이 특허를 인용한 특허 (43)

1. Ish-Shalom Yaron,ILX ; Baharav Yael, Active pyrometry with emissivity extrapolation and compensation.

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2. Stein Alexander (Secaucus NJ), Apparatus for measuring the emissivity of a semiconductor wafer.

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3. Camm,David Malcolm; Bumbulovic,Mladen; Cibere,Joseph; Elliott,J. Kiefer; McCoy,Steve; Stuart,Greg, Apparatuses and methods for suppressing thermally-induced motion of a workpiece.

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4. Bevan,Edward James; Briggs,Max Michael; DiDomenico,John; Gedridge, Jr.,Robert W., Compact emissivity and temperature measuring infrared detector.

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5. Ernst, Holger; Femmer, Uwe; Heitmann, Sonja; Kruempelmann, Thomas, Control method for a cooktop and cooktop for carrying out said method.

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6. Trent, Randall L.; Wageneck, Robert O.; Mazzetta, Jason A; Scopatz, Stephen D., Fused test source.

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7. Berson,William, Information encoding on surfaces by varying spectral emissivity.

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8. Berson,William, Information encoding on surfaces by varying spectral emissivity.

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9. Berson, William, Label for receiving indicia having variable spectral emissivity values.

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10. Berson, William, Label for receiving indicia having variable spectral emissivity values.

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11. Berson, William, Label for receiving indicia having variable spectral emissivity values.

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12. Berson,William, Label for receiving indicia having variable spectral emissivity values.

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13. Rowland, Daniel Vincent, Low temperature cobalt silicidation process monitor.

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14. Laurent Legrandjacques FR; Christophe Dehan FR; Jean-Claude Krapez FR; Francois Le Poutre FR, Method and device for the inspection of a material by thermal imaging.

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15. Paranjpe Ajit P. (Plano TX), Method for temperature measurement in rapid thermal process systems.

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16. Laurent Legrandjacques FR; Christophe Dehan FR; Jean-Claude Krapez FR; Francois Le Poutre FR, Method for the inspection of a part by thermal imaging.

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17. Camm, David Malcolm; Sempere, Guillaume; Kaludjercic, Ljubomir; Stuart, Gregory; Bumbulovic, Mladen; Tran, Tim; Dets, Sergiy; Komasa, Tony; Rudolph, Marc; Cibere, Joseph, Methods and systems for supporting a workpiece and for heat-treating the workpiece.

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18. Camm, David Malcolm; Sempere, Guillaume; Kaludjercic, Ljubomir; Stuart, Gregory; Bumbulovic, Mladen; Tran, Tim; Dets, Sergiy; Komasa, Tony; Rudolph, Marc; Cibere, Joseph, Methods and systems for supporting a workpiece and for heat-treating the workpiece.

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19. Blakeley, III,Gerald W., Multimeter with non-contact temperature measurement.

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20. Blakeley, III,Gerald W., Multimeter with non-contact temperature measurement.

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21. Adams,Bruce E.; Jennings,Dean; Hunter,Aaron M.; Mayur,Abhilash J.; Parihar,Vijay; Thomas,Timothy N., Multiple band pass filtering for pyrometry in laser based annealing systems.

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22. Cabib Dario,ILX ; Buckwald Robert A.,ILX ; Adel Michael E.,ILX, Multipoint temperature monitoring apparatus for semiconductor wafers during processing.

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23. Shigeura, John, Non-contact radiant heating and temperature sensing device for a chemical reaction chamber.

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24. Shigeura, John S.; Shigeura, Janice G., Non-contact radiant heating and temperature sensing device for a chemical reaction chamber.

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25. Shigeura, John; Shigeura, legal representative, Janice G., Non-contact radiant heating and temperature sensing device for a chemical reaction chamber.

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26. Shigeura, deceased,John, Non-contact radiant heating and temperature sensing device for a chemical reaction chamber.

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27. Shigeura, deceased,John, Non-contact radiant heating and temperature sensing device for a chemical reaction chamber.

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28. Berson, William, Printing system ribbon including print transferable circuitry and elements.

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29. Kobrich Holger,DEX, Process and device for in-service measurement of temperature in at least one cooking zone of a cooking area with a glass ceramic plate.

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30. Berson, William, Radio frequency identification labels.

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31. Berson, William, Radio frequency identification labels and systems and methods for making the same.

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32. Berson, William, Radio frequency identification labels and systems and methods for making the same.

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33. Jones, Mike N.; Nguyen, Evans H.; Bublitz, Scott D.; Crowe, Jason R., Slidably attachable non-contact voltage detector.

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34. Camm David Malcolm,CAX ; Lefrancois Marcel Edmond,CAX ; Hickson Brendon James,CAX, Spatially resolved temperature measurement and irradiance control.

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35. Camm, David Malcolm; Lefrancois, Marcel Edmond; Hickson, Brendon James, Spatially resolved temperature measurement and irradiance control.

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36. Berson, William, Systems and methods for reading indicium.

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37. Berson, William, Systems and methods for reading indicium.

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38. Camm, David Malcolm; Cibere, Joseph; Bumbulovic, Mladen, Systems and methods for supporting a workpiece during heat-treating.

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39. Donovan, David H., Temperature determination based on emissivity.

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40. Camm,David M.; Kervin,Shawna; Lefrancois,Marcel Edmond; Stuart,Greg, Temperature measurement and heat-treating methods and system.

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41. Camm, David M.; Kervin, Shawna; Lefrancois, Marcel Edmond; Stuart, Greg, Temperature measurement and heat-treating methods and systems.

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42. Yamamoto, Setsu; Miura, Takahiro; Hoshi, Takeshi; Ogawa, Tsuyoshi; Fujita, Yoshihiro; Hirano, Shozo; Watanabe, Kazumi; Nagai, Satoshi; Yoshida, Masahiro; Asai, Satoru; Ochiai, Makoto; Semboshi, Jun, Welding inspection method and apparatus thereof.

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43. Camm, David Malcolm; Cibere, Joseph; Stuart, Greg; McCoy, Steve, Workpiece breakage prevention method and apparatus.

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