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Surveillance of industrial processes with correlated parameters 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06G-007/19
출원번호 US-0255586 (1994-06-08)
발명자 / 주소
  • White Andrew M. (Skokie IL) Gross Kenny C. (Bolingbrook IL) Kubic William L. (Sante Fe NM) Wigeland Roald A. (Olympia Fields IL)
출원인 / 주소
  • Arch Development Corporation (Chicago IL 02)
인용정보 피인용 횟수 : 123  인용 특허 : 29

초록

A system and method for surveillance of an industrial process. The system and method includes a plurality of sensors monitoring industrial process parameters, devices to convert the sensed data to computer compatible information and a computer which executes computer software directed to analyzing t

대표청구항

A system for surveillance of an industrial process to assess at least one of an operational state of the industrial process and the operational state of sensors monitoring the process, comprising: at least one sensor means for sensing raw data information from the industrial process corresponding to

이 특허에 인용된 특허 (29)

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