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Method and apparatus for analyzing an image to detect and identify defects

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
출원번호 US-0657023 (1996-05-31)
발명자 / 주소
  • Vachtsevanos George J.
  • Mufti Muid
  • Dorrity J. Lewis
대리인 / 주소
    Deveau, Colton & Marquis
인용정보 피인용 횟수 : 79  인용 특허 : 0

초록

The Invention includes a method and apparatus which analyzes an image of an object to detect and identify defects in the object. The present invention utilizes a scanning technique which converts a 2-D image of the object into a 1-D image, a transformation technique which extracts relevant features

대표청구항

[ What is claimed is:] [1.] An apparatus for analyzing an image to detect and identify defects in an object, said apparatus comprising:at least one image sensor disposed to capture an image of the object;a light source for projecting light onto the object;means for converting the captured image into

이 특허를 인용한 특허 (79)

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