$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Large area uniform ion beam formation 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01J-037/317
출원번호 US-0756656 (1996-11-26)
발명자 / 주소
  • Blake Julian G.
  • Purser Kenneth H.
  • Brailove Adam A.
  • Rose Peter H.
  • Hughey Barbara J.
출원인 / 주소
  • Eaton Corporation
대리인 / 주소
    Engellenner
인용정보 피인용 횟수 : 20  인용 특허 : 24

초록

A high throughput ion implantation system that rapidly and efficiently processes large quantities of flat panel displays. The ion implantation system has an ion chamber generating a stream of ions, a plasma electrode having an elongated slot with a high aspect ratio for shaping the stream of ions in

대표청구항

[ Having described the invention, what is claimed as new and desired to be secured by Letters Patent is:] [1.] A ribbon beam generating ion implantation apparatus for treating a workpiece, the apparatus comprising:an ion chamber for containing a plasma formed of ionized matter, the chamber having an

이 특허에 인용된 특허 (24)

  1. Aitken Derek (East Molesey GB2), Apparatus and methods for ion implantation.
  2. Uehara, Akira; Hijikata, Isamu; Nakane, Hisashi; Nakayama, Muneo, Automatic plasma processing device and heat treatment device.
  3. Shiraiwa Hirotsugu (Hino JPX), Conveyor apparatus.
  4. Freytsis Avrum (Swampscott MA) Hertel Richard J. (Boxford MA) Mears Eric L. (Rockport MA), Disk scanning apparatus for batch ion implanters.
  5. Brune Robert A. (Austin TX) Smith Dorsey T. (Austin TX) Ray Andrew M. (Austin TX), End station for a parallel beam ion implanter.
  6. Brubaker Stephen R. (Austin TX), Fluid flow control method and apparatus for an ion implanter.
  7. Brown Ian G. (1088 Woodside Rd. Berkeley CA 94708) MacGill Robert A. (645 Kern St. Richmond CA 94805) Galvin James E. (2 Commodore Dr. #276 Emeryville CA 94608), High current ion source.
  8. Robinson William P. (Newberry Park CA) Seliger Robert L. (Agoura CA), Ion implantation system.
  9. Robinson William P. (Newbury Park CA) Seliger Robert L. (Agoura CA), Ion implantation system.
  10. Turner Norman L. (Gloucester MA), Ion implantation with variable implant angle.
  11. Wittkower Andrew B. (Rockport MA) Ryding Geoffrey (Manchester MA), Isolation lock for workpieces.
  12. Sferlazzo Piero (Lynnfield MA) Rose Peter H. (North Conway NH) Trueira Frank R. (York ME), Microwave energized ion source for ion implantation.
  13. Koch George R. (Los Altos CA) Petersen ; III Carl T. (Fremont CA), Modular loadlock.
  14. Stark Lawrence R. (San Jose CA) Turner Frederick (Sunnyvale CA), Modular wafer transport and processing system.
  15. Yoshida Akihisa (Neyagawa JPX) Setsune Kentaro (Sakai JPX) Hirao Takashi (Moriguchi JPX), Plasma processing apparatus for large area ion irradiation.
  16. Usami Yasutsugu (Katsuta JPX), Process and apparatus for transferring an object and for processing semiconductor wafers.
  17. Davis Cecil J. (Greenville TX) Freeman Dean W. (Garland TX) Matthews Robert T. (Plano TX) Tomlin Joel T. (Garland TX) Jucha Rhett B. (Celeste TX), Processing apparatus and method.
  18. Ryding Geoffrey (Manchester MA), Treating workpieces with beams.
  19. Ryding Geoffrey (Manchester MA), Vacuum chamber for treating workpieces with beams.
  20. Purser, Kenneth H., Wafer holding apparatus for ion implantation.
  21. Ryding Geoffrey (Manchester MA), Wafer loading apparatus for beam treatment.
  22. Layman Frederick P. (Fremont CA) Huntley David A. (Mountain View CA) Dick Paul H. (San Jose CA) Coad George L. (Lafayette CA) Kuhlman Michael J. (Fremont CA) Vecta Roger M. (San Jose CA) Hobson Phill, Wafer processing system.
  23. Lee Steven N. (Irvine CA) Kim Jae Y. (Irvine CA), Wafer transfer apparatus.
  24. Hertel Richard J. (Bradford MA) Delforge Adrian C. (Rockport MA) Mears Eric L. (Rockport MA) MacIntosh Edward D. (Gloucester MA) Jennings Robert E. (Nethuen MA) Bhargava Akhil (Reading MA), Wafer transfer system.

이 특허를 인용한 특허 (20)

  1. Likhanskii, Alexandre; Lee, William Davis; Radovanov, Svetlana B., Apparatus and method for multilayer deposition.
  2. Hill, Raymond; Scipioni, Lawrence; Sanford, Colin August; DiManna, Mark; Tanguay, Michael, Dual beam system.
  3. Hill, Raymond; Scipioni, Lawrence; Sanford, Colin August; DiManna, Mark; Tanguay, Michael, Dual beam system.
  4. Miller, Tom, Dual beam system.
  5. Freer,Brian S., Ion beam angle measurement systems and methods employing varied angle slot arrays for ion implantation systems.
  6. Vanderberg, Bo H.; Ray, Andrew M.; Wenzel, Kevin W., Ion beam scanning systems and methods for improved ion implantation uniformity.
  7. Goldberg,Richard David; Armour,David George; Burgess,Christopher; Murrell,Adrian J., Ion implanter electrodes.
  8. Benveniste, Victor M.; DiVergilio, William F., Ion source and coaxial inductive coupler for ion implantation system.
  9. Benveniste, Victor M., Ion source providing ribbon beam with controllable density profile.
  10. Brailove Adam A., Magnetic filter for ion source.
  11. Aoki Masahiko,JPX ; Tanjyo Masayasu,JPX, Method and apparatus for deflecting charged particles.
  12. Ye, John Zheng; Benveniste, Victor M.; Cristoforo, Michael Paul, Method and system for ion beam containment in an ion beam guide.
  13. Wenzel, Kevin W.; Vanderberg, Bo H., Method and system for ion beam containment using photoelectrons in an ion beam guide.
  14. Yamazaki, Shunpei; Isobe, Atsuo; Yamaguchi, Tetsuji; Godo, Hiromichi, Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping.
  15. Knippelmeyer, Rainer; Kienzle, Oliver; Kemen, Thomas; Mueller, Heiko; Uhlemann, Stephan; Haider, Maximilian; Casares, Antonio; Rogers, Steven, Particle-optical systems and arrangements and particle-optical components for such systems and arrangements.
  16. Knippelmeyer, Rainer; Kienzle, Oliver; Kemen, Thomas; Mueller, Heiko; Uhlemann, Stephan; Haider, Maximilian; Casares, Antonio; Rogers, Steven, Particle-optical systems and arrangements and particle-optical components for such systems and arrangements.
  17. Knippelmeyer, Rainer; Kienzle, Oliver; Kemen, Thomas; Mueller, Heiko; Uhlemann, Stephan; Haider, Maximillian; Casares, Antonio; Rogers, Steven, Particle-optical systems and arrangements and particle-optical components for such systems and arrangements.
  18. Amato, Mark R.; Lee, William Davis; Reno, Jillian, Selective processing of a workpiece using ion beam implantation and workpiece rotation.
  19. Benveniste, Victor M., Symmetric beamline and methods for generating a mass-analyzed ribbon ion beam.
  20. Berger, Steve; Scipioni, Lawrence, System for imaging a cross-section of a substrate.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로