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Method of manufacturing a semiconductor device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/84
출원번호 US-0462748 (1995-06-05)
우선권정보 JP-0147004 (1993-05-26)
발명자 / 주소
  • Zhang Hongyong,JPX
  • Takayama Toru,JPX
  • Takemura Yasuhiko,JPX
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd., JPX
대리인 / 주소
    Sixbey, Friedman, Leedom & Ferguson, P.C.Ferguson, Jr.
인용정보 피인용 횟수 : 63  인용 특허 : 11

초록

Nickel is introduced to a peripheral circuit section and a picture element section on an amorphous silicon film to crystallize them. After forming gate electrodes and others, a source, drain and channel are formed by doping impurities, and laser is irradiated to improve the crystallization. After th

대표청구항

[ What is claimed is:] [3.] A method of manufacturing a semiconductor device having at least one thin film transistor, comprising the steps of:disposing a catalyst containing material in contact with a selected region of a semiconductor film on an insulating surface of a substrate to be crystallized

이 특허에 인용된 특허 (11)

  1. Dohjo Masayuki (Yokohama JPX) Oana Yasuhisa (Yokohama JPX) Ikeda Mitsushi (Yokohama JPX), Electrode interconnection material, semiconductor device using this material and driving circuit substrate for display d.
  2. Barnett Allen M. (Newark DE) Hall Robert B. (Newark DE), Fault tolerant thin-film photovoltaic cell fabrication process.
  3. Liu Gang (State College PA) Kakkad Ramesh H. (State College PA) Fonash Stephen J. (State College PA), Low temperature crystallization and pattering of amorphous silicon films.
  4. Fonash Stephen J. (State College PA) Liu Gang (Sunnyvale CA), Low temperature crystallization and patterning of amorphous silicon films on electrically insulating substrates.
  5. Yonehara Takao (Atsugi JPX), Method for forming semiconductor thin film.
  6. Shibata Tadashi (Menlo Park CA), Method for manufacturing a semiconductor device.
  7. Zhang Hongyong (Kanagawa JPX) Uochi Hideki (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Fukunaga Takeshi (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Method for manufacturing semiconductor device.
  8. Kasten Alan J. (Palm Bay FL), Method for providing polysilicon thin films of improved uniformity.
  9. Zhang Hongyong (Kanagawa JPX) Kusumoto Naoto (Kanagawa JPX), Method of annealing a semiconductor.
  10. Celler George K. (Summit NJ) Leamy Harry J. (Summit NJ) Trimble Lee E. (Hillsborough NJ), Method of increasing the grain size of polycrystalline materials by directed energy-beams.
  11. Zhang Hongyong (Kanagawa JPX) Yamazaki Shunpei (Tokyo JPX) Takemura Yasuhiko (Kanagawa JPX), Process for laser processing and apparatus for use in the same.

이 특허를 인용한 특허 (63)

