$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Implementation of redundancy on a programmable logic device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H03K-019/177
출원번호 US-0147601 (1993-11-04)
발명자 / 주소
  • Cliff Richard G. (Milpitas CA) Raman Rina (Fremont CA) Reddy Srinivas T. (Santa Clara CA)
출원인 / 주소
  • Altera Corporation (San Jose CA 02)
인용정보 피인용 횟수 : 81  인용 특허 : 0

초록

An improved architecture and method of operation for providing redundancy in programmable logic devices. Spare columns or rows of logic blocks 115 and switch boxes 140 are employed to replace columns or rows of logic blocks containing one or more defective logic blocks. Associated logic enable the d

대표청구항

A programmable logic device capable of remedying logic block defects, said programmable logic device comprising: a plurality of logic blocks disposed in an array format forming rows and columns, each block performing user-specified logic functions; a programmable interconnect for selectively connect

이 특허를 인용한 특허 (81)

  1. Chi, Shyh-An, 3D IC structure and method.
  2. Chi, Shyh-An, 3D IC structure and method.
  3. Vadi,Vasisht Mantra, Adjustable global tap voltage to improve memory cell yield.
  4. Carlson, David A., Apparatus and method for repairing logic blocks.
  5. Carlson,David A., Apparatus and method for repairing logic blocks.
  6. Trimberger,Steven M.; Bapat,Shekhar; Wells,Robert W.; Patrie,Robert D.; Lai,Andrew W., Application-specific methods for testing molectronic or nanoscale devices.
  7. Bapat,Shekhar; Wells,Robert W.; Patrie,Robert D.; Lai,Andrew W., Application-specific methods useful for testing look up tables in programmable logic devices.
  8. Wells, Robert W.; Ling, Zhi-Min; Patrie, Robert D.; Tong, Vincent L.; Cho, Jae; Toutounchi, Shahin, Application-specific testing methods for programmable logic devices.
  9. Wells, Robert W.; Ling, Zhi-Min; Patrie, Robert D.; Tong, Vincent L.; Cho, Jae; Toutounchi, Shahin, Application-specific testing methods for programmable logic devices.
  10. Koob, John Conrad; Sung, Raymond Jit-Hung; Brandon, Tyler Lee; Elliot, Duncan George, Arrayed processing element redundancy architecture.
  11. Blumberg,Marc R.; Kalscheur,Michael J.; Palitto,Matteo; Sturm,Douglas W.; Pranaitis, Jr.,William F., Back out provision for failed programmable hardware update.
  12. Trimberger,Stephen M.; Lesea,Austin H., FPGA with time-multiplexed interconnect.
  13. Marshall Alan,GBX ; Stansfield Anthony,GBX ; Vuillemin Jean,FRX, Field programmable processor arrays.
  14. Marshall Alan,GBX ; Stansfield Anthony,GBX ; Vuillemin Jean,FRX, Field programmable processor devices.
  15. Scotzniovsky, Stefan; Cory, Bruce; Young, Charles Chew-Yuen; Tamasi, Anthony M.; Van Dyke, James M.; Montrym, John S.; Treicher, Sean J., Functional component compensation reconfiguration system and method.
  16. How, Dana; D'Souza, Godfrey P.; Wing, Malcolm J.; Murphy, Colin N.; Jangity, Arun, High-bandwidth interconnect network for an integrated circuit.
  17. Marshall, Alan David; Stansfield, Anthony; Vuillemin, Jean, Implementation of multipliers in programmable arrays.
  18. Zhu, Timothy; Dunn, David; Spurlock, Randy; Spacie, Thomas, Input/output request packet handling techniques by a device specific kernel mode driver.
  19. Van Dyke, James M.; Montrym, John S.; Nagy, Michael B.; Treichler, Sean J., Integrated circuit configuration system and method.
  20. Chi, Shyh-An, Integrated circuit die stack.
  21. Krishna Rangasayee, Integrated circuit incorporating a programmable cross-bar switch.
  22. Rangasayee Krishna, Integrated circuit incorporating a programmable cross-bar switch.
  23. Guzman, Mario E.; Lane, Christopher F., Integrated circuit with redundancy.
  24. Ayodhyawasi, Manuj; Digari, Kailash, Interconnect structure and method in programmable devices.
