초록 ▼

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Us

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

대표청구항 ▼

[ Having thus described the invention, what is claimed is:] [1.] A scanning-force-microscope probe electrode assembly for imaging induced polarization forces comprising,a) an electrically conducting scanning-force-microscope probe tip;b) a counter electrode located more than the radius of the probe

[ Having thus described the invention, what is claimed is:] [1.] A scanning-force-microscope probe electrode assembly for imaging induced polarization forces comprising,a) an electrically conducting scanning-force-microscope probe tip;b) a counter electrode located more than the radius of the probe tip away from the probe tip;c) a voltage supply connected to the probe tip and the counter electrode;d) means to connect the probe tip to a scanning-force-microscope.