이 특허를 인용한 특허 (33)

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2. Farnworth,Warren M.; Grief,Malcolm; Sandhu,Gurtej S., Apparatuses configured to engage a conductive pad.

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3. Kang, Weng Poo; Davidson, Jimmy Lee; Kerns, Jr., David V., Diamond diode devices with a diamond microtip emitter.

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5. Nakamoto Masayuki,JPX, Emitter structure of field emission cold-cathode device using synthetic resin substrate.

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6. Farnworth,Warren M.; Grief,Malcolm, Engagement Probes.

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7. Farnworth,Warren M.; Grief,Malcolm; Sandhu,Gurtej S., Engagement probe having a grouping of projecting apexes for engaging a conductive pad.

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8. Ghoshal, Uttam Shyamalindu; Robinson, Errol Wayne, Enhanced interface thermoelectric coolers with all-metals tips.

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9. Li, Xinxin; Yang, Yongliang, Fabrication of a microcantilever microwave probe.

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10. Nakamoto Masayuki,JPX, Field emission cold-cathode device and method of manufacturing the same.

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11. Ghodsian Bahram,CAX ; Parameswaran Ash M.,CAX ; Syrzycki Marek,CAX, Low-cost methods for manufacturing field ionization and emission structures with self-aligned gate electrodes.

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12. Farnworth, Warren M.; Grief, Malcolm; Sandhu, Gurtej S., Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability.

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13. Farnworth,Warren M.; Grief,Malcolm; Sandhu,Gurtej S., Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability.

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14. Mehregany Mehran ; Rajan Narayanan ; Zorman Christian A., Method for molding high precision components.

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15. Kirk, Eugenie; Tsujino, Soichiro, Method for producing a field-emitter array with controlled apex sharpness.

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16. Ismail, Salleh, Method of making thin film probe tip for atomic force microscopy.

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17. Matsuda Tetsuo (Poughkeepsie NY) Okumura Katsuya (Poughkeepsie NY), Method of planarizing a semiconductor workpiece surface.

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18. Moldovan, Nicolae, Method to reduce wedge effects in molded trigonal tips.

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19. Popp, Shane M., Methods of interfacing nanomaterials for the monitoring and execution of pharmaceutical manufacturing processes.

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20. Li, Xinxin; Yang, Yongliang, Microcantilever microwave probe.

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21. Kang Weng Poo ; Davidson Jimmy Lee ; Kerns ; Jr. David V., Mold method for forming vacuum field emitters and method for forming diamond emitters.

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22. Raravikar, Nachiket R.; Panat, Rahul, Nanolithographic method of manufacturing an embedded passive device for a microelectronic application, and microelectronic device containing same.

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23. Popp, Shane M., Pharmaceutical dosage forms fabricated with nanomaterials.

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25. Lutter, Stefan, SPM sensor and process for producing it.

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26. Chand, Ami, Scanning probe devices.

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27. Okuyama, Hiroyuki; Doi, Masato; Biwa, Goshi; Oohata, Toyoharu, Semiconductor element.

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28. Okuyama, Hiroyuki; Doi, Masato; Biwa, Goshi; Oohata, Toyoharu, Semiconductor element.

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29. Eldridge, Benjamin N.; Grube, Gary W.; Khandros, Igor Y.; Madsen, Alex; Mathieu, Gaetan L., Sharpened, oriented contact tip structures.

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30. Elrod, Scott A.; Hadimioglu, Babur B.; Steinmetz, David; Wong, Kaiser H., Solid BI-layer structures for use with high viscosity inks in acoustic ink in acoustic ink printing and methods of fabrication.

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31. Babur B. Hadimioglu ; Scott A. Elrod ; David Steinmetz ; Kaiser H. Wong, Solid bi-layer structures for use with high viscosity inks in acoustic ink printing and methods of fabrication.

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32. Singh, Bhanwar; Rangarajan, Bharath; Yedur, Sanjay K., Use of multiple tips on AFM to deconvolve tip effects.

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