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Self-referencing modulation circuit for CMOS integrated circuit electrostatic discharge protection clamps 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H02H-009/04
출원번호 US-0697124 (1996-08-20)
발명자 / 주소
  • Krakauer David B. (Cambridge MA) Mistry Kaizad (Lincoln MA) Butler Steven (Marlboro MA) Partovi Hamid (Sunnyvale CA)
출원인 / 주소
  • Digital Equipment Corporation (Maynard MA 02)
인용정보 피인용 횟수 : 45  인용 특허 : 11

초록

An ESD protection device is provided which includes a self referencing modulation circuit for controlling its operation. The modulation circuit includes a diode stack coupled to a resistor and further coupled to an inverter powered by the signal pad voltage in one embodiment, or an odd plurality of

대표청구항

An electrostatic discharge (ESD) protection circuit comprising: an ESD clamp device having first and second terminals and a control terminal, said first terminal coupled to a signal line susceptible to ESD and said second terminal coupled to a ground reference; a modulation control device having inp

이 특허에 인용된 특허 (11)

  1. Lee Kowk Fai V. (Irvine CA) Lee Alan (Irvine CA), ESD protection circuit with segmented buffer transistor.
  2. Lu Hsindao (Dallas TX), ESD protection for SOI circuits.
  3. Lee Kowk Fai V. (Irvine CA) Lee Alan (Irvine CA) Marmet Melvin L. (San Clemente CA) Ouyang Kenneth W. (Huntington Beach CA), Electro-static discharge protection circuit with bimodal resistance characteristics.
  4. Dungan Thomas (Half Moon Bay CA) Coussens Eugene (Los Altos CA), Electrostatic discharge protection circuit with dynamic triggering.
  5. Flannagan Stephen T. (Austin TX) Day Lawrence J. (Manchaca TX) Simon Barry A. (San Jose CA), Identity circuit for an integrated circuit using a fuse and transistor enabled by a power-on reset signal.
  6. Becker Burkhard (Ismaning DEX), Input protection structure for integrated circuits.
  7. Wolfe Edward L. (Lawrence MA), Means for reducing damage to JFETs from electrostatic discharge events.
  8. Tihanyi Jenoe (Muenchen DEX) Weber Roland (Muenchen DEX), Optocoupler for power FET.
  9. Duvvury Charvaka (Missouri City TX) Rountree Robert N. (Richmond TX), Output buffer with improved ESD protection.
  10. Wei Yi-Hen (Saratoga CA), Output pad electrostatic discharge protection circuit for MOS devices.
  11. Lee Kwok Fai V. (Irvine CA), Power rail ESD protection circuit.

이 특허를 인용한 특허 (45)

