.

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56. Oren, Avraham; Hartman, Yehuda; Fisher, Yossi, Knowledge tree medical enablement.

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57. Goldman, Arnold J.; Fisher, Joseph; Hartman, Jehuda; Sarel, Shlomo, Knowledge-engineering protocol-suite.

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58. Evren Eryurek, Low power two-wire self validating temperature transmitter.

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59. Schulz, Robert K., Magnetic flow meter with reference electrode.

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60. Graber, William F.; Foss, Scot R.; Schulz, Robert K., Magnetic flowmeter with verification.

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61. Inada Masayoshi,JPX, Manufacturing process change control apparatus and manufacturing process change control method.

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62. Radjy, Farrokh F., Measuring device, systems, and methods for obtaining data relating to condition and performance of concrete mixtures.

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63. Francino, Peter N.; Cheng, Xu, Method and apparatus for controlling soot blowing using statistical process control.

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64. Francino, Peter N.; Cheng, Xu; Huff, Frederick C., Method and apparatus for generalized performance evaluation of equipment using achievable performance derived from statistics and real-time data.

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65. Seevers, Stanley W.; Hughes, Guy R.; Robinson, Frank A., Method and apparatus for measuring a variable in a lubricant/coolant system.

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66. Armstrong, Steve; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for monitoring and performing corrective measures in a process plant using monitoring data with corrective measures data.

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67. Brook Richard Morley,GBX ; Bullivant Christopher Bernard,GBX, Method and apparatus for monitoring the processing of articles.

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68. Nixon,Mark J.; Keyes, IV,Marion A.; Schleiss,Trevor D.; Gudaz,John A.; Blevins,Terrence L., Method and apparatus for performing a function in a plant using process performance monitoring with process equipment monitoring and control.

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69. Armstrong, Stephen; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for performing a function in a process plant using monitoring data with criticality evaluation data.

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70. Halverson Galen Dean ; Chou Youn-Min, Method and apparatus for statistical process control of machines and processes having non-constant mean of a response va.

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71. Steffey, Kenneth; Schenck, Tom; Perreault, Dan; Atwell, Paul, Method and system for assisting a user taking measurements using a coordinate measurement machine.

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72. Walter, Joshua A.H.; Gravis, Michael J.; Apps, Charles David, Method and system for controlling the quality of a stamped part.

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73. Mangrulkar Suresh M. (Farmington Hills MI), Method and system for real-time statistical process monitoring.

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74. Goldman, Arnold J.; Hartman, Jehuda; Fisher, Joseph; Sarel, Shlomo, Method and tool for data mining in automatic decision making systems.

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75. Atchison Nick ; Ross Ron, Method for analyzing probe yield sensitivities to IC design.

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76. Jerome M. Kurtzberg ; Menachem Levanoni, Method for controlling a manufacturing process utilizing control charts with specified confidence intervals.

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77. Hartman,Jehuda; Yulevitch,Oren; Brill,Eyal, Method for dynamically targeting a batch process.

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78. Goldman, Arnold J.; Hartman, Jehuda; Fisher, Joseph; Sarel, Shlomo, Method for global automated process control.

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79. Brown,Peter G., Method for scheduling solution preparation in biopharmaceutical batch process manufacturing.

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80. Cheng, Ying-Chou; Lai, Chih-Ming; Liu, Ru-Gun; Ou, Tsong-Hua; Wu, Min-Hong; Doong, Yih-Yuh; Chao, Hsiao-Shu; Cheng, Yi-Kan; Ku, Yao-Ching; Hou, Cliff, Method for shape and timing equivalent dimension extraction.

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81. Atchison Nick ; Ross Ron, Method for the calculation of wafer probe yield limits from in-line defect monitor data.

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82. Nick Atchison ; Ron Ross, Method of a comprehensive sequential analysis of the yield losses of semiconductor wafers.

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83. Tanaka Masayuki,JPX ; Ogawa Katsuyuki,JPX, Method of and apparatus for extracting abnormal factors in a processing operation.

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84. Togashi Takako (Yamagata JPX) Muraoka Yukihiro (Yamagata JPX), Method of management of a production line and a system for use in the management.

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85. Engell, Torgrim; Grigg, Julian; Gausemel, Ingvil; Dyrstad, Knut; Shales, Jonathan R., Method of operating an automated radiopharmaceutical synthesizer.

