초록 ▼

A method and apparatus for non-destructive testing of the load bearing characteristics of a structure are disclosed. An interferometer is supported by a beam which is supported away from the surface of the structure to be tested. The interferometer is used to measure a quantity which varies with the

A method and apparatus for non-destructive testing of the load bearing characteristics of a structure are disclosed. An interferometer is supported by a beam which is supported away from the surface of the structure to be tested. The interferometer is used to measure a quantity which varies with the distance between the interferometer and a reflecting means supported on the location to be tested. The reflecting means is supported in such a manner as to move responsively with deformations to the said location, and is typically attached to a probe which is urged against the said location. Preferably a force is applied or varied near the location to be tested and comparisons are made over time or as the said force varies. Such a system does not damage the structure, and does not require complicated equipment or processing.

대표청구항 ▼

A system for non-destructive testing of the load bearing characteristics of a structure, said system comprising: an apparatus having a member (21) supported away from the surface (11) of the structure (10) to be tested by one or more supports (22, 24) in contact with the structure; measuring means (

A system for non-destructive testing of the load bearing characteristics of a structure, said system comprising: an apparatus having a member (21) supported away from the surface (11) of the structure (10) to be tested by one or more supports (22, 24) in contact with the structure; measuring means (30) adapted to measure a quantity which varies with distance between the surface of the structure and a point on the said member remote from any of the said supports, said measuring means including an interferometer (32); reflecting means (34) which move responsively with deformations of the said surface; said reflecting means and said interferometer together define at least one external optical path which varies with said quantity; a probe (36) urged against the area of the structure to be tested, said probe supported so as to allow said probe to move responsively with deformations of the said area, wherein said reflecting means is attached to said probe, the probe being supported by said member by means of a low friction arrangement selected from the group consisting of: bushings within a housing attached to said member; a bendable arm attached to said member; a flexible spring steel (70) attached to said member; and a pair of pivot arms (78, 79) pivotally connected to said probe, said pivot arms pivotally connected to a second member (75) rigidly connected to said support member; and, means (40) for both applying a force on the structure and varying repetitively said force in a predetermined manner, at a location near the area to be tested.