  25. Duron, Mike Conrad; Faust, Robert Allan; Gray, Forrest Clifton; Mahajan, Ajay Kumar; Miles, Glenn Rueban, JTAGchain bus switching and configuring device.
  26. Duron,Mike Conrad; Faust,Robert Allan; Gray,Forrest Clifton; Mahajan,Ajay Kumar; Miles,Glenn Rueban, JTAGchain bus switching and configuring device.
  27. Aida, Nobuyoshi; Murakami, Hiroshi, Logic integrated circuit having dynamic substitution function, information processing apparatus using the same, and dynamic substitution method of logic integrated circuit.
  28. Ku, Ting Sheng; Newcomb, Russell; Wagner, Barry A.; Shaikh, Ashfaq R.; Simms, William B., Loopback configuration for bi-directional interfaces.
  29. Lane Christopher F. (Campbell CA) Reddy Srinivas T. (Santa Clara CA) Wang Bonnie I. (Cupertino CA), Means and apparatus to minimize the effects of silicon processing defects in programmable logic devices.
  30. Lane Christopher F. ; Reddy Srinivas T. ; Wang Bonnie I-Keh, Means and apparatus to minimize the effects of silicon processing defects in programmable logic devices.
  31. Hassoun,Marwan M.; Robinson,Moises E.; Tetzlaff,David E., Method and apparatus for a redundant transceiver architecture.
  32. Stansfield, Anthony; Marshall, Alan David; Vuillemin, Jean, Method and apparatus for providing instruction streams to a processing device.
  33. Stansfield, Anthony; Marshall, Alan David; Vuillemin, Jean, Method and apparatus for varying instruction streams provided to a processing device using masks.
  34. Danskin, John M.; Tamasi, Anthony Michael, Method and system for implementing fragment operation processing across a graphics bus interconnect.
  35. Acocella, Dominic; McDonald, Timothy J.; Gimby, Robert W.; Kong, Thomas H., Method and system for remapping processing elements in a pipeline of a graphics processing unit.
  36. Ling, Zhi-Min; Cho, Jae; Wells, Robert W.; Johnson, Clay S.; Davis, Shelly G., Method of using partially defective programmable logic devices.
  37. Trimberger,Stephen M., Methods and circuits for dedicating a programmable logic device for use with specific designs.
  38. Trimberger,Stephen M., Methods for using defective programmable logic devices by customizing designs based on recorded defects.
  39. Trimberger, Stephen M., Methods of enabling the use of a defective programmable device.
  40. Trimberger, Stephen M., Methods of enabling the validation of an integrated circuit adapted to receive one of a plurality of configuration bitstreams.
  41. Trimberger, Stephen M.; Ehteshami, Babak, Methods of using one of a plurality of configuration bitstreams for an integrated circuit.
  42. Wells,Robert W.; Patrie,Robert D.; DeBaets,Andrew J., Methods of utilizing programmable logic devices having localized defects in application-specific products.
  43. Diamond, Michael B., Micro electro mechanical switch system and method for testing and configuring semiconductor functional circuits.
  44. Trimberger, Stephen M., Multiple bitstreams enabling the use of partially defective programmable integrated circuits while avoiding localized defects therein.
  45. Trimberger,Stephen M., Multiple bitstreams enabling the use of partially defective programmable integrated circuits while avoiding localized defects therein.
  46. Nguyen,Truong T.; Dahablania,Atul; Matthey,Olivier; Gmuender,John, Network interface device having bypass capability.
  47. Chambers Peter ; Shelton Roger Lee, Patch mechanism for allowing dynamic modifications of the behavior of a state machine.
  48. Ward, Derek, Programmable controller for use with monitoring device.
  49. Ward, Derek, Programmable logic controller and related electronic devices.
  50. Rangasayee Krishna ; Bielby Robert N., Programmable logic device architecture incorporating a dedicated cross-bar switch.
