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Method of wafer cleaning, and system and cleaning solution regarding same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/302
  • C09K-013/00
출원번호 US-0659145 (1996-06-05)
발명자 / 주소
  • Li Li
  • Westmoreland Donald L.
  • Hawthorne
  • deceased Richard C.
  • Torek Kevin
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Mueting, Raasch & Gebhardt, P.A.
인용정보 피인용 횟수 : 103  인용 특허 : 25

초록

A method of cleaning wafer surfaces includes providing a wafer surface and cleaning the wafer surface using at least hydrofluoric acid (HF) and an etch reducing component. The etch reducing component is from the group of (R).sub.4 NOH wherein R=(C.sub.1 -C.sub.20)alkyls, either straight or branch ch

대표청구항

[ What is claimed is:] [1.] A method of cleaning wafer surfaces, the method comprising the steps of:providing a wafer surface; andcleaning the wafer surface using a solution comprising at least hydrofluoric acid (HF) and an etch reducing component, the etch reducing component being from the group of

이 특허에 인용된 특허 (25)

  1. Osuch Christopher E. (Mine Hill NJ) McFarland Michael J. (Bound Brook NJ), Blocked monomer and polymers therefrom for use as photoresists.
  2. Ilardi Joseph M. (Sparta NJ) Schwartzkopf George (Franklin Township NJ), Cleaning wafer substrates of metal contamination while maintaining wafer smoothness.
  3. Blackwood Robert S. (Lubbock TX) Biggerstaff Rex L. (Lubbock TX) Clements L. Davis (Lincoln NE) Cleavelin C. Rinn (Lubbock TX), Gaseous process and apparatus for removing films from substrates.
  4. Zias Arthur R. (Los Altos CA) Block Barry (Los Altos Hills CA) Mapes Kenneth W. (San Jose CA) Nystrom Norman L. (Sunnyvale CA) Cadwell Robert M. (Los Altos CA), High sensitivity miniature pressure transducer.
  5. Schoeppel John F. (San Rafael CA), Method and apparatus for cleaning surfaces to absolute or near-absolute cleanliness.
  6. Syverson Daniel J. (Robbinsdale MN), Method and apparatus for controlling simultaneous etching of front and back sides of wafers.
  7. Brault Robert G. (Santa Monica CA) Miller Leroy J. (Canoga Park CA), Method for developing poly(methacrylic anhydride) resists.
  8. Shimizu Shumpei (Moses Lake WA) Cho Toshitsura (Kawasaki JPX) Yagi Osamu (Kawasaki JPX), Method for production of aqueous quaternary ammonium hydroxide solution.
  9. Sachdev Krishna G. (Hopewell Junction NY) Whitaker Joel R. (Port Ewen NY) Ahmad Umar M. (Hopewell Junction NY), Method of forming patterned polyimide films.
  10. Curran Patrick A. (Plano TX), Method of making a heterojunction bipolar transistor with SIPOS.
  11. Shimizu Shumpei (Tokyo JPX) Cho Toshitsura (Tokyo JPX) Iiri Shigeo (Kawasaki JPX), Method of processing organic quaternary ammonium hydroxide-containing waste liquid.
  12. Izumi Akira (Kyoto JPX) Matsuka Takeshi (Kyoto JPX), Method of removing native oxide film from a contact hole on silicon wafer.
  13. McNeilly Michael A. (Palo Alto CA) Deal Bruce E. (Palo Alto CA) Kao Dah-Bin (Palo Alto CA) de Larios John (Palo Alto CA), Method of selective etching native oxide.
  14. Itoh Kunio (Tokyo JPX) Watabe Kimio (Mie JPX) Shiozaki Masahiro (Kanagawa JPX), Photoresist processing solution with quaternary ammonium hydroxide.
  15. Durham Dana (Bloomsbury NJ), Photoresist treating composition consisting of a mixture of propylene glycol alkyl ether and propylene glycol alkyl ethe.
  16. Kwong Ranee W. (Wappingers Falls NY) Sachdev Harbans S. (Wappingers Falls NY) Sachdev Krishna G. (Wappingers Falls NY), Photosensitive polyimide compositions.
  17. Trefonas ; III Peter (Medway MA) Carey Richard J. (Sherborn MA), Point-of-use purification.
  18. McCoy Scott I. (Chicago IL), Process for cleaning quartz and silicon surfaces.
  19. Winebarger Paul M. (Austin TX), Process for fabricating a semiconductor device using re-ionized rinse water.
  20. Durham Dana (Bloomsbury NJ), Process of using photoresist treating composition containing a mixture of a hexa-alkyl disilazane, propylene glycol alky.
  21. Takahashi Hironari (Itami JPX), Semiconductor device manufacturing apparatus and cleaning method for the apparatus.
  22. Heinsohn George E. (Elkton MD) Svadlenak Rudolf E. (Sunriver OR), Stabilization of choline and its derivatives against discoloration.
  23. Hayashida Ichiro (Kawagoe JPX) Kakizawa Masahiko (Kawagoe JPX) Umekita Kenichi (Kawagoe JPX) Nawa Hiroyoshi (Kawagoe JPX) Muraoka Hisashi (Yokohama JPX), Surface treating cleaning method.
  24. Muraoka Hisashi (Yokohama JPX), Treatment method of cleaning surface of plastic molded item.
  25. Tanaka Masato (Shiga JPX), Wafer cleaning method.