  1. Byrne Timothy Gerard,IEX ; Morley Brian T.,IEX, 5v tolerant I/O circuit.
  2. Pequignot James P. ; Rahman Tariq ; Sloan Jeffrey H. ; Stout Douglas W. ; Voldman Steven H., ASIC book to provide ESD protection on an integrated circuit.
  3. Fankhauser,Bernd; Mayerhofer,Michael, Active protection circuit arrangement.
  4. Avery, Leslie Ronald; Gardner, Peter Daryl, Adjustable trigger voltage circuit for sub-micrometer silicon IC ESD protection.
  5. Haider Nazar S., Circuit for protecting the input/output stage of a low voltage integrated circuit device from a failure of the internal.
  6. Verhaege, Koen Gerard Maria; Avery, Leslie Ronald, Circuits for dynamic turn off of NMOS output drivers during EOS/ESD stress.
  7. Duryea, Timothy P., Clamp for controlling current discharge.
  8. Anderson Warren Robert ; Howorth Nicholas John, Cross-referenced electrostatic discharge protection systems and methods for power supplies.
  9. Anderson Warren Robert ; Howorth Nicholas John, Cross-referenced electrostatic discharge protection systems and methods for power supplies.
  10. Van Camp, Benjamin; Wybo, Geert; Verleye, Stefaan, Diode chain with a guard-band.
  11. Van Camp, Benjamin; Wybo, Geert; Verleye, Stefaan, Diode chain with guard-band.
  12. Ellis-Monaghan, John J.; Loiseau, Alain, EOS protection circuit with FET-based trigger diodes.
  13. Soldner, Wolfgang; Langguth, Gernot; Russ, Christian; Gossner, Harald, ESD clamp adjustment.
  14. Soldner, Wolfgang; Langguth, Gernot; Russ, Christian; Gossner, Harald, ESD clamp adjustment.
  15. Yang, Hae Chang, ESD protection circuit and method for fabricating the same.
  16. Venkatasubramanian, Ramachandran; Elio, Robert, ESD protection scheme for designs with positive, negative, and ground rails.
  17. Venkatasubramanian, Ramachandran; Elio, Robert, ESD protection scheme for designs with positive, negative, and ground rails.
  18. Hung, Kei-Kang; Chuang, Chien-Hui; Chang, Hung-Yi, Effective gate-driven or gate-coupled ESD protection circuit.
  19. Singleton, William C.; Willis, Scott C., Electromagnetic protector application specific integrated circuit (ASIC).
  20. Hung, Kenneth Wai Ming, Electrostatic discharge protection circuit for high voltage input pad.
  21. Hung, Kenneth Wai Ming, Electrostatic discharge protection circuit for output buffer.
  22. Hung, Kenneth Wai Ming, Electrostatic discharge protection for a circuit capable of handling high input voltage.
  23. May, James Thomas; Tyler, Larry Earl, Electrostatic discharge protection scheme in low potential drop environments.
  24. Uenishi Yasutaka,JPX, Electrostatic protection circuit.
  25. Boluna Luis Sergio V. ; Hoang Tuong Hai ; Lo Tony S. ; DeClue Larry W., Field oxide transistor based feedback circuit for electrical overstress protection.
  26. Tien-Hao Tang TW, Gate-voltage controlled electrostatic discharge protection circuit.
  27. John, Willis; Mike, May; Fujio, Takeda, High speed electrostatic discharge protection circuit.
  28. Chen, Wei-Fan; Lee, Shu-Chuan; Yu, Ta-Lee; Lin, Shi-Tron, High-voltage tolerance input buffer and ESD protection circuit.
  29. Kim, Han-gu; Lee, Ki-tae; Ko, Jae-hyok; Kim, Woo-sub; Jang, Sung-pil, Integrated circuit device having input/output electrostatic discharge protection cell equipped with electrostatic discharge protection element and power clamp.
  30. Sugerman, Alvin; Roberts, Raymond; Harley-Stead, Michael, Internally triggered electrostatic device clamp with stand-off voltage.
  31. Tyler, Larry E.; May, James T., Low input capacitance electrostatic discharge protection circuit utilizing feedback.
  32. Mallikararjunaswamy, Shekar; Bobde, Madhur, MOS transistor triggered transient voltage suppressor to provide circuit protection at a lower voltage.
  33. Pequignot James P. ; Rahman Tariq ; Sloan Jeffrey H. ; Stout Douglas W. ; Voldman Steven H., Method and apparatus for providing ESD protection.
  34. Pequignot James P. ; Rahman Tariq ; Sloan Jeffrey H. ; Stout Douglas W. ; Voldman Steven H., Method for providing ESD protection for an integrated circuit.
  35. Nakamiya, Shinji; Yabe, Hiroshi; Kadowaki, Tadao; Makiuchi, Yoshiki, Oscillation circuit and electronic circuit, and semiconductor device, timepiece and electronic equipment provided with the same.
  36. Wu, Zong-Yu, Power clamping circuit with temperature compensation.
  37. Kemper, Wolfgang, Protection circuit for an integrated circuit device.
  38. Tsao, Szu-Chun, Protection circuit for preventing an over-current from an output stage.
  39. Shishido, Hideaki; Fukuoka, Osamu, Protection circuit, semiconductor device, photoelectric conversion device, and electronic device.
  40. Fujita, Masashi, Semiconductor device.
  41. Hiraga Noriaki,JPX, Semiconductor device having protection circuit.
  42. Yasushi Kameda JP; Makoto Segawa JP, Semiconductor device having protective and test circuits.
  43. Saleh Farid, System including ESD protection.
  44. Boyd, Graeme B.; Cheng, Xun; Patel, Bijit, Systems and methods for ESD protection.
  45. Chen, Wei-Fan, Voltage tolerance ESD protection circuit.
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