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Triangulation-based 3-D imaging and processing method and system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
출원번호 US-0853305 (1997-05-09)
발명자 / 주소
  • Svetkoff Donald J.
  • Rohrer Donald K.
  • Kelley Robert W.
출원인 / 주소
  • General Scanning, Inc.
대리인 / 주소
    Brooks & Kushman P.C.
인용정보 피인용 횟수 : 58  인용 특허 : 10

초록

A triangulation-based method and system for high speed 3D and gray scale imaging and associated pre-processing of digitized information allows for estimation or filtering of height and gray scale values based upon the confidence level of the information obtained from a pair of sensors and also based

대표청구항

[ What is claimed is:] [1.] A triangulation-based 3-D processing method for generating transformed height data, the method comprising the steps of:transmitting a first beam of controlled radiant energy to a surface of an object to obtain first and second reflected beams of radiant energy;generating

이 특허에 인용된 특허 (10)

  1. Stern Howard (Greenlawn NY), Arrangement for scanned 3-D measurement.
  2. Nakagawa, Yasuo; Oshida, Yoshitada; Ishige, Kanji, Configuration detecting method and system.
  3. Kodama Masayuki (Hachioji JPX) Kobayashi Toshio (Tokyo JPX), Four-wheel driving apparatus with an automatic transmission.
  4. Case Steven K. (St. Louis Park MN) Keil Robert E. (St. Louis Park MN) Konicek John (Minneapolis MN), Laser probe for determining distance.
  5. Penney Carl M. (Schenectady NY), Method and system for determining surface profile information.
  6. Case Steven K. (St. Louis Park MN) Keil Robert E. (St. Louis Park MN) Jalkio Jeffrey A. (St. Paul MN), Point and line range sensors.
  7. Chen Sullivan (Centerport NY) Yonescu William E. (Dix Hills NY) Stern Howard K. (Greenlawn NY), System for 3-D inspection of objects.
  8. Amir Israel (Ewing NJ), Three-dimensional imaging technique with occlusion avoidance.
  9. Hata Seiji (Fujisawa JPX) Okada Takushi (Yokohama JPX) Ariga Makoto (Yokohama JPX) Okabe Takafumi (Yokohama JPX), Three-dimensional vision system.
  10. Svetkoff Donald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Kelley Robert W. (Ann Arbor MI), Triangulation-based 3D imaging and processing method and system.

이 특허를 인용한 특허 (58)