이 특허를 인용한 특허 (103)

  1. Daniel, David W.; Defibaugh, Dodd C., Anti-corrosion system.
  2. Kwang-wook Lee KR; Kun-tack Lee KR; Yong-sun Ko KR; Chang-lyong Song KR, Aqueous cleaning solution for removing contaminants surface of circuit substrate cleaning method using the same.
  3. Willis, Stephen L., Chemical mechanical planarization of conductive material.
  4. Willis,Stephen L., Chemical mechanical planarization of conductive material.
  5. Eric K. Grieger ; Michael T. Andreas ; Michael A. Walker, Cleaning composition containing tetraalkylammonium salt and use thereof in semiconductor fabrication.
  6. Grieger Eric K. ; Andreas Michael T. ; Walker Michael A., Cleaning composition containing tetraalkylammonium salt and use thereof in semiconductor fabrication.
  7. Chen, Gary; Li, Li, Composition and method for cleaning residual debris from semiconductor surfaces.
  8. Gary Chen ; Li Li, Composition and method for cleaning residual debris from semiconductor surfaces.
  9. Small Robert J. ; Cheng Jun ; Maw Taishih, Compositions for cleaning organic and plasma etched residues for semiconductors devices.
  10. Weidman, Timothy W.; Wijekoon, Kapila P.; Zhu, Zhize; Gelatos, Avgerinos V. (Jerry); Khandelwal, Amit; Shanmugasundram, Arulkumar; Yang, Michael X.; Mei, Fang; Moghadam, Farhad K., Contact metallization scheme using a barrier layer over a silicide layer.
  11. Geha Sam ; Shan Ende, Controlled isotropic etch process and method of forming an opening in a dielectric layer.
  12. Bauer, Matthias; Thomas, Shawn G., Cyclical epitaxial deposition and etch.
  13. Riedel, Thomas; Wolke, Klaus, Device and method for cleaning substrates.
  14. Racanelli,Marco; Hu,Chun; Sherman,Phil N., Double-implant high performance varactor and method for manufacturing same.
  15. Yin, Zhiping; Chen, Gary, Dry low k film application for interlevel dielectric and method of cleaning etched features.
  16. Stewart, Michael P.; Weidman, Timothy W.; Shanmugasundram, Arulkumar; Eaglesham, David J., Electroless deposition process on a silicon contact.
  17. Stewart, Michael P.; Weidman, Timothy W.; Shanmugasundram, Arulkumar; Eaglesham, David J., Electroless deposition process on a silicon contact.
  18. Gonzales David B. ; Bartlett Aaron T., Endpoint stabilization for polishing process.
  19. Gonzales, David B.; Bartlett, Aaron T., Endpoint stabilization for polishing process.
  20. Kezuka,Takehiko; Suyama,Makoto; Itano,Mitsushi, Etching solution, etched article and method for etched article.
  21. Bauer, Matthias, High throughput cyclical epitaxial deposition and etch process.
  22. Wasyluk, Joanna; Chow, Yew Tuck; Kronholz, Stephan; Purwaningsih, Lindarti; Becker, Ines, Horizontal epitaxy furnace for channel SiGe formation.
  23. Yin, Zhiping; Chen, Gary, Low k film application for interlevel dielectric and method of cleaning etched features.
  24. Yin, Zhiping; Chen, Gary, Low k film application for interlevel dielectric and method of cleaning etched features.
  25. Brabant, Paul D.; Italiano, Joe P.; Wen, Jianqing, Low temperature load and bake.
  26. Brabant,Paul D.; Italiano,Joe P.; Wen,Jianqing, Low temperature load and bake.
  27. Brabant,Paul D.; Italiano,Joe P.; Wen,Jianqing, Low temperature load and bake.
  28. Morgan Paul A. ; Torek Kevin, Method and apparatus for etch of a specific subarea of a semiconductor work object.
  29. Chen, Gary; Li, Li, Method for cleaning residual debris from semiconductor surfaces.
  30. Bhowmik Siddhartha ; Buckfeller Joseph William ; Clabough G. Craig ; Merchant Sailesh Mansinh, Method for cleaning via openings in integrated circuit manufacturing.
  31. Lin Ping-Wei,TWX ; Li Jui-Ping,TWX ; Kao Ming-Kuan,TWX ; Chung Yi-Fu,TWX, Method for enlarging surface area of a plurality of hemi-spherical grains on the surface of a semiconductor chip.
