$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Semiconductor integrated circuits with specific pitch multilevel interconnections 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/10
출원번호 US-0356675 (1994-12-15)
우선권정보 JP-0342848 (1993-12-15)
발명자 / 주소
  • Okumura Koichiro (Tokyo JPX)
출원인 / 주소
  • NEC Corporation (Tokyo JPX 03)
인용정보 피인용 횟수 : 49  인용 특허 : 2

초록

A multilevel interconnection structure for semiconductor integrated circuits has five or more multiple interconnection layers, each of which includes a plurality of interconnections, wherein the lower level interconnections included in first to third interconnection layers form the lowest level inte

대표청구항

A multilevel interconnection structure for semiconductor integrated circuits, said structure comprising at least five interconnection layer levels, each of said layers including interconnections at each level, wherein first, second and third lowest level interconnections have a first uniform pitch a

이 특허에 인용된 특허 (2)

  1. Owada Nobuo (Ohme JPX) Akimori Hiroyuki (Ohme JPX) Nitta Takahisa (Fuchuu JPX) Kobayashi Tohru (Iruma JPX) Sasabe Shunji (Iruma JPX) Kawaji Mikinori (Hino JPX) Kasahara Osamu (Hinode JPX), Semiconductor integrated circuit device and method of manufacturing the same.
  2. Iwamatsu Seiichi (Suwa JPX), Thin film metal interconnects in integrated circuit structures to reduce circuit operation speed delay.

이 특허를 인용한 특허 (49)

  1. Ohayashi,Masayuki; Yokoi,Takashi, Arrangement of wiring lines including power source lines and channel wirings of a semiconductor integrated circuit having plural cells.
  2. David Earl Butz, Data storage device having virtual columns and addressing layers.
  3. Gheewala, Tushar R.; Colwell, Michael J.; Yang, Henry H.; Breid, Duane G., Dual-height cell with variable width power rail architecture.
  4. Gheewala,Tushar R.; Colwell,Michael J.; Yang,Henry H.; Breid,Duane G., Dual-height cell with variable width power rail architecture.
  5. Gheewala, Tushar R.; Breid, Duane G.; Sherlekar, Deepak D.; Colwell, Michael J., Gate array architecture using elevated metal levels for customization.
  6. Park Jonathan C., High density gate array cell architecture with metallization routing tracks having a variable pitch.
  7. Schmitt Jonathan ; Statz Timothy V., High density gate array cell architecture with sharing of well taps between cells.
  8. Baba, Osamu; Mimino, Yutaka, High frequency semiconductor device.
  9. Tabatabaei, Sassan, Input-output device testing including initializing and leakage testing input-output devices.
  10. Tabatabaei, Sassan, Input-output device testing including voltage tests.
  11. Smooha Yehuda, Integrated circuit conductors that avoid current crowding.
  12. Vu Quat T. ; Chien Ling-Chu, Interconnect design with controlled inductance.
  13. Hansen, Tyler G.; Yang, Ming-Chuan; Sipani, Vishal, Interconnect structures for integrated circuits and their formation.
  14. Hansen, Tyler G.; Yang, Ming-Chuan; Sipani, Vishal, Interconnect structures for integrated circuits and their formation.
  15. Juengling Werner, Intermetal dielectric planarization by metal features layout modification.
  16. Werner Juengling, Metallization line layout.
  17. Juengling Werner, Method of intermetal dielectric planarization by metal features layout modification.
  18. Juengling, Werner, Method of making a metallization line layout.
  19. Osann ; Jr. Robert ; Eltoukhy Shafy, Methods and apparatuses for binning partially completed integrated circuits based upon test results.
  20. Robert Osann, Jr. ; Shafy Eltoukhy, Methods and apparatuses for binning partially completed integrated circuits based upon test results.
  21. Fisher,Louis Cameron; Brumitt,Charles Jeremy, Methods and apparatuses for memory array leakage reduction using internal voltage biasing circuitry.
  22. Zhao Ji ; Teng Chih Sieh, Methods for making VLSI capacitors and high Q VLSI inductors using metal-filled via plugs.
  23. Gheewala Tushar R., Power and signal routing technique for gate array design.
  24. Brunolli, Michael J.; Malek-Khosravi, Behnan; Sambawa, Nurtjahya, Power/ground metallization routing in a semiconductor device.
  25. Kakeda, Masahide, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN AIDING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, PROGRAM, AND PROGRAM RECORDING ME.
  26. Kakeda, Masahide, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, DESIGN AIDING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, PROGRAM, AND PROGRAM RECORDING ME.
  27. Amishiro, Hiroyuki; Igarashi, Motoshige, Semiconductor device including a plurality of interconnection layers, manufacturing method thereof and method of designing semiconductor circuit used in the manufacturing method.
  28. Ohno Yoshikazu,JPX, Semiconductor device with short circuit prevention and method of manufacturing thereof.
  29. Ohayashi,Masayuki; Yokoi,Takashi, Semiconductor integrated circuit.
  30. Takano Midori,JPX, Semiconductor integrated circuit and wiring method.
  31. Yokota Noboru,JPX, Semiconductor integrated circuit device having fundamental cells and method of manufacturing the semiconductor integrated circuit device using the fundamental cells.
  32. Ohayashi,Masayuki; Yokoi,Takashi, Semiconductor integrated circuit including a first region and a second region.
  33. Noguchi, Mitsuhiro; Nishiyama, Akira, Semiconductor with multilayer metal structure using copper that offer high speed performance.
  34. Mitsuhiro Noguchi JP; Akira Nishiyama JP, Semiconductor with multilayer wiring structure that offer high speed performance.
  35. Butz,David Earl, System and methods for addressing a matrix incorporating virtual columns and addressing layers.
  36. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  37. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  38. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  39. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  40. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  41. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  42. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  43. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  44. Zhao Ji ; Teng Chih Sieh, VLSI capacitors and high Q VLSI inductors using metal-filled via plugs.
  45. Kusunoki Mitsugu,JPX ; Tamba Nobuo,JPX, Variable logic integrated circuit device having connections through switch matrix and top layers for inter-cell connecti.
  46. Shen Chih-Heng,TWX ; Lin Hui-Tzu,TWX, Wafer edge seal ring structure.
  47. Ohtani, Hisashi; Yamazaki, Shunpei, Wiring line and manufacture process thereof and semiconductor device and manufacturing process thereof.
  48. Ohtani, Hisashi; Yamazaki, Shunpei, Wiring line and manufacture process thereof, and semiconductor device and manufacturing process thereof.
  49. Ohtani,Hisashi; Yamazaki,Shunpei, Wiring line and manufacture process thereof, and semiconductor device and manufacturing process thereof.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로