IPC분류정보
| 국가/구분 |
United States(US) Patent
등록
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| 국제특허분류(IPC7판) |
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| 출원번호 |
US-0001321
(1993-01-07)
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발명자
/ 주소 |
- Levy Henry A. (402 Foster Ave. Brooklyn NY 11230)
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| 인용정보 |
피인용 횟수 :
141 인용 특허 :
0 |
초록
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An electronic component failure indicator for clearly visably indicating on the surface of an electronic component to be tested a self sustaining indication of the functional operational status of the component. It is used for easily locating and identifying the exact used electronic component that
An electronic component failure indicator for clearly visably indicating on the surface of an electronic component to be tested a self sustaining indication of the functional operational status of the component. It is used for easily locating and identifying the exact used electronic component that has failed while it is still in a circuit and also later after it is removed from a circuit without the need of test equipment and electrical power. It includes an electronic testing circuit which continually monitors one or more parameters of the electronic component other than temperature. Upon a determination that one or more parameters has deviated from a normal condition, the test circuit generates an appropriate signal. This in turn causes a visable change in an indicator that is visable on the surface of the electronic component being monitored. In some embodiments, this may constitute a color change of the indicator, and in other embodiments, it may cause a bending or movement of the indicator. In the preferred embodiment, the generation of a signal by the test circuit causes current to flow through a wire heating means that heats a thermo-sensitive material, thereby changing the color of the thermo-sensitive material. This thermo-sensitive material is positioned so as to be visible on the surface of the electronic component. By examining the surface of the electronic component and in particular the visable change indicator, a person can determine whether or not the electronic component has failed.
대표청구항
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An electronic component failure indicator for clearly visably indicating on the surface of an electronic component to be tested a self sustaining indication of the functional operational status of the component, and means for easily locating and identifying the exact used electronic component that h
An electronic component failure indicator for clearly visably indicating on the surface of an electronic component to be tested a self sustaining indication of the functional operational status of the component, and means for easily locating and identifying the exact used electronic component that has permanently failed, has become permanently damaged, and has become permanently defective while it is still in a circuit and also later after it is removed from a circuit without the need of test equipment, electrical power, and a trained technician, the invention comprised of: an electronic component to be tested selected from one of the following group consisting of: microprocessors, micro-controller ICs, operational amplifiers, RAMs, DRAMS, SDRAMS, PROMs, EEPROMs, timers, clocks, analog to digital converters, digital to analog converters, diodes, rectifiers, transistors, oscillators, SCRs, triacs, thyristors, FETs, MOSFETs, triggers, capacitors, transformers, display drivers, displays, photocouplers, LEDs, laser diodes, opto-isolators, optical integrated circuits, lasers, fluorescent lamps, incandescent light bulbs, other components containing light emitters which are used repeatedly, electron tubes, those components comprised of at least one semiconductor device, and those components comprised of at least one integrated circuit; a failure indicating means; a testing circuit means; a power means; said failure indicating means built into and embedded within said electronic component to be tested; said failure indicating means is embedded within material which comprises the structural body of the electronic component to be tested so as to be visible on a surface of the electronic component; said power means supplying electrical power to said testing means; said testing circuit means monitoring at least one functional operational parameter selected, not necessarily from each, of the input functions, processing functions, and output functions of the electronic component under test, other than temperature and other than the monitoring and detection of electrostatic discharge events, to detect at least one operational parameter of the component which has deviated from a normal stated condition, such a deviation which is indicative that electronic component has permanently failed in some way, has become permanently damaged in some way, has become permanently defective in some way, and that at least one functional operational parameter of the electronic component will not be normal again as a result of such failure; said failure indicating means electrically connected to said testing circuit means and to said power means; said testing circuit means activating said failure indicating means by switching on power to it when at least one functional operational parameter of the electronic component under test deviates from a normal stated condition that is indicative of a permanent failure, defect, and damage of the component; said builtin failure indicating means undergoing a permanent and irreversable visible change of appearance upon being activated by said power means; said builtin failure indicating means indicating permanent failure upon receiving power from the said power means which causes the visual appearance of the builtin failure indicating means to permanently and irreversably change from a first state of visual appearance indicating that the electronic component is still good and functionally operational to a second permanent state of appearance indicating that the electronic component has permanently failed, is damaged, and is defective; said builtin failure indicating means being able to sustain its first state of visual appearance and permanently sustain its second state of visual appearance without requiring a source of power for such sustainance.
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