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특허 상세정보

Temperature detection method and circuit using MOSFET

국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) H03K-005/22   
미국특허분류(USC) 327/512 ; 307/651
출원번호 US-7365047 (1996-10-24)
우선권정보 JP-0278754 (1995-10-26)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    Sughrue, Mion, Zinn, Macpeak & Seas, PLLC
인용정보 피인용 횟수 : 20  인용 특허 : 6
초록

A temperature detection circuit using a threshold voltage of a MOSFET with a further improved detection characteristic. The circuit has first and second lateral MOSFETs formed in a well region of a conductivity type which is formed on a surface of a semiconductor region of an opposite conductivity type, a first power source which drives the first lateral MOSFET at an operation point where a temperature has influence on a characteristic between a gate-source voltage and a drain current characteristic thereof, a second power source which drives the second ...

대표
청구항

[ What is claimed is:] [5.] A temperature detection circuit, comprising:

이 특허를 인용한 특허 피인용횟수: 20

  1. Vollertsen, Rolf-Peter. Apparatus and method for measuring local surface temperature of semiconductor device. USP2015079086328.
  2. Vollertsen, Rolf-Peter. Apparatus and method for measuring local surface temperature of semiconductor device. USP2010097798703.
  3. Vollertsen, Rolf-Peter. Apparatus and method for measuring local surface temperature of semiconductor device. USP2012078215830.
  4. Isham, Robert H.; Hayes, Thomas; Webb, Andrew L.; Reyes, Julio. Current sensing with RDSON correction. USP20190210205391.
  5. Astala, Jari. Method and apparatus for protection of batteries. USP2004106804100.
  6. Astala,Jari. Method and apparatus for protection of batteries. USP2006037019493.
  7. Molander Mats Erik,SEX. Method and arrangement for measuring temperature of a semiconductor component in an inactive state. USP2001096286996.
  8. Lee, Seung Hoon; Park, Chul Woo. Method for outputting internal temperature data in semiconductor memory device and circuit of outputting internal temperature date thereby. USP2009097594750.
  9. Franch, Robert L.; Jenkins, Keith A.. On chip temperature measuring and monitoring circuit and method. USP2010087780347.
  10. Franch, Robert L.; Jenkins, Keith A.. On chip temperature measuring and monitoring method. USP2010077762721.
  11. Olmos, Alfredo; Pietri, Stefano; Coimbra, Ricardo P.. Programmable temperature sensing circuit for an integrated circuit. USP2013048432214.
  12. Nagata Junichi,JPX ; Hayakawa Junji,JPX ; Ban Hiroyuki,JPX. Temperature detecting using a forward voltage drop across a diode. USP1999075918982.
  13. Nakashimo, Takao. Temperature detection circuit and semiconductor device. USP20180910078015.
  14. Hasegawa Hiroyuki,JPX ; Kurosu Toshiki,JPX ; Sugayama Shigeru,JPX. Temperature sensing circuit for voltage drive type semiconductor device and temperature sensing method therefore, and drive-device and voltage drive type semiconductor device using the same. USP2001096288597.
  15. Sinha,Manoj K.; Hush,Glen E.. Temperature sensor. USP2007027180211.
  16. Schrodinger, Karl; Stimma, Jaro. Temperature sensor and circuit configuration for controlling the gain of an amplifier circuit. USP2003126667660.
  17. Schrödinger, Karl; Stimma, Jaro Robert. Temperature sensor and method for operating a temperature sensor. USP2004096789939.
  18. Koyama, Jun; Yamazaki, Shunpei. Temperature sensor circuit and semiconductor device including temperature sensor circuit. USP20180610001414.
  19. Koyama, Jun; Yamazaki, Shunpei. Temperature sensor circuit and semiconductor device including temperature sensor circuit. USP2016099435696.
  20. Soldera, Jefferson Daniel De Barros; Olmos, Alfredo; Pietri, Stefano. Temperature sensor device and methods thereof. USP2009087579898.