  32. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Method for manufacturing semiconductor device.
  33. Lim Kwang-shin,KRX ; Kim Eun-a,KRX ; Park Sang-o,KRX, Method for manufacturing semiconductor devices.
  34. Max F. Hineman ; Kevin J. Torek, Method for selective etching of oxides.
  35. Matsushita, Kiyohiro; Fukuda, Hideaki; Kagami, Kenichi, Method of cleaning UV irradiation chamber.
  36. Torek Kevin J., Method of etching thermally grown oxide substantially selectively relative to deposited oxide.
  37. Torek Kevin J., Method of etching thermally grown oxide substantially selectively relative to deposited oxide.
  38. Moon, Kang-hun; Tak, Yong-suk; Park, Gi-gwan, Method of forming SiOCN material layer and method of fabricating semiconductor device.
  39. Ping Er-Xuan ; Li Li, Method of forming a capacitor.
  40. Chen, Gary, Method of forming a semiconductor contact that includes selectively removing a Ti-containing layer from the surface.
  41. Thakur,Randhir P., Method of forming a semiconductor device.
  42. Ping Er-Xuan ; Li Li, Method of forming a wordline.
  43. Torek, Kevin J., Method of forming an inset in a tungsten silicide layer in a transistor gate stack.
  44. Chen, Guoqing; Pan, James, Method of forming hemisphere grained silicon on a template on a semiconductor work object.
  45. Torek,Kevin; Shea,Kevin; Graettinger,Thomas, Method of forming high aspect ratio structures.
  46. Komatsu Hiroshi,JPX ; Hashimoto Makoto,JPX ; Nakamura Motoaki,JPX, Method of forming viahole.
  47. Torek Kevin J., Method of making an oxide structure having a finely calibrated thickness.
  48. Kadono,Masaya; Yamazaki,Shunpei; Yamauchi,Yukio; Kitakado,Hidehito, Method of manufacturing a semiconductor device.
  49. Funabashi Michimasa,JPX, Method of manufacturing a semiconductor integrated circuit device.
  50. Funabashi, Michimasa, Method of manufacturing a semiconductor integrated circuit device.
  51. Funabashi, Michimasa, Method of manufacturing a semiconductor integrated circuit device.
  52. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Method of manufacturing active matrix display device.
  53. Kim, Seong-yoon, Method of manufacturing mask.
  54. Yu Zhiyi Jimmy ; Overgaard Corey D. ; Droopad Ravi ; Abrokwah Jonathan K. ; Hallmark Jerald A., Method of passivating the surface of a Si substrate.
  55. Houng, Mau-Phon; Wang, Yeong-Her; Chang, Wai-Jyh, Method of surface treatment on the improvement of electrical properties for doped silicon oxides (SiO2) films.
  56. Trapp, Shane J., Method to eliminate striations and surface roughness caused by dry etch.
  57. Trapp,Shane J, Method to eliminate striations and surface roughness caused by dry etch.
  58. Chang Kyu-hwan,KRX ; Song Jae-inh,KRX ; Park Heung-soo,KRX ; Koh Young-bum,KRX, Methods for cleaning wafers used in integrated circuit devices.
  59. Li, Li, Methods for fabricating residue-free contact openings.
  60. Li, Li, Methods for fabricating residue-free contact openings.
  61. Chen, Guoqing; Pan, James, Methods of forming hemispherical grained silicon on a template on a semiconductor work object.
  62. Chen, Guoqing; Pan, James, Methods of forming hemispherical grained silicon on a template on a semiconductor work object.
  63. Chen,Guoqing; Pan,James, Methods of forming hemispherical grained silicon on a template on a semiconductor work object.
  64. Park Jung-min,KRX ; Park Jae-gun,KRX ; Lee Gon-sub,KRX ; Kim Gi-jung,KRX, Methods of treating crystal-grown wafers for surface defect analysis.
  65. Hsu, Chien-Pin S., Microelectronic cleaning compositions containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning.
  66. Kevin J. Torek, Oxide structure having a finely calibrated thickness.
