초록 ▼

A method and an apparatus are disclosed for detecting an atomic structure of a sample along a surface thereof. The method comprises arranging the sample in a constant magnetic field (B0) of predetermined field strength and high homogeneity and irradiating a high-frequency magnetic field (B1) of a pr

A method and an apparatus are disclosed for detecting an atomic structure of a sample along a surface thereof. The method comprises arranging the sample in a constant magnetic field (B0) of predetermined field strength and high homogeneity and irradiating a high-frequency magnetic field (B1) of a predetermined frequency on the sample, wherein the fields (B0) and (B1) are oriented perpendicularly to each other. The method further comprises providing a force-sensitive sensor having a paramagnetic tip comprising a paramagnetic material. The sensor is placed in close vicinity to the sample such that the paramagnetic tip is in atomic interaction with the sample surface which means that the distance between the tip and the surface is in the order of between 1 and 10 Å. The predetermined field strength and the predetermined frequency are set such that electron paramagnetic resonance (EPR) is excited within the tip paramagnetic material. The paramagnetic tip is then displaced parallel to the sample surface for mapping predetermined points on the sample surface. During displacing the tip the force exerted on the tip by a local inhomogeneous magnetic field (Bloc) caused by atomic magnetic moments (me,k) of the sample is measured.

대표청구항 ▼

A method for detecting an atomic structure of a sample along a surface thereof, said method comprising the steps of: arranging said sample in a constant magnetic field (B0) of predetermined field strength and high homogeneity, said constant magnetic field (B0) having a first direction; irradiating a

A method for detecting an atomic structure of a sample along a surface thereof, said method comprising the steps of: arranging said sample in a constant magnetic field (B0) of predetermined field strength and high homogeneity, said constant magnetic field (B0) having a first direction; irradiating a first high-frequency magnetic field (B1) of a first predetermined frequency on said sample, said first high-frequency magnetic field (B1) having a second direction perpendicular to said first direction; providing a force-sensitive sensor having a paramagnetic tip comprising a paramagnetic spin at a terminal end of said paramagnetic tip, said spin being accessible for electron paramagnetic resonance (EPR) excitation; placing said sensor in close vicinity to said sample such that said sensor tip is in atomic interaction with said sample surface; setting said predetermined field strength and said first predetermined frequency such that EPR is excited within said paramagnetic tip; displacing said paramagnetic tip parallel to said sample surface for mapping predetermined points on said sample surface; and during said step of displacing measuring a force exerted on said paramagnetic tip by a local inhomogeneous magnetic field (Bloc) caused by atomic magnetic moments (me,k) of said sample.