초록 ▼

A free running relaxation oscillator is disposed on a semiconductor integrated circuit die for generating a frequency representative of the natural frequency of the die. The natural frequency of the die changes for different operating temperatures and voltages. An optimal speed may be determined at

A free running relaxation oscillator is disposed on a semiconductor integrated circuit die for generating a frequency representative of the natural frequency of the die. The natural frequency of the die changes for different operating temperatures and voltages. An optimal speed may be determined at which the die will reliably operate by measuring the natural frequency. The die may be effectively graded and matched with a similar die by correlating the natural frequency of the die with the temperature and voltage values at which the natural frequency was measured for each die. A plurality of integrated circuit dice may be connected into a digital system, and the natural frequencies of each die may be monitored so as to optimize the system operating speed, reduce system power consumption without degrading performance, and/or increase the operating speed of a slower die by changing the temperature and/or operating voltage thereof.

대표청구항 ▼

A method for determining the reliable operating speed of a semiconductor integrated circuit die when operated at a desired voltage and temperature, said method comprising the steps of: maintaining a desired temperature on an integrated circuit die; applying a desired operating voltage to the integra

A method for determining the reliable operating speed of a semiconductor integrated circuit die when operated at a desired voltage and temperature, said method comprising the steps of: maintaining a desired temperature on an integrated circuit die; applying a desired operating voltage to the integrated circuit die; generating a frequency with a relaxation oscillator disposed on the integrated circuit die and operating at a natural frequency thereof; determining a ratio value by counting the number of cycles of the relaxation oscillator frequency during at least one period of a reference clock frequency, wherein the ratio value is the relaxation oscillator frequency divided by the reference clock frequency; and determining a reliable operating speed of the integrated circuit from the ratio value.