  67. Bedge, Satish, Passivation for cleaning a material.
  68. Bedge, Satish, Passivation for cleaning a material.
  69. Bedge, Satish, Passivation for cleaning a material.
  70. Cantell Marc W. ; Giewont Kenneth ; Lasky Jerome B. ; Peterson Kirk D., Plasma etch pre-silicide clean.
  71. Shea,Kevin, Poly etch without separate oxide decap.
  72. Naghshineh Shahriar ; Barnes Jeff ; Hashemi Yassaman ; Oldak Ewa B., Post chemical-mechanical planarization (CMP) cleaning composition.
  73. Naghshineh, Shahriar; Barnes, Jeff; Oldak, Ewa B., Post chemical-mechanical planarization (CMP) cleaning composition.
  74. Peyne,Catherine M.; Maloney,David J.; Lee,Shihying; Lee,Wai Mun; Arkless,Leslie W., Post etch cleaning composition for dual damascene system.
  75. Scott, Robin Charis; Johnson, Matt, Process and apparatus for treating wafers.
  76. Obeng Yaw S. ; Opila Robert L. ; Raghavan Ramaswamy S., Process for removing alkali metals from solvents used in the manufacture of semiconductor wafers.
  77. Halpin, Michael W.; Jacobson, Paul T., Rapid bake of semiconductor substrate with upper linear heating elements perpendicular to horizontal gas flow.
  78. Li, Li, Residue-free contact openings and methods for fabricating same.
  79. Li, Li, Residue-free contact openings and methods for fabricating same.
  80. Bauer, Matthias; Weeks, Keith Doran, Selective epitaxial formation of semiconductive films.
  81. Bauer, Matthias; Weeks, Keith Doran, Selective epitaxial formation of semiconductor films.
  82. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Semiconductor device and a method of manufacturing the same.
  83. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Semiconductor device and a method of manufacturing the same.
  84. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Semiconductor device and a method of manufacturing the same.
  85. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Semiconductor device and a method of manufacturing the same.
  86. Kadono, Masaya; Yamazaki, Shunpei; Yamauchi, Yukio; Kitakado, Hidehito, Semiconductor device including light-emitting element.
  87. Gilton, Terry L.; Li, Li, Semiconductor fabrication apparatus.
  88. Torek,Kevin; Shea,Kevin, Semiconductor fabrication that includes surface tension control.
  89. Ping Er-Xuan ; Li Li, Semiconductor processing methods.
  90. Er-Xuan Ping ; Li Li, Semiconductor processing methods, methods of forming hemispherical grain polysilicon, methods of forming capacitors, and methods of forming wordlines.
  91. Chen, Gary, Semiconductor substrate cleaning.
  92. Chen,Gary, Semiconductor substrate cleaning.
  93. Pagliaro, Jr., Robert H., Silicon surface preparation.
  94. Pagliaro, Jr., Robert H.; Doty, Mitchell L.; King, Diane M., Stable, oxide-free silicon surface preparation.
  95. Thomas, Shawn; Tomasini, Pierre, Stressor for engineered strain on channel.
  96. Yamamoto, Taro; Kyouda, Hideharu; Kawasaki, Tetsu; Shimura, Satoru, Substrate cleaning device and substrate cleaning method.
  97. Mueller,Brian L.; Chamberlain,Jeffery P.; Schroeder,David J., System for the preferential removal of silicon oxide.
  98. Mueller,Brian L.; Chamberlain,Jeffery P.; Schroeder,David J., System for the preferential removal of silicon oxide.
  99. Li Li ; Westmoreland Donald L. ; Hawthorne Richard C. ; Torek Kevin, System for wafer cleaning.
  100. Robinson Karl M. ; Walker Michael A., Treatment of a surface having an exposed silicon/silica interface.
  101. Robinson Karl M. ; Walker Michael A., Treatment of a surface having exposed silica.
  102. Robinson, Karl M.; Walker, Michael A., Treatment of exposed silicon and silicon dioxide surfaces.
  103. Nuttall Michael ; Torek Kevin J. ; Chapek David L., Trench isolation method.
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