$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Infrared assessment system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-005/00
출원번호 US-0712920 (1996-09-12)
발명자 / 주소
  • Allred Lloyd G.
출원인 / 주소
  • The United States of America as represented by the Secretary of the Air Force
대리인 / 주소
    Auton
인용정보 피인용 횟수 : 29  인용 특허 : 14

초록

A process and system for determining the integrity of an object by analyzing its dynamic heat properties is disclosed. A properly functioning reference object is heated and an infrared camera is positioned above the object. A digital computer collects the infrared images of the object and analyzes i

대표청구항

[ What is claimed is:] [1.] A process for analyzing an object to determine its functional status, comprising:scanning a reference object with an infrared detector to measure infrared radiation emitted from the reference object and determining its heating rate thereby;scanning a test object with an i

이 특허에 인용된 특허 (14)

  1. Smith Walter L. (Livermore CA) Wells Clifford G. (Pleasanton CA) Rosencwaig Allan (Danville CA), Apparatus for evaluating thermal and electrical characteristics in a sample.
  2. Schroeder Robert C. (7435 Gills Pier Rd. Northport MI 49670), Dunnage frame and lock assembly.
  3. Lindquist Donald F. (Sweetwater TN), Infrared diagnostic instrument.
  4. Nakamura Minoru (Nakano JPX) Oshiro Yasuhiro (Nakano JPX), Junction inspection method and apparatus for electronic parts.
  5. Nakata Shuji (7-17 ; Honmachi 5-Chome Toyonaka-Shi ; Osaka-Fu JPX) Nakamura Minoru (Osaka JPX) Sakai Takeo (Kawagoe JPX) Shimizu Yoshimasa (Kawagoe JPX) Kondo Yoshihiro (Kawagoe JPX), Method and device for checking joint of electronic component.
  6. Ortiz Marcos G. (Idaho Falls ID), Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or compl.
  7. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (Blairsville GA), Method of and apparatus for detecting corrosion utilizing infrared analysis.
  8. Helfer Jeffrey L. (Webster) Switalski Steven C. (Rochester) Liu Hsue-Yang (Rochester NY), Near infrared diagnostic method and instrument.
  9. Cox ; Jr. Eldon E. (Lowell MA) Rolla Michael P. (Maynard MA), Product defect detection using thermal ratio analysis.
  10. Takamatsu Hiroyuki (Kobe JPX) Nishimoto Yoshiro (Kobe JPX) Sumie Shingo (Kakogawa JPX), Sample evaluating method by using thermal expansion displacement.
  11. Swartzel Kenneth R. (Raleigh NC) Ganesan Sudalaimuthu G. (Raleigh NC) Kuehn Richard T. (Cary NC) Hamaker Raymond W. (Raleigh NC) Sadeghi Farid (Malden MA), Thermal memory cell and thermal system evaluation.
  12. Swartzel Kenneth R. (Raleigh NC) Ganesan Sudalaimuthu G. (Raleigh NC) Kuehn Richard T. (Cary NC) Hamaker Raymond W. (Raleigh NC) Sadeghi Farid (Malden MA), Thermal memory cell and thermal system evaluation.
  13. Crisman ; Jr. Elton M. (Saint Cloud FL), Thermographic evaluation technique.
  14. Levinson Lionel M. (Schenectady NY), Varistor defect detection by incipient hot spot observation.

이 특허를 인용한 특허 (29)

  1. Bowles, Mark Vincent; Erman, Randal; Hammes, Jarrod; Ploetner, Jeffrey; Silva, John; Segil, Rick, Application for device evaluation and other processes associated with device recycling.
  2. Yan, Shuo-Ting, Circuitry testing method and circuitry testing device.
  3. Schlagheck,Jerry; Pastor,Marc, Detection of defects by thermographic analysis.
  4. Fink David, Heat maps for controlling deformations in optical components.
  5. Bowles, Mark Vincent; Tullie, Thomas L.; Beane, John Andrew; Ploetner, Jeff; Miller, John; Vesco, Neil, Kiosk for recycling electronic devices.
  6. Bowles, Mark Vincent; Tullie, Thomas L.; Beane, John Andrew; Ploetner, Jeff; Miller, John; Vesco, Neil, Kiosk for recycling electronic devices.
  7. Bowles, Mark Vincent; Tullie, Thomas L.; Beane, John Andrew; Ploetner, Jeff; Miller, John; Vesco, Neil, Kiosk for recycling electronic devices.
  8. Francine J. Prokoski, Method and apparatus for aligning and comparing images of the face and body from different imagers.
  9. Prokoski, Francine J., Method and apparatus for aligning and comparing images of the face and body from different imagers.
  10. Brill, Frank Z.; Flinchbaugh, Bruce E., Method and apparatus for compressing image information.
  11. Roger Biel DE, Method and apparatus for detecting the presence of a moulding in an open blister package based on sensed temperature differences.
  12. Reilly,Thomas L.; Jacobstein,A. Ronald; Cramer,K. Elliott, Method and apparatus for the portable identification of material thickness and defects along uneven surfaces using spatially controlled heat application.
  13. Louban, Roman; Zettner, Juergen; Doettinger, Christoph, Method for automated testing of a material joint.
  14. Forester William K. ; Lobbes Timothy J., Method of identifying a substance by infrared imaging.
  15. Enachescu, Marian; Belikov, Sergey, Methods and systems employing infrared thermography for defect detection and analysis.
  16. Forutanpour, Babak; Ploetner, Jeffrey, Methods and systems for detecting cracks in electronic devices.
  17. Forutanpour, Babak; Ploetner, Jeffrey, Methods and systems for detecting screen covers on electronic devices.
  18. Bowles, Mark Vincent, Mini-kiosk for recycling electronic devices.
  19. Bush, Ronald R., Optimal cessation of training and assessment of accuracy in a given class of neural networks.
  20. Pelletier, Kevin M, Passive thermal image glass breakage detector.
  21. Bowles, Mark Vincent, Secondary market and vending system for devices.
  22. Bush Ronald R., System and method for delineating spatially dependent objects, such as hydrocarbon accumulations from seismic data.
  23. Ronald R. Bush, System and method for delineating spatially dependent objects, such as hydrocarbon accumulations from seismic data.
  24. Bush, Ronald R., System and method for enhanced hydrocarbon recovery.
  25. Casagrande, Louis Gregory; Gilchrist, George William, System and method for evaluating a structure.
  26. Bowles, Mark Vincent; Librizzi, Michael, Systems for recycling consumer electronic devices.
  27. Heinke, Thomas; Pickett, James T., Thermal imaging camera with graphical temperature plot.
  28. Chamberlain,Gary Roy; Mellor,Andrew; Ridley,Ian Hamilton, Thermal imaging system and method.
  29. Jon R. Lesniak, Transient thermal marking of objects.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로