초록 ▼

The present invention relates to transient depth thermography; a nondestructive testing technique and system for locating flaws within an object. The system, which comprises a heater for heating the surface of the object; a recorder for recording pixel intensity for each pixel on the heated surface;

The present invention relates to transient depth thermography; a nondestructive testing technique and system for locating flaws within an object. The system, which comprises a heater for heating the surface of the object; a recorder for recording pixel intensity for each pixel on the heated surface; a means for determining pixel contrast from the pixel intensity; and a means for determining the size and location of flaws within the object based upon the pixel contrast; monitors each pixels' contrast for successive thermal images and utilizes those pixel contrasts determining the location of a flaw within the object. The object surface and the respective underlying flaws can then be depicted on a color spectrum image print which correlates the flaw depth with a particular color.

대표청구항 ▼

[ We claim:] [1.] A method for detecting flaws in an object having a surface, said surface divided into an array of resolution elements, comprising the steps of:a. heating the surface of the object;b. recording a plurality of thermal images of each resolution element on said heated surface over a pe

[ We claim:] [1.] A method for detecting flaws in an object having a surface, said surface divided into an array of resolution elements, comprising the steps of:a. heating the surface of the object;b. recording a plurality of thermal images of each resolution element on said heated surface over a period of time, wherein each of said recorded resolution elements corresponds to a pixel;c. determining individual pixel intensity for each of said pixels in each of said thermal images;d. determining mean pixel intensity for each thermal image;e. obtaining pixel contrast for each of said pixels in each of said thermal images subtracting said mean pixel intensity from said individual pixel's intensity; andd. determining depth of the flaw within the object based upon said pixel contrast.