  1. Ono, Yuji, 3D-shape measurement apparatus.
  2. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Apparatus and method for determining an absolute pose of a manipulated object in a real three-dimensional environment with invariant features.
  3. Calum E. MacAulay CA, Apparatus and methods relating to spatially light modulated microscopy.
  4. MacAulay, Calum E., Apparatus and methods relating to spatially light modulated microscopy.
  5. Malloy, Terence P., Apparatus for sorting and counting spherical objects.
  6. Beaty Elwin M. ; Mork David P., Apparatus for three dimensional inspection of electronic components.
  7. Quist, Bradley L., Co-planarity and top-down examination method and optical module for electronic leaded components.
  8. Quist,Bradley L., Co-planarity examination method and optical module for electronic components.
  9. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Computer interface employing a manipulated object with absolute pose detection component and a display.
  10. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Computer interface employing a manipulated object with absolute pose detection component and a display.
  11. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Computer interface employing a wearable article with an absolute pose detection component.
  12. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Computer interface for manipulated objects with an absolute pose detection component.
  13. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Computer interface for remotely controlled objects and wearable articles with absolute pose detection component.
  14. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Alboszta, Marek, Deriving input from six degrees of freedom interfaces.
  15. Aoyama, Chiaki, Distance measuring apparatus and distance measuring method.
  16. Aoyama, Chiaki, Distance measuring apparatus and distance measuring method.
  17. Chiaki Aoyama JP, Distance measuring apparatus and method employing two image taking devices having different measurement accuracy.
  18. Bridges, Robert E., Dynamic range of a line scanner having a photosensitive array that provides variable exposure.
  19. Bridges, Robert E., Dynamic range of a line scanner having a photosensitive array that provides variable exposure.
  20. Savareigo, Nissim; Markov, Igor; Zemer, Dan, Electrical circuit conductor inspection.
  21. Savareigo,Nissim; Markov,Igor; Zemer,Dan, Electrical circuit conductor inspection.
  22. Beaty,Elwin M.; Mork,David P., Electronic component products and method of manufacturing electronic component products.
  23. Beaty,Elwin M.; Mork,David P., Electronic component products made according to a process that includes a method for three dimensional inspection.
  24. Sari Sarraf, Hamed; Hequet, Eric; Turner, Christopher N.; Zhu, Aijun, Fabric wrinkle evaluation.
  25. Callari, Francesco; Zwern, Arthur; Fejes, Sandor, Generating 3D models by combining models from a video-based technique and data from a structured light technique.
  26. Herman, Brad Kenneth, Generation of three-dimensional imagery from a two-dimensional image using a depth map.
  27. Herman, Brad Kenneth, Generation of three-dimensional imagery from a two-dimensional image using a depth map.
  28. Herman, Brad Kenneth, Generation of three-dimensional imagery to supplement existing content.
  29. Chow, Hon Yean; Luo, De Yong; Li, Jia Ju, Grid array inspection system and method.
  30. Cecala, Joseph F.; Herman, Carl R.; Moraites, Stephen C., Ground threat location for an aircraft.
  31. Smith, Samuel M.; Rizk, Charbel G., High speed image processing device.
  32. Quadling,Mark; Quadling,Henley, High speed multiple line three-dimensional digitalization.
  33. Kujacznski, Nathan Andrew-Paul; Nygaard, Michael G., High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
  34. Quadling,Henley; Quadling,Mark; Blair,Alan, Laser digitizer system for dental applications.
  35. Quadling,Henley; Quadling,Mark; Blair,Alan, Laser digitizer system for dental applications.
  36. Atwell, Paul C.; Macfarlane, Keith G., Laser line probe having improved high dynamic range.
  37. Keightley,John; Cunha,Adriano, Laser triangulation system.
  38. Wilson, Christopher Michael; Atwell, Paul C., Line scanner that uses a color image sensor to improve dynamic range.
  39. Quist,Bradley L., Method and apparatus for backlighting and imaging multiple views of isolated features of an object.
  40. Beaty Elwin M. ; Mork David P., Method and apparatus for three dimensional inspection of electronic components.
  41. Beaty, Elwin M.; Mork, David P., Method and apparatus for three dimensional inspection of electronic components.
  42. Beaty, Elwin M.; Mork, David P., Method and apparatus for three dimensional inspection of electronic components.
  43. Doucet, Michel; Robert, Michel; Lefebvre, Daniel, Method and apparatus for triangulation-based 3D optical profilometry.
  44. Clark, Bryan Kevin, Method and system for determining dimensions of optically recognizable features.
  45. Svetkoff Donald J. ; Kilgus Donald B. T. ; Lin Warren ; Ehrmann Jonathan S., Method and system for high speed measuring of microscopic targets.
  46. Beaty,Elwin M.; Mork,David P., Method of manufacturing electronic components including a method for three dimensional inspection.
  47. Earthman,James C.; Markov,Vladimir B.; Trolinger,James D.; Dunn Rankin,Derek; Buckner,Benjamin D., Methods and apparatus for detecting and quantifying surface characteristics and material conditions using light scattering.
  48. Calum E. MacAulay CA, Methods and apparatus for improved depth resolution use of out-of-focus information in microscopy.
  49. Quadling,Mark; Quadling,Henley; Blair,Alan, Optical coherence tomography imaging.
  50. Chow, Yeung Ming, Optical displacement sensor and distance measuring apparatus.
  51. Rozsa, Balazs Jozsef; Katona, Gergely; Maak, Pal Andor, Optical microscope system for simultaneous observation of spatially distinct regions of interest.
  52. Mandella, Michael J.; Gonzalez-Banos, Hector H.; Hawks, Timothy J.; Alboszta, Marek, Optical navigation apparatus using fixed beacons and a centroid sensing device.
  53. Iizuka, Tomoyuki; Fujii, Akihiro, Optical three-dimensional measurement device and filter process method.
  54. Beaty Elwin M. ; Mork David P., Process for three dimensional inspection of electronic components.
  55. Holmes, Quentin; Kortesoja, Paul; McCubbrey, David; Samson, Joseph; Wessling, Thomas; Witter, Lester; Rendleman, Robert; Blanchfield, John; Lowe, Gregory, Range-finding based image processing rail way servicing apparatus and method.
  56. Gerlach, Dieter; Kellner, Helmut, Scanning system with stereo camera set.
  57. Zemer, Dan; Faibisch, Michael, System and method for multi-dimensional optical inspection.
  58. Norita,Toshio; Sato,Kazuchika; Okada,Hiroyuki; Miyazaki,Makoto; Kamon,Koichi, Three-dimensional input apparatus and image sensing control method.
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