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86. Lin, Chun-Hsien; Wang, Amy; Ko, Francis; Wang, Jean, Methodology to enable wafer result prediction of semiconductor wafer batch processing equipment.

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87. Havekost,Robert B.; Jundt,Larry Oscar; Faltesek,Roy; Nadas,Ian James, Methods and apparatus for integrated display of process events and trend data.

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88. Liu, Ru-Gun; Lai, Chih-Ming; Huang, Wen-Chun; Luo, Boren; Shin, I-Chang; Ku, Yao-Ching; Hou, Cliff, Model import for electronic design automation.

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89. Liu, Ru-Gun; Lai, Chih-Ming; Huang, Wen-Chun; Luo, Boren; Shin, I-Chang; Ku, Yao-Ching; Hou, Cliff, Model import for electronic design automation.

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90. Goldman,Arnold; Sarel,Shlomo; Hartman,Yehuda; Fisher,Yossi, Model predictive control (MPC) system using DOE based model.

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91. Brichta Harriet E., Monitoring of service delivery or product manufacturing.

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92. Russell, III, Alden C.; Harris, Stuart A.; Peluso, Marcos; Borgeson, Dale W., Multi-protocol field device interface with automatic bus detection.

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93. Potyrailo, Radislav Alexandrovich, Multivariate statistical process analysis systems and methods for the production of melt polycarbonate.

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94. Cheng, Ying-Chou; Ou, Tsong-Hua; Feng, Josh J. H.; Tsai, Cheng-Lung; Liu, Ru-Gun; Huang, Wen-Chun, Practical approach to layout migration.

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95. Eryurek, Evren; Lenz, Gary A.; Kavaklioglu, Kadir, Prediction of error magnitude in a pressure transmitter.

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96. Eryurek,Evren; Kavaklioglu,Kadir, Pressure transmitter with diagnostics.

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97. Lenz, Gary A., Printer with a process diagnostics system for detecting events.

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98. Bett Thomas Arthur ; Ungpiyakul Tanakon ; Arseneau Gerald Bernard, Process control using multiple detections.

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99. Eryurek, Evren; Kavaklioglu, Kadir; Esboldt, Steven R., Process device diagnostics using process variable sensor signal.

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100. Eryurek,Evren; Kavaklioglu,Kadir; Esboldt,Steven R., Process device diagnostics using process variable sensor signal.

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101. Huisenga,Garrie D.; Longsdorf,Randy J., Process device with quiescent current diagnostics.

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102. Longsdorf, Randy J.; Blumeyer, Chad C., Process device with vibration based diagnostics.

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103. Brown,Gregory C.; Peluso,Marcos; Karschnia,Robert J., Process diagnostics.

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104. Li Hung-Yeh,TWX, Process monitoring system for real time statistical process control.

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105. Rud, Jason Harold; Engelstad, Loren Michael, Process variable measurement noise diagnostic.

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106. Rud, Jason H., Process variable transmitter with EMF detection and correction.

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107. Sittler, Fred C.; Hedtke, Robert C., Process variable transmitter with acceleration sensor.

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108. Bender, Christoph, Processing device, measuring device, and correcting device for the manufacture of products.

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109. Oechsner, Richard; Tschaftary, Thomas; Strzyzewski, Poitr; Pfitzner, Lothar; Schneider, Claus; Hennig, Peter, Quality surveillance of a production process.

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110. Evren Eryurek ; Jogesh Warrior ; Andrew T. Patten, Resistance based process control device diagnostics.

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111. Evren Eryurek ; Steven R. Esboldt ; Gregory H. Rome, Resistance based process control device diagnostics.

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112. Eryurek, Evren; Esboldt, Steven R., Resistive element diagnostics for process devices.

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113. Eryurek,Evren; Kavaklioglu,Kadir, Root cause diagnostics.

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114. Miller, John P.; Eryurek, Evren, Rule set for root cause diagnostics.

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115. Nakamoto, Shigeru; Kondo, Hideaki; Arima, Juntaro, Semiconductor manufacturing apparatus and its diagnosis apparatus and operating system.

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116. Nakamoto,Shigeru; Kondo,Hideaki; Arima,Juntaro, Semiconductor manufacturing apparatus and its diagnosis apparatus and operating system.

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117. Eryurek Evren, Signal processing technique which separates signal components in a sensor for sensor diagnostics.

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118. Miller, John P., Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.

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119. Miller, John Philip, Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.

