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Time monitoring appliance 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G04B-047/00
  • G04F-008/00
  • G01K-001/02
출원번호 US-0749686 (1996-11-15)
발명자 / 주소
  • Ivanov Andre,CAX
  • Lowe Alan Arthur,CAX
출원인 / 주소
  • The University of British Columbia, CAX
대리인 / 주소
    Rowley
인용정보 피인용 횟수 : 42  인용 특허 : 7

초록

A low power consumption system for monitoring time of use of appliance incorporates a controller and a temperature sensor that is activated by the controller at intervals of X minutes to determine the temperature of the sensor. The sensed temperature is then compared with a threshold temperature and

대표청구항

[ We claim:] [1.] An apparatus for monitoring time of use of an appliance comprising a battery powered integrated circuit having a continuously operating timing oscillator means providing uniformly spaced time increment pulses, a controller, a sensor for sensing a condition indicating said appliance

이 특허에 인용된 특허 (7)

  1. Baker John F. C. (West Midlands GBX) Phillips John M. (Cardiff GBX), Apparatus and sensor unit for monitoring changes in a physical quantity with time.
  2. Roizen Michael (Chicago IL) Turcotte ; II William E. (Oak Park IL) Pfisterer Richard E. (Arlington Heights IL), Portable medical interactive test selector having plug-in replaceable memory.
  3. Brinkerhoff Joseph M. (712 W. 200 South Payson UT 84651), Sprinkler system controller.
  4. Nam Young K. (513 Seongnam-Dong Seongnam City Kyunggi-Do KRX) Lee Seung J. (Bupyung Apt. 9-203 98-64 Bupyung 5-Dong ; Buk-Ku Incheon KRX), System and method for monitoring temperature.
  5. Ishiguro Tomohisa (Nagoya JPX) Nishimura Atsushi (Nagoya JPX) Asai Shigekazu (Gifu JPX), System for monitoring a combustion apparatus.
  6. Hanaoka Tadashi (Koganei JPX), Thermistor thermometer.
  7. Kuemmel Dietmar (Aalen DEX) Knoerzer Gerhard (Aalen DEX) Wurst Juergen (Mutlangen DEX), Wearing time measuring device for a removable medical apparatus.

이 특허를 인용한 특허 (42)

  1. Kopelman, Avi; Sambu, Shiva; Sterental, Rene M.; Kuo, Eric; de Alencar Casa, Mauricio, Arch expanding appliance.
  2. Johnson Michael W. ; Engler Christopher J., Beverage quality control apparatus and method.
  3. Rahman, Tariq; Bowen, J. Richard, Brace compliance monitor.
  4. Rahman, Tariq; Shaffer, Thomas H.; Bowen, J. Richard, Compliance monitor and method for a medical device.
  5. Graeme G. Wood GB, Distributed processing system for component lifetime prediction.
  6. Elbaz, Gilad; Lampert, Erez; Atiya, Yossef; Kopelman, Avi; Saphier, Ofer; Moshe, Maayan; Ayal, Shai, Intraoral scanner with dental diagnostics capabilities.
  7. Baker, Jr., Clark R., Method and system for determining when to reposition a physiological sensor.
  8. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  9. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  10. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  11. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  12. Lowe, Michael K; Valoir, Tamsen, Night time orthodontics.
  13. Borovinskih, Artem; Derakhshan, Mitra; Koppers, Carina; Meyer, Eric; Tolstaya, Ekaterina; Brailov, Yury, Photograph-based assessment of dental treatments and procedures.
  14. Walker, Darryl G., Power up of semiconductor device having a temperature circuit and method therefor.
  15. Lowe, Michael K., Pulsatile orthodontic device and methods.
  16. Ferragut, II, Nelson J.; McNamara, John L.; Montuoro, Louis, Refrigerator having power outage duration feature.
  17. Ferragut, II,Nelson J.; Mc Namara,John L.; Montuoro,Louis, Refrigerator having power outage duration feature.
  18. Isozumi, Masashi; Oba, Tsunetoshi, Remaining lifetime estimating method, temperature detecting structure and electronic equipment.
  19. Walker, Darryl G., Semiconductor device having a temperature circuit that provides a plurality of temperature operating ranges.
  20. Walker, Darryl G., Semiconductor device having subthreshold operating circuits including a back body bias potential based on temperature range.
  21. Walker, Darryl G., Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit value.
  22. Walker, Darryl G., Semiconductor device having temperature sensor circuits.
  23. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature.
  24. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  25. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  26. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  27. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  28. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  29. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  30. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  31. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  32. Walker,Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  33. Masaki, Hiroyuki; Nakamura, Chiaki, Sensor timepiece, sensor timepiece data input system and method, and computer readable recording medium.
  34. Walker, Darryl G., Temperature sensing circuit with hysteresis and time delay.
  35. Kishi,Masakazu, Temperature sensor.
  36. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  37. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  38. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  39. Drissi, Youssef; Grandison, Tyrone W.; Harrison, Colin G.; Katircioglu, Kaan K.; Paraszczak, Jurij R., Unified numerical and semantic analytics system for decision support.
  40. Lowe, Michael K., Vibrating dental devices.
  41. Lowe, Michael K., Vibrating dental devices.
  42. Lowe, Michael K., Vibrating dental devices.
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