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Self-testing multi-processor die with internal compare points

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-011/26
출원번호 US-0649117 (1996-05-14)
발명자 / 주소
  • Vigil Peter J.
  • Lederer Louis S.
  • Blomgren James S.
출원인 / 주소
  • Exponential Technology, Inc.
대리인 / 주소
    Auvinen
인용정보 피인용 횟수 : 154  인용 특허 : 21

초록

A microprocessor die contains several CPU cores that are substantially identical. A large second-level cache on the die is shared among the multiple CPU's. When 3 CPU's are on the die, their outputs are compared during a self-testing mode. If outputs from all three CPU's match, then no error is dete

대표청구항

[ We claim:] [19.] A multi-processor die comprising:a plurality of central processing unit (CPU) cores, each core having a pipeline for processing instructions and a scan test chain serially connecting storage nodes within the core;a shared cache for supplying instructions and operands to the plural

이 특허에 인용된 특허 (21)

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