이 특허를 인용한 특허 (36)

1. Shirley,Lyle, Apparatus and methods for surface contour measurement.

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2. Pfaff,Paul L., Condition assessment system for a structure including a semiconductor material.

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3. Jianping,Xie; Hai,Ming; Tianpeng,Zhao; Liang,Lv; Huaqiao,Gui; Kong,Yuan; Ranta,Craig S., Data input devices and methods for detecting movement of a tracking surface by detecting laser doppler self-mixing effects of a frequency modulated laser light beam.

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4. Papen, Roeland F., Dispensing liquid drops onto porous brittle substrates.

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5. Pfaff, Paul L., Holographic condition assessment system for a structure including a semiconductor material.

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6. Cunningham,Richard L.; Feldman,Philip; Feldman,Ben; Merril,Gregory L., Interface device and method for interfacing instruments to vascular access simulation systems.

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7. Pfaff, Paul, Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material.

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8. Dakin, Elizabeth A.; Mamidipudi, Priyavadan; Rogers, Philip L., LDV system for measuring wind at high altitude.

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9. Lahram, David F.; Clauer, Allan H.; Dulaney, Jeff L., Laser search peening for exfoliation corrosion detection.

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10. Vert, Alexey Vasily; Dolinsky, Sergei Ivanovich, Light detection and ranging system.

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11. Tao, Li; Song, Guiju; Wan, Xinjun; Harding, Kevin George; Hayashi, Steven Robert; Hoffman, James Joseph; Muekmore, Charles Walter; Williams, Yana Zhang; Xu, Shukuan, Measurement systems and methods.

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12. Cheng-Chung Jaing TW; Cheng-Chung Lee TW; Chuen-Lin Tien TW; Ing-Jer Ho TW, Method for measuring a thermal expansion coefficient of a thin film by using phase shifting interferometry.

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13. Pfaff, Paul L., Method for optically testing semiconductor devices.

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14. Pfaff, Paul L., Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials.

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15. Pfaff, Paul L., Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials.

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16. Pfaff, Paul L., Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials.

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17. Pelc Richard E. ; Chibucos Nicholas S. ; Papen Roeland F. ; Meyer Wilhelm,DEX, Microvolume liquid handling system.

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18. Pelc, Richard E.; Chibucos, Nicholas S.; Papen, Roeland F.; Meyer, Wilhelm, Microvolume liquid handling system.

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19. Richard E. Pelc ; Nicholas S. Chibucos ; Roeland F. Papen ; Wilhelm Meyer DE, Microvolume liquid handling system.

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20. Modares, Darius; Gharib, Mory; Taugwalder, Fred, Miniature optical sensor.

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21. Kudo, Koichi; Masuda, Koji; Funato, Hiroyoshi; Ueda, Takeshi; Nihei, Yasuhiro; Takaura, Atsushi, Moving-member detecting device and image forming apparatus.

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22. Pfaff, Paul L., Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices.

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23. Pfaff, Paul L., Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture.

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24. Nelson, James M.; Bossi, Richard H.; Shrader, John E., Non-destructive strength measurement by prompt bulk heating method.

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25. Pfaff, Paul L., Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices.

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26. Doi, Masaharu; Kubota, Yoshinobu; Kawashima, Yoshitada; Kubo, Teruhiro, Optical transmission device.

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27. Pfaff, Paul L., Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture.

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28. Papen, Roeland F., Piezoelectric-drop-on-demand technology.

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29. Crawford, Gregory P.; Cairns, Darran R.; Bowley, Christopher C.; Danworaphong, Sorasak; Fontecchio, Adam K.; Faris, Sadeg M.; Li, Le, Reflective liquid crystal strain gauge with aspected particles and polarization-sensitive devices.

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30. Watts, Alan, Robustly mounted, single DOF, adjustable mirror.

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31. German John D. ; Cramer Eric J. ; Tocci Michael D. ; Spielbusch Brian K. ; Saggese Steven J., Self-contained laser illuminator module.

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32. Bickel,Boris, Sensor apparatus for determination of the tire internal pressure for a motor vehicle.

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33. Georgeson, Gary E., System and method for identifying incompletely cured adhesive.

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34. Nagamatsu, Brian H., System and method for remote data acquisition, monitoring and control.

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35. Georgeson, Gary E., System and method for the inspection of adhesive.

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36. Dam-Hansen, Carsten, Temperature compensated optical system based on a diffractive optical element.

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