  1. Kokubo, Chiho; Yamagata, Hirokazu; Yamazaki, Shunpei, Active matrix display device having a column-like spacer.
  2. Zhang, Hongyong; Igarashi, Makoto; Yanai, Kenichi; Hori, Tetsuro; Takizawa, Yutaka, CMOS-type semiconductor device and method of fabricating the same.
  3. Zhang, Hongyong; Igarashi, Makoto, CMOS-type thin film semiconductor device and method of fabricating the same.
  4. Murakami, Satoshi; Hirakata, Yoshiharu; Fujimoto, Etsuko; Yamazaki, Yu; Yamazaki, Shunpei, Capacitor, semiconductor device and manufacturing method thereof.
  5. Murakami, Satoshi; Hirakata, Yoshiharu; Fujimoto, Etsuko; Yamazaki, Yu; Yamazaki, Shunpei, Capacitor, semiconductor device and manufacturing method thereof.
  6. Murakami,Satoshi; Hirakata,Yoshiharu; Fujimoto,Etsuko; Yamazaki,Yu; Yamazaki,Shunpei, Capacitor, semiconductor device and manufacturing method thereof.
  7. Ohtani,Hisashi; Koyama,Jun; Yamazaki,Shunpei, Electro-optical device and semiconductor circuit.
  8. Ohtani,Hisashi; Koyama,Jun; Yamazaki,Shunpei, Electro-optical device and semiconductor circuit.
  9. Ohtani, Hisashi; Koyama, Jun; Yamazaki, Shunpei, Electro-optical device and semiconductor device.
  10. Yamazaki, Shunpei; Tanaka, Koichiro, Method and apparatus for producing semiconductor device.
  11. Muramatsu, Shinichi; Minakawa, Yasushi; Oka, Fumihito; Sasaki, Tadashi, Method for forming crystalline silicon layer and crystalline silicon semiconductor device.
  12. Yamazaki, Shunpei; Ohnuma, Hideto; Takano, Tamae; Mitsuki, Toru, Method for manufacturing a semiconductor device.
  13. Yamazaki,Shunpei; Yamaguchi,Naoaki; Nakajima,Setsuo, Method for manufacturing a semiconductor device.
  14. Yasuhiko Takemura JP, Method for manufacturing a semiconductor device.
  15. Yamazaki,Shunpei; Ohnuma,Hideto; Takano,Tamae; Mitsuki,Toru, Method for manufacturing a semiconductor device including top gate thin film transistor and method for manufacturing an active matrix device including top gate thin film transistor.
  16. Shimomura,Akihisa; Ohnuma,Hideto; Shoji,Hironobu, Method for manufacturing a thin film transistor and method for manufacturing a semiconductor device.
  17. Kokubo,Chiho; Yamazaki,Shunpei; Takano,Tamae; Irie,Hiroaki, Method for manufacturing semiconductor device.
  18. Shimomura,Akihisa; Koyama,Masaki; Shoji,Hironobu, Method for manufacturing semiconductor device, and laser irradiation apparatus.
  19. Tanaka, Koichiro; Ohnuma, Hideto, Method for manufacturing transistor semiconductor devices with step of annealing to getter metal with phosphorous.
  20. Hongyong Zhang JP; Yasuhiko Takemura JP; Toru Takayama JP, Method for producing semiconductor device.
  21. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Method for producing semiconductor device.
  22. Zhang Hongyong,JPX ; Takemura Yasuhiko,JPX ; Takayama Toru,JPX, Method for producing semiconductor device.
  23. Zhang, Hongyong; Takemura, Yasuhiko; Takayama, Toru, Method for producing semiconductor device.
  24. Ohtani, Hisashi, Method of forming crystalline silicon film.
  25. Mitsuhashi Hiroshi,JPX ; Matsuura Yuki,JPX ; Fujimura Takashi,JPX ; Imai Nobuo,JPX ; Goto Yasumasa,JPX, Method of manufacturing a poly-crystalline silicon film.
  26. Ohnuma, Hideto; Yamazaki, Shunpei; Nakajima, Setsuo; Ohtani, Hisashi, Method of manufacturing a semiconductor device.
  27. Yamazaki, Shunpei; Mitsuki, Toru; Takano, Tamae, Method of manufacturing a semiconductor device.
  28. Yamazaki, Shunpei; Mitsuki, Toru; Takano, Tamae, Method of manufacturing a semiconductor device.
  29. Yamazaki,Shunpei; Ohtani,Hisashi; Ohnuma,Hideto, Method of manufacturing a semiconductor device.
  30. Mitsuki, Toru; Shichi, Takeshi; Maekawa, Shinji; Shibata, Hiroshi; Miyanaga, Akiharu, Method of manufacturing a semiconductor device having a crystallized semiconductor film.