  51. Reddy Srinivas T. ; Mejia Manuel ; Lee Andy L. ; Pedersen Bruce B., Programmable logic device with redundant circuitry.
  52. Srinivas T. Reddy ; Manuel Mejia ; Andy L. Lee ; Bruce B. Pedersen, Programmable logic device with redundant circuitry.
  53. Réblewski, Frédéric; LePape, Olivier V., Reconfigurable circuit with redundant reconfigurable cluster(s).
  54. Réblewski,Frédéric, Reconfigurable circuit with redundant reconfigurable cluster(s).
  55. Alan David Marshall GB; Anthony Stansfield GB; Jean Vuillemin FR, Reconfigurable processor devices.
  56. McClintock Cameron ; Lee Andy L. ; Cliff Richard G., Redundancy circuitry for logic circuits.
  57. McClintock Cameron ; Lee Andy L. ; Cliff Richard G., Redundancy circuitry for logic circuits.
  58. McClintock Cameron ; Lee Andy L. ; Cliff Richard G., Redundancy circuitry for logic circuits.
  59. David E. Jefferson ; Srinivas T. Reddy, Redundancy circuitry for programmable logic devices with interleaved input circuits.
  60. Jefferson David E. ; Reddy Srinivas T., Redundancy circuitry for programmable logic devices with interleaved input circuits.
  61. Jefferson David E. ; Reddy Srinivas T., Redundancy circuitry for programmable logic devices with interleaved input circuits.
  62. Ngai,Tony K.; Wong,Jennifer; Lowe,Wayson J., Self-repairing redundancy for memory blocks in programmable logic devices.
  63. Diamond, Michael B., Semiconductor die micro electro-mechanical switch management method.
  64. Diamond, Michael B., Semiconductor die micro electro-mechanical switch management system and method.
  65. Toshikazu Nakamura JP; Yoshinori Okajima JP; Hiroyuki Sugamoto JP, Semiconductor memory device with efficient redundancy operation.
  66. Rao, Hari; Nousias, Ioannis; Khawam, Sami, Serial configuration of a reconfigurable instruction cell array.
  67. Trimberger,Stephen M., Structures and methods of overcoming localized defects in programmable integrated circuits by routing during the programming thereof.
  68. Diamond, Michael B.; Montrym, John S.; Van Dyke, James M.; Nagy, Michael B.; Treichler, Sean J., System and method for configuring semiconductor functional circuits.
  69. Van Dyke, James M.; Montrym, John S.; Nagy, Michael B.; Treichler, Sean J., System and method for increasing die yield.
  70. Diamond, Michael B.; Montrym, John S.; Van Dyke, James M.; Nagy, Michael B.; Treichler, Sean J., System and method for remotely configuring semiconductor functional circuits.
  71. Diamond, Michael B., System and method for testing and configuring semiconductor functional circuits.
  72. James MacArthur ; Timothy Lacey, Techniques and circuits for high yield improvements in programmable devices using redundant logic.
  73. MacArthur James ; Lacey Timothy M., Techniques and circuits for high yield improvements in programmable devices using redundant logic.
  74. MacArthur James ; Lacey Timothy, Techniques and circuits for high yield improvements in programmable devices using redundant routing resources.
  75. MacArthur James ; Lacey Timothy M., Techniques and circuits for high yield improvements in programmable devices using redundant routing resources.
  76. Chi, Shyh-An, Three dimensional integrated circuit connection structure and method.
  77. Chi, Shyh-An, Three dimensional integrated circuit connection structure and method.
  78. Trimberger,Stephen M., Utilizing multiple bitstreams to avoid localized defects in partially defective programmable integrated circuits.
  79. Trimberger, Stephen M., Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits.
  80. Trimberger, Stephen M., Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits.
  81. Trimberger,Stephen M., Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로