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13. Hunt, John Andrew; Coyle, Steven Thomas; Hassel-Shearer, Michael Patrick, Ion beam sample preparation apparatus and methods.

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14. Coyle, Steven Thomas; Hunt, John Andrew, Ion beam sample preparation thermal management apparatus and methods.

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15. Coyle, Steven Thomas; Hunt, John Andrew, Ion beam sample preparation thermal management apparatus and methods.

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16. Adams, Robbie, Ion fusion formation.

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17. Robinson, Joseph C., Method and apparatus for in situ preparation of serial planar surfaces for microscopy.

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19. Robinson, Joseph C., Method and apparatus for preparing serial planar cross sections.

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20. Moore, Thomas M.; Amador, Gonzalo, Method and apparatus for transfer of samples in a controlled environment.

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21. Grünewald, Wolfgang; Vogt, Alex; Gabathuler, Alexander, Method for the production of a sample for electron microscopy.

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22. Veerasamy, Vijayen S.; Petrmichl, Rudolph Hugo, Method of ion beam milling a glass substrate prior to depositing a coating system thereon, and corresponding system for carrying out the same.

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23. Vijayen S. Veerasamy ; Rudolph Hugo Petrmichl, Method of ion beam milling substrate prior to depositing diamond like carbon layer thereon.

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25. Moran, Timothy J., Method of pole tip sample preparation using FIB.

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26. LeVan Dien ; Miller Robert Dennis ; Nazzal Adel Issa ; Ting Andrew Chiuyan, Planarization process and apparatus for the etch definition of magnetic head air bearing surfaces.

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27. Washino,Ryu; Sakuma,Yasushi; Mukaikubo,Masaru; Harpreet Singh,Hura; Uchida,Kenji, Polishing method for semiconductor substrate, and polishing jig used therein.

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28. Lechner, Lorenz; Kaiser, Ute; Biskupek, Johannes, TEM-lamella, process for its manufacture, and apparatus for executing the process.

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