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Variable spot-size scanning apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G02F-001/33
출원번호 US-0361135 (1994-12-21)
발명자 / 주소
  • Nikoonahad Mehrdad (Menlo Park CA)
출원인 / 주소
  • Tencor Instruments (Milpitas CA 02)
인용정보 피인용 횟수 : 107  인용 특허 : 19

초록

An apparatus for both deflecting a beam of light illuminating a spot on a surface and varying the size of the spot, electronically, without changing any system components. The apparatus includes an acousto-optic deflector driven with a linear FM signal produced by a chirp signal generator. The linea

대표청구항

An apparatus for deflecting a beam of light illuminating a spot on a surface, of the type having periodic and non-periodic features, comprising: an acousto-optic deflector having an entrance aperture and an exit aperture, opposite the entrance aperture, a linear FM signal generator electronically co

이 특허에 인용된 특허 (19)

  1. Gottlieb Milton (Churchill PA) Wachtel Anselm (Penn Hills PA), Acousto-optic tunable filter.
  2. Picault Jean-Pierre C. (Arpajon FRX), Acousto-optical deflector.
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  4. Johann Donald F. (3724 Carlson Cir. Palo Alto CA 94306) Burroughs Alan C. (851 Arnold Way San Jose CA 95128), Compensation for dust on an optical disk by increasing laser writing power.
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  6. Porter Vernon R. (Plano TX) Manns William G. (Dallas TX) Wood Anthony B. (Dallas TX) Baber S. Charles (Richardson TX) Penn Thomas C. (Richardson TX), Laser scanner using focusing acousto-optic device.
  7. Galbraith Lee K. (Mountain View CA), Light collector for optical contaminant and flaw detector.
  8. Roulot, Maurice, Light source with acousto-optic deflector and afocal lens system.
  9. Kryger David L. (Chelmsford MA) Killam R. William (Tewksbury MA), Mask analysis.
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  11. Gelbart Daniel (Burnaby CAX), Multi-spot modulator using a laser diode.
  12. Brandstetter Robert W. (Levittown NY) Pernick Benjamin J. (Forest Hills NY) Fonneland Nils J. (Lake Ronkonkoma NY) Caputi Stephen J. (Centerport NY), Optical heterodyning system and method for rapid optical phase and amplitude measurements.
  13. Hoshino Takashi (Yokohama JPX) Takeuchi Takashi (Fujisawa JPX), Optical recording/reproducing system, having function of detecting dirt deposition on optical pickup.
  14. Oakley William S. (Sunnyvale CA), Optical tape recorder having an acousto-optic device for scanning a radiant energy beam onto a media.
  15. Vaught John L. (Palo Alto CA) Neukermans Armand P. (Palo Alto CA) Keldermann Herman F. (Berkeley CA) Koenig Franklin R. (Palo Alto CA), Particle detection on patterned wafers and the like.
  16. Huston Alan L. (Springfield VA) Moerner William E. (Fremont CA), Phase sensitive ultrasonic modulation method for the detection of strain-sensitive spectral features.
  17. Yamamiya Kunio (Sagamihara JPX) Sakamoto Masaharu (Tokyo JPX), Pick-up head abnormality detector for optical recording/reproducing apparatus.
  18. Lindig Charles E. (Huntington Bay NY) Brandstetter Robert W. (Levittown NY) Doucette Adrian R. (Garden City NY), Recursive optical filter system.
  19. Heebner Richard W. (Solebury Township ; Bucks County PA) Schmitt Randal L. (Plainsboro Township ; Middlesex County NJ), Technique for inspecting semiconductor wafers for particulate contamination.

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