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Transistor and semiconductor device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-029/04
  • H01L-031/036
출원번호 US-0593552 (1996-01-30)
우선권정보 JP-0147003 (1993-05-26)
발명자 / 주소
  • Zhang Hongyong,JPX
  • Takayama Toru,JPX
  • Takemura Yasuhiko,JPX
  • Miyanaga Akiharu,JPX
  • Ohtani Hisashi,JPX
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd., JPX
대리인 / 주소
    Sixbey, Friedman, Leedom & Ferguson, P.C.Ferguson, Jr.
인용정보 피인용 횟수 : 119  인용 특허 : 5

초록

A semiconductor device having high carrier mobility, which comprises a substrate provided thereon a base film and further thereon a crystalline non-single crystal silicon film by crystal growth, wherein, the crystals are grown along the crystallographic [110] axis, and source/drain regions are provi

대표청구항

[ What is claimed is:] [1.] A semiconductor device comprising a polycrystalline semiconductor film formed on a insulating surface, said polycrystalline semiconductor film including at least a source region, a drain region, and a channel region therein and having crystals extending in one direction c

이 특허에 인용된 특허 (5)

  1. Liu Gang (State College PA) Kakkad Ramesh H. (State College PA) Fonash Stephen J. (State College PA), Low temperature crystallization and pattering of amorphous silicon films.
  2. Fonash Stephen J. (State College PA) Liu Gang (Sunnyvale CA), Low temperature crystallization and patterning of amorphous silicon films on electrically insulating substrates.
  3. Kakinoki Hisashi (Ohi JPX) Nagahara Tatsuro (Ohi JPX) Fukui Keitaro (Ohi JPX), Polycrystalline silicon thin film and transistor using the same.
  4. Tokunaga Hiroyuki (Kawasaki JPX) Yamagata Kenji (Atsugi JPX) Yonehara Takao (Atsugi JPX), Process for producing compound semiconductor using an amorphous nucleation site.
  5. Takasu Hidemi (Kyoto JPX), Semiconductor device having silicon carbide grown layer on insulating layer and MOS device.

이 특허를 인용한 특허 (119)

  1. Zhang, Hongyong, Active matrix type liquid crystal display device.
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  4. Takemura, Yasuhiko, Double gated electronic device and method of forming the same.
  5. Takemura, Yasuhiko, Dual gate MOSFET.
  6. Hongyong Zhang JP, Electro-optical device.
  7. Ohtani,Hisashi; Koyama,Jun; Yamazaki,Shunpei, Electro-optical device and semiconductor circuit.
  8. Ohtani,Hisashi; Koyama,Jun; Yamazaki,Shunpei, Electro-optical device and semiconductor circuit.
  9. Ohtani, Hisashi; Koyama, Jun; Yamazaki, Shunpei, Electro-optical device and semiconductor device.
  10. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Fabrication method of semiconductor device.
  11. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Fabrication method of semiconductor device.
  12. Ouyang,Qiqing Christine; Chen,Xiangdong, High mobility heterojunction complementary field effect transistors and methods thereof.
  13. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Hayakawa Masahiko,JPX ; Osame Mitsuaki,JPX, Method for fabricating a semiconductor device.
  14. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki, Method for fabricating a semiconductor device.
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  16. Shunpei Yamazaki JP; Satoshi Teramoto JP; Jun Koyama JP; Yasushi Ogata JP; Masahiko Hayakawa JP; Mitsuaki Osame JP, Method for fabricating a semiconductor device using a metal catalyst and high temperature crystallization.
  17. Yamazaki,Shunpei, Method for fabricating semiconductor device.
  18. Yamazaki,Shunpei; Yamaguchi,Naoaki; Nakajima,Setsuo, Method for manufacturing a semiconductor device.
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  21. Tanaka, Koichiro; Ohnuma, Hideto, Method for manufacturing transistor semiconductor devices with step of annealing to getter metal with phosphorous.
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  52. Webb, Clair; Bohr, Mark, N-p butting connections on SOI substrates.
  53. Yamazaki, Shunpei; Ohtani, Hisashi; Koyama, Jun; Fukunaga, Takeshi, Nonvolatile memory and electronic apparatus.
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  56. Maekawa Masashi ; Nakata Yukihiko, Selected site, metal-induced, continuous crystallization method.
  57. Maekawa Masashi, Selective silicide thin-film transistor having polysilicon active layers with crystallizing metal agent introduced only in the source/drain regions.
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