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Method for manufacturing a semiconductor device using a catalyst 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/20
출원번호 US-0481061 (1995-06-07)
우선권정보 JP-0329761 (1993-12-01)
발명자 / 주소
  • Ohtani Hisashi (Kanagawa JPX) Miyanaga Akiharu (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Yamaguchi Naoaki (Kanagawa JPX) Suzuki Atsunori (Kanagawa JPX)
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd. (Kanagawa JPX 03)
인용정보 피인용 횟수 : 235  인용 특허 : 2

초록

A method for manufacturing a thin film transistor having a crystalline silicon layer as an active layer comprises the steps of disposing a solution containing a catalyst for promoting a crystallization of silicon in contact with an amorphous silicon film, crystallizing the amorphous silicon at a rel

대표청구항

A method for manufacturing a semiconductor device comprising the steps of: disposing a catalyst element for promoting a crystallization of silicon or a compound containing said catalyst element in a continuous layer in contact with an amorphous silicon film; crystallizing said amorphous silicon film

이 특허에 인용된 특허 (2)

  1. Liu Gang (State College PA) Kakkad Ramesh H. (State College PA) Fonash Stephen J. (State College PA), Low temperature crystallization and pattering of amorphous silicon films.
  2. Fonash Stephen J. (State College PA) Liu Gang (Sunnyvale CA), Low temperature crystallization and patterning of amorphous silicon films on electrically insulating substrates.

이 특허를 인용한 특허 (235)

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