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Test ring oscillator

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0707151 (1996-09-03)
발명자 / 주소
  • Lundberg James R.
출원인 / 주소
  • Integrated Device Technology, Inc.
대리인 / 주소
    Huffman
인용정보 피인용 횟수 : 54  인용 특허 : 10

초록

An apparatus and method for measuring parasitic differences between dissimilar conductive paths on a semiconductor is provided. The apparatus provides a ring oscillator which has two propagation paths. The first path is traversed on a logical transition from low to high, and the second path is trave

대표청구항

[ I claim:] [1.] A test apparatus for quantifying parasitics on a microprocessor, the test apparatus comprising:a plurality of first gate stages, said first gate stages having a first portion and a second portion;a plurality of second gate stages, said second gate stages having a first portion and a

이 특허에 인용된 특허 (10)

  1. Zasio John J. (Sunnyvale CA), Apparatus for scan testing CMOS integrated systems.
  2. Zasio John J. (Sunnyvale CA), Delay testing method for CMOS LSI and VLSI integrated circuits.
  3. Wojciechowski Kenneth E. (Folsom CA), Low current reduced area programming voltage detector for flash memory.
  4. Merrill Richard B. (Daly City CA) Gomersall Edson D. (Saratoga CA) Issaq Enayet O. (San Jose CA), Method of screening A.C. performance characteristics during D.C. parametric test operation.
  5. Allen David H. (Eagan MN) Maas Michael F. (Maplewood MN), Ring oscillator.
  6. Eilley Edward S. (Reigate GB2), Ring oscillator.
  7. Gersbach John E. (Burlington VT) Hayashi Masayuki (Williston VT), Ring oscillator circuit having output with fifty percent duty cycle.
  8. Goto Junichi (Tokyo JPX), Test circuit for large scale integrated circuits on a wafer.
  9. Schwanke Robert E. (Camarillo CA) Icuss James C. (Escondido CA), Tester for measuring signal propagation delay through electronic components.
  10. Gehweiler William Frederick (Moorestown NJ), Voltage controlled oscillator utilizing field effect transistors.

이 특허를 인용한 특허 (54)

  1. Pitkethly, Scott; Masleid, Robert Paul, Advanced repeater utilizing signal distribution delay.
  2. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  3. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  4. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  5. Michael J. Dunn ; Mark Brandon Fuselier, Apparatus and method for verifying process integrity.
  6. Amoah, Yoba; Ellis-Monaghan, John J.; Kuo, Roger C.; Leitch, Molly J.; Zhang, Zhihong, Built-in self-test method and structure.
  7. Hanriat Stephane,FRX ; Schoellkopf Jean-Pierre,FRX, Circuit for validating simulation models.
  8. Masleid, Robert Paul; Kowalczyk, Andre, Circuits and methods for detecting and assisting wire transitions.
  9. Masleid, Robert, Circuits, systems and methods relating to a dynamic dual domino ring oscillator.
  10. Masleid,Robert P., Circuits, systems and methods relating to dynamic ring oscillators.
  11. Masleid, Robert Paul, Column select multiplexer circuit for a domino random access memory array.
  12. Masleid,Robert P., Column select multiplexer circuit for a domino random access memory array.
  13. Masleid, Robert Paul, Configurable delay chain with stacked inverter delay elements.
  14. Masleid, Robert Paul, Configurable delay chain with switching control for tail delay elements.
  15. Masleid, Robert Paul, Configurable tapered delay chain with multiple sizes of delay elements.
  16. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  17. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  18. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  19. Masleid, Robert P, Dynamic ring oscillators.
  20. Bennett, George J., Ensuring minimum gate speed during startup of gate speed regulator.
  21. Marshall,Andrew; Sutcliffe,Victor C., Extraction of interconnect parasitics.
  22. Sohn,Kwon il; Cho,Uk Rae; Kim,Su Chul, Integrated circuit chips and wafers including on-chip test element group circuits, and methods of fabricating and testing same.
  23. Masleid, Robert P, Inverting zipper repeater circuit.
  24. Masleid, Robert P., Inverting zipper repeater circuit.
  25. Masleid, Robert Paul, Inverting zipper repeater circuit.
  26. Masleid, Robert, Leakage efficient anti-glitch filter.
  27. Forbes, Leonard, Method and apparatus for providing clock signals at different locations with minimal clock skew.
  28. Forbes,Leonard, Method and apparatus for providing clock signals at different locations with minimal clock skew.
  29. Masleid, Robert Paul, Power efficient multiplexer.
  30. Masleid, Robert Paul, Power efficient multiplexer.
  31. Masleid, Robert Paul, Power efficient multiplexer.
  32. Masleid, Robert Paul, Power efficient multiplexer.
  33. Bennett, George J., Regulating power consumption of digital circuitry using a multi-layer ring oscillator.
  34. Masleid, Robert Paul; Dholabhai, Vatsal, Repeater circuit with high performance repeater mode and normal repeater mode, wherein high performance repeater mode has fast reset capability.
  35. Stoiber, Steven T.; Siu, Stuart, Ring based impedance control of an output driver.
  36. Stoiber, Steven T.; Siu, Stuart, Ring based impedance control of an output driver.
  37. Masleid, Robert Paul; Sousa, Jose; Kottapalli, Venkata, Scannable dynamic circuit latch.
  38. Cano,Francisco; Martinez,Juan C., Semiconductor device testing.
  39. Cano,Francisco; Martinez,Juan C., Semiconductor device testing.
  40. Cano,Francisco; Martinez,Juan C., Semiconductor device testing.
  41. Cano,Francisco; Martinez,Juan C., Semiconductor device testing.
  42. Masleid, Robert P.; Burr, James B., Stacked inverter delay chain.
  43. Peng, Xingwei; Wang, Wei, Structure for interconnect parasitic extraction.
  44. Suzuki, Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  45. Suzuki, Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  46. Suzuki,Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  47. Suzuki,Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  48. Suzuki,Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  49. Suzuki,Shingo, System and method for measuring time dependent dielectric breakdown with a ring oscillator.
  50. Pitkethly, Scott; Masleid, Robert P., Triple latch flip flop system and method.
  51. Pitkethly,Scott; Masleid,Robert P., Triple latch flip flop system and method.
  52. Moore, Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
  53. Moore, Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
  54. Moore,Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
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