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120. Donald E. Nice ; Richard T. Kidwell, Snap-disk formation process and machine.

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121. Balentine, James R.; Dicaire, Andre A.; Scott, Cindy A.; Lattimer, Donald Robert; Schibler, Kenneth; Shepard, John R.; Jundt, Larry O., Software lockout coordination between a process control system and an asset management system.

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122. Hardikar, Manoj; Zhou, Steve; Shiflett, Richard; Kulkarni, Ashok, Software system and method for graphically building customized recipe flowcharts.

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123. Wehrs, David L., Spectral diagnostics in a magnetic flow meter.

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124. Goldman,Arnold J.; Fisher,Joseph; Hartman,Jehuda; Sarel,Shlomo, Strategic method for process control.

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125. Wang, Chi-Chih; He, Bing-Yu; Song, Yong-Hua, System and method for controlling product quality.

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126. Goldman, Arnold J.; Hartman, Jehuda; Fisher, Joseph; Sarel, Shlomo, System and method for monitoring process quality control.

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127. O'Brien, Kenneth, System and method for online scheduling and shift management.

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128. Brown, Peter G., System and method for simulation and modeling of batch process manufacturing facilities using process time lines.

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129. Brown Peter G., System and method for simulation and modeling of biopharmaceutical batch process manufacturing facilities.

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130. Brown,Peter G, System and method for simulation and modeling of manufacturing facilities using process time lines.

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131. Brown Peter G., System and method for simulation, modeling and scheduling of equipment maintenance and calibration in biopharmaceutical batch process manufacturing facilities.

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132. Wagner Glenn W., System for establishing optimal critical characteristics of manufactured products.

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133. Damon Tim ; Holden Blane ; Adsitt Matt ; Dean Dan ; Pearson Mike, System for evaluating and reporting semiconductor test processes.

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134. Damon Tim ; Holden Blane ; Adsitt Matt ; Dean Dan ; Pearson Mike, System for evaluating and reporting semiconductor test processes.

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135. Lin, Chun-Hsien; Ko, Francis; Zuo, Kewei; Lo, Henry; Wang, Jean, System for extraction of key process parameters from fault detection classification to enable wafer prediction.

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136. Eryurek, Evren; Westbrock, Jon, System for preserving and displaying process control data associated with an abnormal situation.

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137. Radjy, Farrokh F., Systems, methods and apparatus for providing comparative statistical information for a plurality of production facilities in a closed-loop production management system.

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138. Radjy, Farrokh F.; Radjy, Anousha, Systems, methods and apparatus for providing comparative statistical information in a graphical format for a plurality of markets using a closed-loop production management system.

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139. Lawrence, David E., Systems, methods and computer program products for constructing sampling plans for items that are manufactured.

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140. Lawrence, David E., Systems, methods and computer program products for constructing sampling plans for items that are manufactured.

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141. Hou, Yung-Chin; Cheng, Ying-Chou; Liu, Ru-Gun; Lai, Chih-Ming; Cheng, Yi-Kan; Lin, Chung-Kai; Chao, Hsiao-Shu; Yeh, Ping-Heng; Wu, Min-Hong; Ku, Yao-Ching; Ou, Tsong-Hua, Table-based DFM for accurate post-layout analysis.

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142. Hou, Yung-Chin; Cheng, Ying-Chou; Liu, Ru-Gun; Lai, Chih-Ming; Cheng, Yi-Kan; Lin, Chung-Kai; Chao, Hsiao-Shu; Yeh, Ping-Heng; Wu, Min-Hong; Ku, Yao-Ching; Ou, Tsong-Hua, Table-based DFM for accurate post-layout analysis.

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143. Eryurek Evren ; Warrior Jogesh ; Esboldt Steven R., Transmitter with software for determining when to initiate diagnostics.

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144. Eryurek, Evren; Warrior, Jogesh; Esboldt, Steven R., Transmitter with software for determining when to initiate diagnostics.

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145. Kirkpatrick, William R.; Goetzinger, Charles E., Two-wire fluid temperature transmitter with thermocouple diagnostics.

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146. Huisenga,Garrie D.; Longsdorf,Randy J.; Lattimer,Donald R., Two-wire process control loop diagnostics.

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147. Cheng, Xu; Huff, Frederick C.; Francino, Peter N.; Swirski, Konrad, Use of statistical analysis in power plant performance monitoring.

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148. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.

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149. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.

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