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Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff fre 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-022/04
  • G01R-027/04
출원번호 US-0045854 (1993-04-09)
발명자 / 주소
  • Jean Buford R. (Round Rock TX) Warren Gary L. (Austin TX) Whitehead F. Lynn (Austin TX)
출원인 / 주소
  • Thermedics Inc. (Woburn MA 02)
인용정보 피인용 횟수 : 34  인용 특허 : 0

초록

The present invention provides an apparatus and method for the measurement of, for example, the moisture in a material or, more generally, for the measurement of any material parameter which may be inferred by measuring the electromagnetic properties of the material under investigation. The electrom

대표청구항

A method for the measurement of a parameter of a material which may be determined by measuring the electromagnetic properties of the material under investigation comprising the steps of: (a) causing a material to pass through a frequency sensitive measurement cell having a known cutoff frequency res

이 특허를 인용한 특허 (34)

  1. Sherel F. Nutt, Antenna mounting assembly for a guided-microwave spectrometer.
  2. Richardson, Jr.,Robert E.; Lopez,Arturo M., Device to detect and measure the concentration and characterization of airborne conductive or dielectric particles.
  3. Tonn,David A., Evanescent waveguide apparatus and method for measurement of dielectric constant.
  4. Butler, Darrel Thomas; Erb, Tom Lee, Guided wave cutoff spectroscopy using a cylindrical measurement cell.
  5. Butler, Darrel Thomas; Erb, Tom Lee, Guided wave cutoff spectroscopy using a cylindrical measurement cell.
  6. Carr, Kenneth L.; Allison, Robert C., Low profile temperature transducer.
  7. Troxler, Robert Ernest; Dep, Wewage Hiran Linus, Material property gauges and methods for determining a property of a material.
  8. Troxler, Robert Ernest; Dep, Wewage Hiran Linus, Material property gauges and related methods for determining a property of a material.
  9. Wardwell Peter ; Leung Wallace, Method and apparatus for controlling and monitoring continuous feed centrifuge.
  10. Wardwell Peter ; Leung Wallace ; Hales Lynn, Method and apparatus for controlling and monitoring continuous feed centrifuge.
  11. Wee, Arnstein; Skjaeldal, Ingve Morten, Method and apparatus for measurement of composition and flow rates of a wet gas.
  12. Kondo, Takashi; Takigawa, Kazuhiro; Kamba, Seiji; Fukasawa, Ryoichi; Ikari, Tomofumi, Method and apparatus for measuring characteristics of object.
  13. Wee, Arnstein, Method and apparatus for measuring the composition and water salinity of a multiphase mixture containing water.
  14. Wee, Arnstein, Method and apparatus for measuring the conductivity of the water fraction of a wet gas.
  15. Livneh, Ben Zion, Method and apparatus for storing power from irregular and poorly controlled power sources.
  16. Wee, Arnstein; Skjaeldal, Ingve Morten, Method and apparatus for tomographic multiphase flow measurements.
  17. Wee, Arnstein; Skjaeldal, Ingve Morten, Method and apparatus for wet gas flow measurements and measurement of gas properties.
  18. Pekka Jakkula FI; Esko Tahkola FI; Timo Manninen FI, Method and arrangement for measuring fluid.
  19. Rolf Joss CH; Paul Geiter CH, Method and device for determining proportions of solid matter in a test material.
  20. Fujiwara,Masahiro, Method of measuring in-medium dielectric constant for electromagnetic prober, and electromagnetic prober.
  21. Fujiwara,Masahiro, Method of measuring in-medium dielectric constant for electromagnetic prober, and electromagnetic prober.
  22. Ehata,Katsufumi, Method of measuring relative dielectric constant of dielectric substance of powders, cavity resonator used in the same, and application apparatus.
  23. Sears, Steve E.; Palmer, Larry, Methods and apparatus for electromagnetic processing of phyllosilicate minerals.
  24. Troxler, Robert Ernest; Dep, Wewage Hiran Linus, Methods material property gauges for measuring the density of material including a moisture property apparatus.
  25. Peters,Steffen; Kn철chel,Reinhard; Taute,Wolfgang; D철scher,Claas, Microwave sensor for measuring a dielectric property of a product.
  26. Herrmann Rainer,DEX, Moisture and density sensor.
  27. Tubel, Paulo; Bidigare, Brian; Johnson, Michael; Harrell, John; Voll, Benn, Monitoring of downhole parameters and tools utilizing fiber optics.
  28. Tingley, Robert, Non-invasive pipe inspection system.
  29. Tingley, Robert; Brancart, Claude P., Non-invasive pipeline inspection system.
  30. Troxler, Robert Ernest; Dep, Wewage Hiran Linus, Nuclear density gauges including a material property function for measuring a construction material.
  31. Joshi Kalpana Keshav,INX, Process and instrument for moisture measurement.
  32. Breimon, Scott Richard, Sanitary clean in place microwave probe and sealing gasket assembly.
  33. Erb, Tom Lee, Signal processing in guided wave cutoff spectroscopy.
  34. Fujiwara,Masahiro, Specific dielectric constant calibration method for an electromagnetic prober.
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