  31. Yamazaki,Shunpei; Mitsuki,Toru; Takano,Tamae, Method of manufacturing a semiconductor film with little warp.
  32. Ker, Ming-Dou; Hung, Kei-Kang; Chang, Chyh-Yih, SCR devices in silicon-on-insulator CMOS process for on-chip ESD protection.
  33. Sato, Junichi; Usui, Setsuo; Sakamoto, Yasuhiro; Mori, Yoshifumi; Nakajima, Hideharu, SEMICONDUCTOR THIN FILM AND METHOD OF FABRICATING SEMICONDUCTOR THIN FILM, APPARATUS FOR FABRICATING SINGLE CRYSTAL SEMICONDUCTOR THIN FILM, AND METHOD OF FABRICATING SINGLE CRYSTAL THIN FILM, SINGLE.
  34. Kokubo, Chiho; Yamagata, Hirokazu; Yamazaki, Shunpei, Semiconductor comprising a TFT provided on a substrate having an insulating surface and method of fabricating the same.
  35. Kato, Kiyoshi; Ozaki, Tadafumi; Mutaguchi, Kohei, Semiconductor device.
  36. Murakami,Satoshi; Hirakata,Yoshiharu; Fujimoto,Etsuko; Yamazaki,Yu; Yamazaki,Shunpei, Semiconductor device.
  37. Yamazaki, Shunpei; Yamaguchi, Naoaki; Nakajima, Setsuo, Semiconductor device.
  38. Tanaka, Koichiro; Ohnuma, Hideto, Semiconductor device and manufacturing method thereof.
  39. Shoji,Hironobu; Shimomura,Akihisa; Koyama,Masaki, Semiconductor device and method for manufacturing semiconductor device.
  40. Takemura Yasuhiko,JPX, Semiconductor device and method for manufacturing the same.
  41. Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  42. Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  43. Takemura,Yasuhiko, Semiconductor device and method for manufacturing the same.
  44. Takemura,Yasuhiro, Semiconductor device and method for manufacturing the same.
  45. Yamazaki, Shunpei; Yamaguchi, Naoaki; Nakajima, Setsuo, Semiconductor device and method for producing it.
  46. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  47. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  48. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  49. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  50. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  51. Hirakata, Yoshiharu; Goto, Yuugo; Kobayashi, Yuko; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  52. Hirakata,Yoshiharu; Goto,Yuugo; Kobayashi,Yuko; Yamazaki,Shunpei, Semiconductor device and method of fabricating the same.
  53. Kokubo, Chiho; Yamagata, Hirokazu; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  54. Kokubo, Chiho; Yamagata, Hirokazu; Yamazaki, Shunpei, Semiconductor device and method of fabricating the same.
  55. Yamazaki, Shunpei; Ohtani, Hisashi, Semiconductor device and method of manufacturing the same.
  56. Yamazaki, Shunpei; Ohtani, Hisashi, Semiconductor device and method of manufacturing the same.
  57. Kokubo, Chiho; Yamagata, Hirokazu; Yamazaki, Shunpei, Semiconductor device applying to the crystalline semiconductor film.
  58. Shunpei Yamazaki JP; Naoaki Yamaguchi JP; Setsuo Nakajima JP, Semiconductor device comprising a bottom gate type thin film transistor.
  59. Zhang, Hongyong; Takayama, Toru, Semiconductor device having channel formation region comprising silicon and containing a group IV element.
  60. Yamazaki, Shunpei; Adachi, Hiroki; Kuwabara, Hideaki, Semiconductor device having semiconductor circuit comprising semiconductor element, and method for manufacturing same.
  61. Sato,Junichi; Usui,Setsuo; Sakamoto,Yasuhiro; Mori,Yoshifumi; Nakajima,Hideharu, Semiconductor thin film and method of fabricating semiconductor thin film, apparatus for fabricating single crystal semiconductor thin film, and method of fabricating single crystal thin film, single crystal thin film substrate, and semiconductor device.
  62. Ohtani Hisashi,JPX ; Yamazaki Shunpei,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Miyanaga Akiharu,JPX, Semiconductor thin film and semiconductor device.
  63. Ker,Ming Dou; Chuang,Che Hao, Turn-on-efficient bipolar structures for on-chip ESD protection.
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