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Apparatus and method for measuring the phase and magnitude of microwave signals 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04B-017/00
출원번호 US-0400458 (1995-03-07)
발명자 / 주소
  • Bradley Donald A. (Morgan Hill CA) Grace Martin I. (San Jose CA) Thornton Douglas R. (Felton CA) Finch David P. (Morgan Hill CA)
출원인 / 주소
  • Wiltron Company (Morgan Hill CA 02)
인용정보 피인용 횟수 : 157  인용 특허 : 0

초록 ▼

A measurement system is provided which comprises: source circuit for receiving feedback signals and for providing respective signals at respective discrete frequencies in a prescribed microwave frequency range, wherein the respective provided signals at respective discrete frequencies are substantia

대표청구항 ▼

A method for measuring microwave frequency signals incident upon a device under test (DUT) comprising the steps of: producing a first signal at a first frequency; producing a microwave frequency stimulus signal at any of a plurality of respective discrete frequencies; locking the stimulus signal at

이 특허를 인용한 특허 (157)

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AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

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