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Device and method for inspection of baggage and other objects 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-023/02
출원번호 US-0165737 (1993-12-10)
발명자 / 주소
  • Krug Kristoph D. (Framingham MA) Stein Jay A. (Framingham MA) Taylor Adam L. (Boston MA)
출원인 / 주소
  • Vivid Technologies, Inc. (Waltham MA 02)
인용정보 피인용 횟수 : 156  인용 특허 : 0

초록 ▼

A device and method is provided for finding a specific material superimposed on an unknown background when the locations of the specific material and the background are unknown, for example, inside an item of baggage. The invention comprises exposing an area of an item to be inspected to x-rays of t

대표청구항 ▼

A method of detecting a target object of a specific material of interest in a continuously moving ensemble of initially unidentified objects, comprising: providing a stationary X-ray exposure system, a stationary X-ray detection system, and a computer operatively connected to said detection system,

이 특허를 인용한 특허 (156)

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AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

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